J. De Hoog
University of Antwerp
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Featured researches published by J. De Hoog.
Analytica Chimica Acta | 2001
J. Osán; J. De Hoog; Anna Worobiec; Chul-Un Ro; Keun-Young Oh; I. Szalóki; R. Van Grieken
Abstract Conventional single-particle electron probe microanalysis (EPMA) is widely used for evaluating the sources of atmospheric aerosol. The method is capable of simultaneously detecting the chemical composition and the morphology of each particle. Computer-controlled automatic EPMA allows the analysis of huge numbers of individual particles. Cluster as well as factor analysis are used for the classification of particles based on the obtained data set. However, the method is not able to detect low- Z elements (C, N, O), therefore, e.g. organic particles can only be identified by their typical inorganic content and high background. Using a thin-window X-ray detector, the capabilities of EPMA can be extended to determine low- Z elements. The recently developed quantification method based on Monte Carlo simulations is capable to evaluate elemental concentrations in single microscopic particles, including C, N and O. It was shown that also chemical species can be determined from the obtained concentrations. Hierarchical and non-hierarchical cluster analysis, as well as principal component analysis were applied for the classification of particles based on low- Z EPMA data. A mixture of standard particles as well as atmospheric aerosol samples were used to test the classification methods. Different input data (X-ray intensities or elemental concentrations) and scaling functions were used for the chemometric methods. Cluster and factor analysis appear to be efficient tools for classification of particles based on low- Z EPMA data. As an example, atmospheric ammonium sulphate and organic sulphur were classified in separate groups, which was not possible by conventional EPMA.
Atmospheric Environment | 2005
J. De Hoog; J. Osán; I. Szalóki; K. Eyckmans; Anna Worobiec; Chul-Un Ro; R. Van Grieken
X-Ray Spectrometry | 2001
I. Szalóki; J. Osán; Anna Worobiec; J. De Hoog; R. Van Grieken
Analytical Chemistry | 2001
Chul-Un Ro; Keun-Young Oh; János Osán; J. De Hoog; Anna Worobiec; R. Van Grieken
X-Ray Spectrometry | 2001
J. Osán; J. De Hoog; P. Van Espen; I. Szalóki; Chul-Un Ro; R. Van Grieken
X-ray spectrometry: Recent technological advances; pp 487-592 (2004) | 2004
Jimmy Börjesson; Sören Mattsson; Yoshihiro Mori; A Zucchiatti; T Ninomiya; I. Szalóki; Chul-Un Ro; J. Osán; J. De Hoog; R. Van Grieken
X-ray spectrometry: recent technological advances / Tsuji, K. [edit.] | 2004
I. Szalóki; Chul-Un Ro; J. Osán; J. De Hoog; R. Van Grieken
Archive | 2005
Khaiwal Ravindra; László Bencs; Eric Wauters; J. De Hoog; F. Deutsch; E. Roekens; Nico Bleux; P. Berghmans; R. Van Grieken
VLIZ Special Publication | 2001
Anna Worobiec; J. De Hoog; J. Osán; I. Szalóki; Chul-Un Ro; K. Eyckmans; R. Van Grieken
Archive | 2000
Anna Worobiec; J. De Hoog; J. Os; P. Joos; R. Van Grieken