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Publication
Featured researches published by James E. Fowler.
Rapid Response Manufacturing: Contemporary methodologies, tools, and techniques | 1998
Kevin K. Jurrens; Mary Elizabeth A. Algeo; James E. Fowler
Standards play an important part in an industry’s success or failure in the marketplace. They facilitate common markets, influence marketing patterns in global trade and augment the operations of distributed enterprises.
Journal of Research of the National Institute of Standards and Technology | 2001
Michael D. Hogan; Lisa J. Carnahan; Robert J. Carpenter; David W. Flater; James E. Fowler; Simon P. Frechette; M M. Gray; L A. Johnson; R. McCabe; Douglas C. Montgomery; Shirley M. Radack; R Rosenthal; Craig M. Shakarji
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society of the 21st century. Over the last half of the 20th century, information technology (IT) has been a powerful agent of change in almost every sector of the economy. The complexity and rapidly changing nature of IT have presented unique technical challenges to the National Institute of Standards and Technology (NIST) and to the scientific measurement community in developing a sound measurement and testing infrastructure for IT. This measurement and testing infrastructure for the important non-physical and non-chemical properties associated with complex IT systems is still in an early stage of development. This paper explains key terms and concepts of IT metrology, briefly reviews the history of the National Bureau of Standards/National Institute of Standards and Technology (NBS/NIST) in the field of IT, and reviews NIST’s current capabilities and work in measurement and testing for IT. It concludes with a look at what is likely to occur in the field of IT over the next ten years and what metrology roles NIST is likely to play.
Archive | 1996
Edward Barkmeyer; Shaw C. Feng; James E. Fowler; Simon P. Frechette; Albert T. Jones; Kevin K. Jurrens; Kevin W. Lyons; Charles R. McLean; Michael J. Pratt; Harry A. Scott; M Kate Senehi; Ram D. Sriram; Evan K. Wallace
NIST Interagency/Internal Report (NISTIR) - 5707 | 1995
Kevin K. Jurrens; James E. Fowler; Mary B. Algeo
NIST Interagency/Internal Report (NISTIR) - 6721 | 2001
Mark G. Carlisle; James E. Fowler
NIST Interagency/Internal Report (NISTIR) - 4699 | 1991
Edward J. Barkmeyer; James E. Fowler; S Magleby
Journal of Research of the National Institute of Standards and Technology | 2000
Mark G. Carlisle; James E. Fowler
Journal of Research of the National Institute of Standards and Technology | 2000
James E. Fowler; Mark G. Carlisle
Archive | 1996
Mary B. Algeo; James E. Fowler; Kevin K. Jurrens
Archive | 1996
James E. Fowler; Mary B. Algeo; Kevin K. Jurrens