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Archive | 1975

New uses of ion accelerators

Thomas A. Cahill; James Anthony Cairns; Wei-Kan Chu; Billy L. Crowder; Geoffrey Dearnaley; L. C. Feldman; Quentin C. Kessel; J. W. Mayer; Otto Meyer; Samuel T. Picraux; Winthrop W. Smith; Eligius A. Wolicki; J. F. Ziegler

1. Ion-Excited X-Ray Analysis of Environmental Samples.- I. Introduction.- II. General Considerations for Ion Beam Analysis of Environmental Samples.- III. Formalism and Optimization.- IV. The UCD/ARB Aerosol Analysis System.- A. The Primary Ion Beam.- B. Detection of X-Rays.- C. Data Acquisition and Reduction.- D. System Calibration.- E. Target Preparation and Matrix Effects.- F. Estimation of Analytical Costs.- G. Validation of System Operations.- V. Ion-Excited X-Ray Analysis Programs.- Appendix (Forward Scattering).- Acknowledgments.- References.- 2: Material Analysis by Nuclear Backscattering.- A. Introduction.- General Comments on Nuclear Backscattering.- Appendix (Numerical Examples).- References.- B. Applications.- I. Introduction.- II. Ion Implantation.- III. Thin Films: Growth and Deposition.- IV. Thin Film Reactions: Interdiffusion and Compound Formation.- V. Bulk Effects: Composition, Diffusion and Solubility.- VI. Concluding Remarks.- Acknowledgments.- References.- Formalism.- 1. Three Basic Concepts in Backscattering.- A. Backscattering Kinematic Factor Mass ? Analysis.- B. Differential Scattering Cross Section ? Quantitative Analysis.- C. Energy Loss ? Depth Analysis.- 2. Depth Scale in Backscattering Analysis [S].- A. Depth Scale in Backscattering Analysis.- B. Surface Approximation.- C. Linear Approximation.- 3. Height of an Energy Spectrum.- A. Surface Approximation for Spectrum Height.- B. Thick Target Yield.- C. Backscattering Yield of a Thin Film.- 4. Applications of Backscattering from Elemental Targets.- A. Surface Contamination and Ion Implantation.- B. Doping Level of a Bulk Sample.- C. Film Thickness Measurement and dE/dx Measurements.- D. Yield Formula and dE/dx Measurements.- E. Differential Scattering Cross Section Measurement.- 5. Application of Backscattering to Compound Targets.- A. Thin Film Analysis.- B. Thick Compound Targets.- C. Analysis on Composition Varying Continuously with Depth.- Appendix 1. Notations.- Appendix 2. Formulae.- Appendix 3. Sources for dE/dx Information.- References.- 3: Material Analysis by Means of Nuclear Reactions.- Charged Particle Activation Analysis.- Charged Particle Activation Analysis - Examples.- Prompt Radiation Analysis.- Nonresonant Nuclear Reactions - Gamma Rays Observed.- Nonresonant Nuclear Reactions - Nuclear Particles Observed.- Resonant Nuclear Reactions.- Summary.- Acknowledgment.- References.- 4: Lattice Location of Impurities in Metals and Semiconductors.- I. Introduction.- II. Impurity Detection.- III. The Channeling Technique.- 1. Channeling Concept.- 2. Experimental Technique.- IV. Lattice Location Analysis.- V. Examples.- 1. Substitutional Impurities.- 2. Nearly Substitutional Impurities.- 3. Interstitial Impurities.- 4. High Impurity Concentrations.- 5. Radiation-Induced Change in Impurity Sites.- VI. Summary of the Literature on Channeling Lattice Location Data.- VII. Limitations.- VIII. Conclusions.- References.- 5: Ion Implantation in Metals.- Historical Perspective.- Friction and Wear.- Corrosion.- 1. Oxides with Anion Defects.- 2. Oxides with Cation Defects.- Ion Backscattering.- Titanium and Stainless Steel.- Zirconium.- Aluminum.- Copper.- Aqueous Corrosion.- Practical Applications in Corrosion.- Electrochemistry and Catalysis.- Implantation Metallurgy.- Equipment for the Ion Implantation of Metals.- Conclusions.- References.- 6: Ion Implantation in Superconductors.- Definition of the Superconducting Parameters.- Influence of Radiation Damage on the Superconducting Properties.- a. Non-Transition Metals.- b. Transition Metals.- c. Transition Metal Alloys.- d. Superconductors with A-15 and NaCl-Structure.- e. Transition Metal Layer Compounds.- f. Quantitative Estimation of Damage in Superconductors.- Influence of Implanted Ions on the Superconducting Transition Temperature.- a. Magnetic Impurities in Non Transition Metals.- b. Pd-, Pd-Noble Metal Alloy, -Hydrogen System.- c. Ion Implanted Transition Metal Systems.- d. Aluminum Based Ion Implanted Systems.- Application to Superconducting Devices.- Conclusions.- References.- 7: Ion-Induced X-Rays from Gas Collisions.- 1. Introduction.- 2. Collision Models.- 2.1. Survey of Models.- 2.2. Coulomb Ionization.- 2.3. The Molecular-Orbital Model.- 3. Measurements of Inner-Shell Excitations.- 3.1. Introduction.- 3.2. Theory of Energy-Loss Measurements.- 3.3. X-Ray and Electron Emission.- 3.4. Typical Apparatus-Ionization and Inelastic Energy Loss.- 3.5. Scattered- Ion-X-Ray/Electron Coincidence Apparatus.- 4. Discussion of Typical Data.- 4.1. Ionization States.- 4.2. Inelastic Energy Loss.- 4.3. Electron Emission Cross Sections.- 4.4. Fluorescence Yield Effects.- 4.5. X-Ray-Scattered-Ion Coincidence Data.- 4.6. X-Rays from Highly Stripped Fast Ion Beams.- 5. Summary.- References.- 8: Ion-Induced X-Rays in Solids.- 1. Introduction.- 2. Accelerators and Target Chambers.- 2.1. Ion Sources.- 2.2. Target Chambers.- 3. The Detection and Analysis of X-Rays.- 3.1. The Gas Flow Proportional Counter.- 3.2. The Si(Li) Detector.- 3.3. The X-Ray Crystal or Grating Spectrometer.- 4. The Use of Protons and Helium Ions to Generate X-Rays from Solid Targets.- 4.1. Current Areas of Fundamental Interest.- 4.2. Applications.- 5. The Use of Heavy Ions to Generate X-Rays from Solid Targets.- 5.1. General Background.- 5.2. Physical Processes.- 5.3. Applications.- 6. Conclusions.- References.- Author Index.


MRS Proceedings | 1988

An Electron Microscopy Study of the Alkaline Hydrolysis Products of Tetraethoxysilane

Jeffrey Adams; Thomas Baird; Paul S. Braterman; James Anthony Cairns; David L. Segal

The hydrolysis of tetraethoxysilane was studied in an ethanol-water system with ammonium hydroxide catalyst. Reactions were carried out with water concentrations of 5M and 10M and ammonia concentrations up to 1.7M, and the products examined by electron optical methods. Variation of reagent concentrations lead to changes in the product morphology from small irregular particles, through roughly spherical and spherical particles to large fused particles. Within the range of particulate material the variations in size can be related to the effect of reagent concentrations by consideration of the reactions occurring. The effect on morphology of replacing ammonia with ethylamine was investigated and resembles that of the use of much higher ammonia concentrations.


Archive | 1976

Methods of fabricating bodies

James Anthony Cairns; Michael Lesney Noakes


Archive | 1978

Catalyst of a coating on an alloy substrate

James Anthony Cairns


Archive | 1973

Apparatus for purifying exhaust waste gases

James Anthony Cairns; Richard Stuart Nelson; Stanley Frederick Pugh


Archive | 1975

Catalysts sputtered on substantially nonporous low surface area particulate supports

James Anthony Cairns; Richard Stuart Nelson; Rhydwyn William Barnfield


Archive | 1978

Method of producing dense refractory oxide coatings on metallic substrates and the production of catalysts from the coated substrates

James Anthony Cairns; Robert L. Nelson; James L. Woodhead


Archive | 1980

Catalyst supports and fluid treatment devices

Michael Lesney Noakes; James Anthony Cairns


Archive | 1990

CATALYST FOR THE OXIDATION OF CARBONACEOUS PARTICULATES AND METHOD OF MAKING THE CATALYST

Norman Jorgensen; Michael John Davies; James Anthony Cairns; Paul Graham Deards


Archive | 1982

Coated ceramic substrates for mounting integrated circuits

James Anthony Cairns; James Francis Ziegler

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Michael Lesney Noakes

United Kingdom Atomic Energy Authority

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James L. Woodhead

United Kingdom Atomic Energy Authority

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Michael John Davies

United Kingdom Atomic Energy Authority

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Norman Jorgensen

United Kingdom Atomic Energy Authority

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Paul Graham Deards

United Kingdom Atomic Energy Authority

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James Francis Ziegler

United Kingdom Atomic Energy Authority

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Richard Stuart Nelson

United Kingdom Atomic Energy Authority

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Thomas Campbell Prentice

United Kingdom Atomic Energy Authority

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David L. Segal

United Kingdom Atomic Energy Authority

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Robert L. Nelson

United Kingdom Atomic Energy Authority

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