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Dive into the research topics where J. C. Rivoal is active.

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Featured researches published by J. C. Rivoal.


Optics Letters | 1999

Polarization effects in apertureless scanning near-field optical microscopy: an experimental study.

L. Aigouy; A. Lahrech; Samuel Gresillon; H. Cory; A. C. Boccara; J. C. Rivoal

Strong electric-field enhancements at the apex of a tungsten tip illuminated by an external light source were recently predicted theoretically. We present an experimental study of the dependence of this effect on the polarization angle of the incident light. It is shown that the intensity of the light scattered by the tungsten tip of an apertureless scanning near-field optical microscope is 2 orders of magnitude higher when the incident light is p polarized than when it is s polarized. This experimental result is in good agreement with theoretical predictions and provides an easy way to test the quality of the tips.


Applied Optics | 2003

Comparison of test images obtained from various configurations of scanning near-field optical microscopes

Claudine Bainier; Christophe Vannier; Daniel Courjon; J. C. Rivoal; S. Ducourtieux; Yannick De Wilde; L. Aigouy; Florian Formanek; Laurent Belliard; Pierre Siry; Bernard Perrin

The characteristics of a few experimental near-field optical microscopes, located in different laboratories, have been compared on the basis of their ability to image a well-defined submicrometer test object.


Applied Surface Science | 2000

Nanometer scale apertureless near field microscopy

Samuel Gresillon; S. Ducourtieux; A. Lahrech; L. Aigouy; J. C. Rivoal; Albert Claude Boccara

It is necessary to use the information contained in the near field to get sub-wavelength details in optical imaging which are not revealed through the far-field image. We have designed and built various setups able to perform near-field measurements in the UV, visible and IR, both in transmission, reflection and dark field with a resolution of 10 nm, independent of the wavelength but related to the tip size. Images revealing local dielectric contrasts, small particle effects, as well as local field enhancements in random structures, are shown.


International Symposium on Optical Science and Technology | 2001

Localized plasmon-enhanced optical response: harmonic generation and polarization effects

Patrice Gadenne; Bruno Berini; Stéphanie Buil; Xavier Quélin; C. Anceau; Samuel Gresillon; S. Ducourtieux; J. C. Rivoal; M. Breit; Alain Bourdon; Andrey K. Sarychev; Vladimir M. Shalaev

It is now known that plasmon oscillations supported by nanostructured metal thin films of fractal morphology, can result in large local fields and strong enhancement of optical phenomena, for example Raman scattering. The localized plasmons, acting like nano-antennas, can concentrate very large electromagnetic energy in nanometer- sized areas, hot spots, and provide particularly strong enhancement of optical responses, in a very broad spectral range. Our new experimental results show up position dependence of the hot spots on the polarization state of the light. Moreover as expected from recent theoretical predictions, on this kind of thin percolating films, there is a dramatic enhancement of the second harmonic generation (2(omega) ) out of the specular directions. This unusual diffuse SHG could be connected to possible chirality of the percolating metallic films, which is expected to manifest itself as change in the hot-spot distribution for the left and right circularly polarized incident light.


Proceedings of SPIE, the International Society for Optical Engineering | 1999

Scanning near-field optical microscopy: local probes and enhanced electromagnetic fields

L. Aigouy; Albert Claude Boccara; S. Ducourtieux; Samuel Gresillon; J. C. Rivoal; H. Cory; Patrice Gadenne; Vladimir M. Shalaev

Enhanced electromagnetic fields are investigated, both theoretically and experimentally, on two model systems using high spatial resolution. Strong field enhancements at the apex of a tungsten tip illuminated by an external light source are studied as a function of the incident polarization. The surface of percolating random metal- dielectric films consist of several spectral resonances, which have been calculated and are observed here in near field with 10 nm lateral resolution.


Physical Review B | 2001

Near-field optical studies of semicontinuous metal films

S. Ducourtieux; Viktor A. Podolskiy; Samuel Gresillon; Stéphanie Buil; Bruno Berini; Patrice Gadenne; Albert Claude Boccara; J. C. Rivoal; William David Bragg; Katyayani Banerjee; Vladimir P. Safonov; Vladimir P. Drachev; Z. C. Ying; Andrey K. Sarychev; Vladimir M. Shalaev


Microwave and Optical Technology Letters | 1998

Electric field intensity variation in the vicinity of a perfectly conducting conical probe: Application to near-field microscopy

H. Cory; A. C. Boccara; J. C. Rivoal; A. Lahrech


Physical Review B | 2001

Experimental observation of percolation-enhanced nonlinear light scattering from semicontinuous metal films

M. Breit; Viktor A. Podolskiy; Samuel Gresillon; G. von Plessen; Jochen Feldmann; J. C. Rivoal; Patrice Gadenne; Andrey K. Sarychev; Vladimir M. Shalaev


Optics Communications | 2006

THz near-field optical imaging by a local source

Romain Lecaque; Samuel Gresillon; Nicolas Barbey; Romain Peretti; J. C. Rivoal; Claude Boccara


Physica B-condensed Matter | 2000

Direct observation of locally enhanced electromagnetic field

Patrice Gadenne; Xavier Quélin; S. Ducourtieux; Samuel Gresillon; L. Aigouy; J. C. Rivoal; Vladimir M. Shalaev; Andrey K. Sarychev

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Samuel Gresillon

Centre national de la recherche scientifique

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S. Ducourtieux

Centre national de la recherche scientifique

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Albert Claude Boccara

Centre national de la recherche scientifique

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L. Aigouy

Centre national de la recherche scientifique

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Patrice Gadenne

Centre national de la recherche scientifique

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Xavier Quélin

Centre national de la recherche scientifique

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H. Cory

Technion – Israel Institute of Technology

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Romain Lecaque

Centre national de la recherche scientifique

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Andrey K. Sarychev

Russian Academy of Sciences

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