J. T. Titantah

Computation and parametrization of the temperature dependence of Debye-Waller factors for group IV, III-V and II-VI semiconductors

We calculated the temperature dependence of the Debye-Waller factors for a variety of group IV, III-V and II-VI semiconductors from 0.1 to 1000 K. The approach used to fit the temperature dependence is described and resulting fit parameters are tabulated for each material. The Debye-Waller factors are deduced from generalized phonon densities of states which were derived from first principles using the WIEN2k and the ABINIT codes.

Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structure

We computed Debye-Waller factors in the temperature range from 0.1 to 1000 K for AlN, GaN, InN, ZnO and CdO with the wurtzite-type structure. The Debye-Waller factors were derived from phonon densities of states obtained from Hellmann-Feynman forces computed within the density-functional-theory formalism. The temperature dependences of the Debye-Waller factors were fitted and fit parameters are given.

An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy.

Thermal diffuse scattered electrons significantly contribute to high-resolution transmission electron microscopy images. Their intensity adds to the background and is peaked at positions of atomic columns. In this paper we suggest an approximation to simulate intensity of thermal diffuse scattered electrons in plane-wave illumination transmission electron microscopy using an emission-potential multislice algorithm which is computationally less intensive than the frozen lattice approximation or the mutual intensity approach. Intensity patterns are computed for Au and InSb for different crystal orientations. These results are compared with intensities from the frozen lattice approximation based on uncorrelated vibration of atoms as well as with the frozen phonon approximation for Au. The frozen phonon method uses a detailed phonon model based on force constants we computed by a density functional theory approach. The comparison shows that our suggested emission-potential method is in close agreement with both the frozen lattice and the frozen phonon approximations.

Bond length variation in Ga1−xInxAs crystals from the Tersoff potential

In this work we show that a reparametrized Tersoff potential accurately reproduces the bond length variations observed in ternary Ga1−xInxAs mixed crystals. The reparametrization is based on accurate first-principles electronic structure calculations. Previous parametrizations of the Tersoff potential for GaAs and InAs structures, although they accurately reproduce the properties of the zinc-blende GaAs and InAs crystals, are shown to be unable to reproduce the bond length variations in these mixed crystals. In addition to correcting the bond length inconsistencies, the new set of parameters is also shown to yield the elastic constants of GaAs and InAs that agree fairly well with measurements and to reproduce accurately their respective melting temperature.

Ab initio computation of the mean inner Coulomb potential of amorphous carbon structures

The mean inner Coulomb potential (MIP) of amorphous carbon structures was computed for slabs with mass densities between ρ=2.0g∕cm3 and ρ=3.5g∕cm3 by the full potential linearized augmented plane-wave (FLAPW) method. The amorphous carbon structures consisting of 64 carbon atoms were generated by a classical metropolis Monte Carlo procedure using the Tersoff potential for carbon. The MIP shows a linear dependence on the mass density. Values of the MIP of the amorphous carbon structures are compared with experimental values and with computed values for the MIP of graphite and diamond.

Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data

We present a new method to measure structure factors from electron spot diffraction patterns recorded under almost parallel illumination in transmission electron microscopes. Bloch wave refinement routines have been developed to refine the crystal thickness, its orientation and structure factors by comparison of experimentally recorded and calculated intensities. Our method requires a modicum of computational effort, making it suitable for contemporary personal computers. Frozen lattice and Bloch wave simulations of GaAs diffraction patterns are used to derive optimised experimental conditions. Systematic errors are estimated from the application of the method to simulated diffraction patterns and rules for the recognition of physically reasonable initial refinement conditions are derived. The method is applied to the measurement of the 200 structure factor for GaAs. We found that the influence of inelastically scattered electrons is negligible. Additionally, we measured the 200 structure factor from zero loss filtered two-dimensional convergent beam electron diffraction patterns. The precision of both methods is found to be comparable and the results agree well with each other. A deviation of more than 20% from isolated atom scattering data is observed, whereas close agreement is found with structure factors obtained from density functional theory [A. Rosenauer, M. Schowalter, F. Glas, D. Lamoen, Phys. Rev. B 72 (2005), 085326-1], which account for the redistribution of electrons due to chemical bonding via modified atomic scattering amplitudes.

Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction

We introduce a new method to measure structure factors from parallel beam electron diffraction (PBED) patterns. Bloch wave refinement routines were developed which can minimise the difference between simulated and experimental Bragg intensities via variation of structure factors, Debye parameters, specimen thickness and -orientation. Due to plane wave illumination, the PBED refinement is highly efficient not only in computational respect, but also concerning the experimental effort since energy filtering is shown to have no significant effect on the refinement results. The PBED method was applied to simulated GaAs diffraction patterns to derive systematic errors and rules for the identification of plausible refinement results. The evaluation of experimental GaAs PBED patterns yields a 200 X-ray structure factor of -6.33±0.14. Additionally, we obtained -6.35±0.13 from two-dimensional convergent beam electron diffraction refinements. Both results confirm density functional theory calculations published by Rosenauer et al. and indicate the inaccuracy of isolated atom scattering data, which is crucial e.g. for the composition evaluation by lattice fringe analysis.

Ab initio based atomic scattering amplitudes and {002} electron structure factors of InxGa1?xAs/GaAs quantum wells

The atomic scattering amplitudes of the various atoms of the systems Ga1−xInxAs, GaAs1−xNx and InAs1−xNx are calculated using the density functional theory (DFT) approach. The scattering amplitudes of N, Ga, As and In in the model systems are compared with the frequently used Doyle and Turner values. Deviation from the latter values is found for small scattering vectors (s<0.3A−1) and for these scattering vectors dependence on the orientation of the scattering vector and the chemical environment is reported. We suggest a parametrization of these modified scattering amplitudes (MASAs) for small scattering vectors (s<1.0A−1). The MASAs are exploited within zero pressure classical Metropolis Monte Carlo (MC), finite temperature calculations to investigate the effect of quantum well size on the electron {002} structure factor (SF) of Ga1−xInxAs quantum wells.

Modified atomic scattering amplitudes and size effects on the 002 and 220 electron structure factors of multiple Ga1−xInxAs/GaAs quantum wells

The modified atomic scattering amplitudes (MASAs) of mixed Ga1−xInxAs, GaAs1−xNx, and InAs1−xNx are calculated using the density functional theory approach and the results are compared with those of the binary counterparts. The MASAs of N, Ga, As, and In for various scattering vectors in various chemical environments and in the zinc-blende structure are compared with the frequently used Doyle and Turner values. Deviation from the Doyle and Turner results is found for small scattering vectors (s<0.3 A−1) and for these scattering vectors the MASAs are found to be sensitive to the orientation of the scattering vector and on the chemical environment. The chemical environment sensitive MASAs are used within zero pressure classical Metropolis Monte Carlo, finite temperature calculations to investigate the effect of well size on the electron 002 and 220 structure factors (SFs). The implications of the use of the 002 (200) spot for the quantification of nanostructured Ga1−xInxAs systems are examined while the 220...

Calculation of Debye-Waller Temperature Factors for GaAs

In this work we calculated the Debye-Waller factors (DWFs) of GaAs in the temperature range from 0.001 K up to 1000 K. The resulting temperature dependence is fitted using an approach outlined in the paper. For the calculation of the DWFs the phonon frequencies in GaAs were deduced from Hellmann-Feynman forces computed from supercells within the density functional theory approach. The calculated frequencies are compared with experimentally measured frequencies.