J. Zúñiga-Pérez

Interface structure and anisotropic strain relaxation of nonpolar wurtzite (1120) and (1010) orientations: ZnO epilayers grown on sapphire

The interface properties between nonpolar ZnO and sapphire have been studied using high resolution transmission electron microscopy. Two nonpolar orientations are investigated: a- and m-orientations corresponding to [112¯0] and [101¯0] crystallographic directions. After the definition of the epitaxial relationships and the resulting initial lattice mismatch, we show that nonpolar ZnO can be grown on sapphire with perfectly flat interfaces. Geometrical misfit dislocations are observed at the interface ZnO/sapphire and their density gives the residual strain in the layer. A strong anisotropy in the strain relaxation is found along the two perpendicular in-plane directions. This anisotropy may be explained in terms of initial anisotropic mismatch yielding different relaxation processes. A domain matching epitaxy is observed in m- and a-oriented layers for mismatches larger than 9% while a lattice matching epitaxy, in which the relaxation is driven by nucleation and glide of dislocations, is observed in a-ori...

Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy

The valence band offset of ZnO/AlN heterojunctions is determined by high resolution x-ray photoemission spectroscopy. The valence band of ZnO is found to be 0.43±0.17 eV below that of AlN. Together with the resulting conduction band offset of 3.29±0.20 eV, this indicates that a type-II (staggered) band line up exists at the ZnO/AlN heterojunction. Using the III-nitride band offsets and the transitivity rule, the valence band offsets for ZnO/GaN and ZnO/InN heterojunctions are derived as 1.37 and 1.95 eV, respectively, significantly higher than the previously determined values.

Polariton lasing in a hybrid bulk ZnO microcavity

We demonstrate polariton lasing in a bulk ZnO planar microcavity under non-resonant optical pumping at a small negative detuning (δ ∼ −1/6 the 130 meV vacuum Rabi splitting) and a temperature of 120 K. The strong coupling regime is maintained at lasing threshold since the coherent nonlinear emission from the lower polariton branch occurs at zero in-plane wavevector well below the uncoupled cavity mode. The contribution of multiple localized polariton modes above threshold and the non-thermal polariton statistics show that the system is in a far-from-equilibrium regime, likely related to the moderate photon lifetime and in-plane photonic disorder in the cavity.

Homogeneous core/shell ZnO/ZnMgO quantum well heterostructures on vertical ZnO nanowires.

Low-area density ZnO nanowire arrays, growing perpendicularly to the substrate, are synthesized with high-pressure pulsed laser deposition. The introduction of a ZnO buffer layer enables us to fabricate individual nanowires several micrometres apart (area density<0.1 nanowire microm(-2)), suppressing any shadowing effect by neighbouring nanowires during subsequent growth. These low density ZnO nanowires, whose c-axis is perpendicular to the substrate surface, are then used as templates to grow ZnO/ZnMgO core-shell nanowire heterostructures with conventional low-pressure pulsed laser deposition. Cathodoluminescence spectroscopy as well as transmission electron microscopy show that a sharp interface forms between the ZnO core and the ZnMgO shell. Based on these findings, we have grown a series of radial ZnO/ZnMgO quantum wells with different thicknesses that exhibit quantum confinement effects, with thicker quantum wells emitting at lower energies. Spatially resolved cathodoluminescence confirms the homogeneity of the quantum well structure along the full nanowire length of about 3 microm.

Structural characterization of a-plane Zn1−xCdxO (0⩽x⩽0.085) thin films grown by metal-organic vapor phase epitaxy

Zn1−xCdxO(112¯0) films have been grown on (011¯2) sapphire (r–plane) substrates by metal-organic vapor phase epitaxy. A 800-nm-thick ZnO buffer, deposited prior to the alloy growth, helps to prevent the formation of pure CdO. A maximum uniform Cd incorporation of 8.5 at. % has been determined by Rutherford backscattering spectrometry. Higher Cd contents lead to the coexistence of Zn1−xCdxO alloys of different compositions within the same film. The near band-edge photoluminescence emission shifts gradually to lower energies as Cd is incorporated and reaches 2.93 eV for the highest Cd concentration (8.5 at. %). The lattice deformation, due to Cd incorporation, has been described using a new reference frame in which the lattice distortions are directly related to the a-plane surface structure. Cd introduction does not affect the c lattice parameter but expands the lattice along the two perpendicular directions, [112¯0] and [1¯100], resulting in a quadratic volume increase.

Interfacial structure and defect analysis of nonpolar ZnO films grown on R-plane sapphire by molecular beam epitaxy

The interfacial relationship and the microstructure of nonpolar (11−20) ZnO films epitaxially grown on (1−102) R-plane sapphire by molecular beam epitaxy are investigated by transmission electron microscopy. The already-reported epitaxial relationships [1−100]ZnO∥[11−20]sapphire and ⟨0001⟩ZnO∥[−1101]sapphire are confirmed, and we have determined the orientation of the Zn–O (cation-anion) bond along [0001]ZnO in the films as being uniquely defined with respect to a reference surface Al–O bond on the sapphire substrate. The microstructure of the films is dominated by the presence of I1 basal stacking faults [density=(1–2)×105cm−1] and related partial dislocations [density=(4–7)×1010cm−2]. It is shown that I1 basal stacking faults correspond to dissociated perfect dislocations, either c or a+c type.

Temperature dependence of the direct bandgap and transport properties of CdO

Temperature-dependent optical absorption, Hall effect, and infrared reflectance measurements have been performed on as-grown and post-growth annealed CdO films grown by metal organic vapor phase epitaxy on sapphire substrates. The evolution of the absorption edge and conduction electron plasmon energy with temperature has been modeled, including the effects arising from the Burstein-Moss shift and bandgap renormalization. The zero-temperature fundamental direct bandgap and band edge effective mass have been determined to be 2.31+/-0.02 eV and 0.27+/-0.01m(0), respectively. The associated Varshni parameters for the temperature dependence of the bandgap are found to be a alpha = 8 x 10(-4) eV/K and beta = 260 K.

On the polarity of GaN micro- and nanowires epitaxially grown on sapphire (0001) and Si(111) substrates by metal organic vapor phase epitaxy and ammonia-molecular beam epitaxy

The polarity of GaN micro- and nanowires grown epitaxially by metal organic vapor phase epitaxy on sapphire substrates and by molecular-beam epitaxy, using ammonia as a nitrogen source, on sapphire and silicon substrates has been investigated. On Al2O3(0001), whatever the growth technique employed, the GaN wires show a mixture of Ga and N polarities. On Si(111), the wires grown by ammonia-molecular beam epitaxy are almost entirely Ga-polar (around 90%) and do not show inversion domains. These results can be understood in terms of the growth conditions employed during the nucleation stage.

Experimental observation of strong light-matter coupling in ZnO microcavities: Influence of large excitonic absorption

We present experimental observation of the strong light-matter coupling regime in ZnO bulk microcavities grown on silicon. Angle resolved reflectivity measurements, corroborated by transfer-matrix simulations, show that Rabi splittings in the order of 70 meV are achieved even for low finesse cavities. The impact of the large excitonic absorption, which enables a ZnO bulk-like behavior to be observed even in the strong coupling regime, is illustrated both experimentally and theoretically by considering cavities with increasing thickness.

Residual strain in nonpolar a-plane Zn1−xMgxO (0<x<0.55) and its effect on the band structure of (Zn,Mg)O/ZnO quantum wells

We investigate the dependence on Mg content of the lattice parameters and the surface morphology of nonpolar a-(112¯0) Zn1−xMgxO (x≤0.55) grown by molecular beam epitaxy. The anisotropy of the lattice parameters gives rise to an unusual in-plane strain state in the ZnO QWs: tensile strain along [11¯00] and compressive strain along [0001]. For a Zn0.6Mg0.4O barrier, the strain in a ZnO QW reaches −1.3% along [0001] and +0.3% along [11¯00]. This induces a strong blueshift of the excitonic transitions, in addition to the confinement effects, which we observe in photoluminescence excitation experiments.