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Dive into the research topics where Jack I. Hanoka is active.

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Featured researches published by Jack I. Hanoka.


Applied Physics Letters | 1993

Influence of ion-implanted titanium on the performance of edge-defined, film-fed grown silicon solar cells

J.T. Borenstein; Jack I. Hanoka; B. R. Bathey; J.P. Kalejs; S. Mil’shtein

The electrical properties of edge‐defined, film‐fed grown and Czochralski silicon solar cells ion implanted with titanium have been investigated using deep level transient spectroscopy. In both types of solar cell materials, the observed degradation in cell performance is associated with the Ti deep level reported in earlier studies. During the cell fabrication sequence, Ti in‐diffuses into the bulk of the sample, creating a low‐lifetime zone extending beneath the junction. Solar cell modeling, based on the extent of the titanium‐diffused layer and the properties of the Ti center, is in excellent agreement with observed cell performance.


Applied Physics Letters | 1985

Measurement of diffusion length gradients in hydrogen passivated silicon ribbon

R. H. Micheels; Z. Vayman; Jack I. Hanoka

Hydrogen passivation of p‐type Si ribbon was studied by means of diffusion length measurements using the surface photovoltage (SPV) method. The effect of gradients in diffusion length on the SPV measurements and the median depth sampled by this method were investigated by numerical solution of the appropriate diffusion equations. The SPV technique was found to give an average of the diffusion length depth distribution with a median sampling depth of 70 μm. Up to threefold increases in diffusion length were observed due to passivation. Diffusion length profiling measurements made by etching away the surface showed significant passivation occurring at a depth of 200 μm.


Applied Physics Letters | 1990

Deep levels in edge‐defined, film‐fed grown silicon solar cells

Y. Yang; S. Mil’shtein; J.T. Borenstein; Jack I. Hanoka

Deep level transient spectroscopoy (DLTS) was used for studies of defects in edge‐defined film‐fed grown solar cells. For the first time, specific electronic traps were observed and identified in this polycrystalline silicon material. The DLTS spectra were taken in the extended temperature range 80–450 K, and a number of deep centers were detected. Several dislocation‐ and impurity‐related states were identified at low concentrations in the processed solar cells. Variations in crystal growth conditions were shown to produce a novel high‐temperature peak which exhibited a strong correlation to the bulk lifetime of the solar cell.


Archive | 1984

Method of fabricating solar cells

Ronald H. Micheels; Percy Valdivia; Jack I. Hanoka


Archive | 1991

Method for forming contacts

Jack I. Hanoka; Scott E. Danielson


Archive | 1995

Method of fabricating contacts for solar cells

Jack I. Hanoka


Archive | 1992

Solar cell and method of making same

James A. Amick; Frank J. Bottari; Jack I. Hanoka


Archive | 1995

Apparatus for forming diffusion junctions in solar cell substrates

Mark D. Rosenblum; Jack I. Hanoka


Archive | 1989

Solar cell with trench through pn junction

Ronald H. Micheels; Percy Valdivia; Jack I. Hanoka


Archive | 1991

Method of applying metallized contacts to a solar cell

Frank J. Bottari; Jack I. Hanoka; Frank W. Sylva

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