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Dive into the research topics where James R. Baker-Jarvis is active.

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Featured researches published by James R. Baker-Jarvis.


IEEE Transactions on Microwave Theory and Techniques | 1990

Improved technique for determining complex permittivity with the transmission/reflection method

James R. Baker-Jarvis; E. J. Vanzura; W. A. Kissick

The transmission/reflection method for complex permittivity and permeability determination is studied. The special case of permittivity measurement is examined in detail. Robust algorithms for permittivity determination that eliminate the ill-behaved nature of the commonly used procedures at frequencies corresponding to integer multiples of one-half wavelength in the sample are presented. An error analysis yielding estimates of the errors incurred due to the uncertainty in scattering parameters, length measurement, and reference plane position is presented. Equations for determining complex permittivity independent from reference plane position and sample length are derived. >


Measurement Science and Technology | 1998

A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature

Jerzy Krupka; Krzysztof Derzakowski; Bill Riddle; James R. Baker-Jarvis

An application of a mode dielectric resonator is described for precise measurements of complex permittivity and the thermal effects on permittivity for isotropic dielectric materials. The Rayleigh-Ritz technique was employed to find a rigorous relationship between permittivity, resonant frequency, and the dimensions of the resonant structure, with relative computational accuracy of less than . The influence of conductor loss and its temperature dependence was taken into account in the dielectric loss tangent evaluation. Complex permittivities of several materials, including cross-linked polystyrene, polytetrafluoroethylene, and alumina, were measured in the temperature range of 300-400 K. Absolute uncertainties of relative permittivity measurements were estimated to be smaller than 0.2%, limited mainly by uncertainty in the sample dimensions. For properly chosen sample dimensions, materials with dielectric loss tangents in the range of to can be measured using the mode dielectric resonator.


IEEE Transactions on Instrumentation and Measurement | 1994

Analysis of an open-ended coaxial probe with lift-off for nondestructive testing

James R. Baker-Jarvis; Michael D. Janezic; Paul D. Domich; Richard G. Geyer

The open-ended coaxial probe with lift-off is studied using a full-wave analysis, and an uncertainty analysis is presented. The field equations for the following terminations are worked out: (1) the sample extends to /spl infin/ in the positive axial direction, (2) the sample is backed by a well-characterized material, and (3) the sample is backed by a short-circuit termination. The equations are valid for both dielectric and magnetic materials. The model allows the study of the open-ended coaxial probe as a nondestructive testing tool. The analysis allows a study of the effects of air gaps on probe measurements. The reflection coefficient and phase are studied as a function of lift-off, coaxial line size, permittivity, permeability, and frequency. Numerical results indicate that the probe is very sensitive to lift-off. For medium to high permittivity values and electrically small probes, gaps on the order of fractions of a millimeter strongly influence the reflection coefficient. In order for the field to penetrate through the air gap, larger size coaxial line or higher frequencies need to be used. A comparison of the theory to experiment is presented. The results are in close agreement. A differential uncertainty analysis is also included. >


IEEE Transactions on Dielectrics and Electrical Insulation | 1998

Dielectric characterization of low-loss materials a comparison of techniques

James R. Baker-Jarvis; Richard G. Geyer; John H. Grosvenor; Michael D. Janezic; Chriss A. Jones; Bill Riddle; Claude Weil; Jerzy Krupka

Measurements on low-loss materials using closed and open cavity resonators, and dielectric resonator methods are presented. Results indicate that consistent measurement results can be obtained with a number of well-characterized fixtures. Uncertainties associated with each method are addressed. Measurements also were performed on materials used in previous intercomparisons.


IEEE Transactions on Microwave Theory and Techniques | 2003

Complex permittivity measurements of common plastics over variable temperatures

Billy F. Riddle; James R. Baker-Jarvis; Jerzy Krupka

In this paper, we present complex permittivity data at microwave frequencies (approximately 10 GHz) for many common plastics over a temperature range of 122 to 375 K. The measurements were made with a TE/sub 01/spl delta// dielectric resonator placed inside an environmental chamber. Data are presented for the following materials: acrylonitrile butadiene styrene, polytetrafluoroethylene, cross-linked polystyrene, tetrafluorethylene-perfluorpropylene, polypropylene, polysulfone, polymethylmethacrylate, polyvinyl chloride, polycarbonate, high-density polyethylene, polyoxy-methylene (acetal homopolymer), and polyamide.


Journal of The European Ceramic Society | 2001

Uncertainty of complex permittivity measurements by split-post dielectric resonator technique

Jerzy Krupka; A. P. Gregory; O. C. Rochard; R. M. Clarke; Billy F. Riddle; James R. Baker-Jarvis

Abstract Split-post dielectric resonators operating at frequencies 1.4–5.5 GHz were used to measure complex permittivity of single crystal standard reference dielectric materials with well known dielectric properties previously measured by other techniques. Detailed error analysis of permittivity and dielectric loss tangent measurements has been performed. It was proved both theoretically and experimentally that using split post resonators it is possible to measure permittivity with uncertainty about 0.3% and dielectric loss tangent with resolution 2×10 −5 for well-machined laminar specimens.


Journal of Applied Physics | 1996

Applicability of effective medium theory to ferroelectric/ferrimagnetic composites with composition and frequency‐dependent complex permittivities and permeabilities

Joseph V. Mantese; Adolph L. Micheli; Dennis F. Dungan; Richard G. Geyer; James R. Baker-Jarvis; John H. Grosvenor

High‐frequency (1 MHz–1 GHz) transmission line measurements were used to determine the composition and frequency‐dependent complex permittivities and complex permeabilities of ferroelectric/ferrimagnetic (barium titanate and a magnesium‐copper‐zinc ferrite) composites. The effective medium rules of Maxwell–Garnett give both lower and upper bounds for the effective permittivities and permeabilities and yield accurate estimates of the bulk electric and magnetic properties at low volume fill fraction of either component provided the proper host matrix is chosen. Bruggeman theory yielded the best predictive values for the permittivity and permeability over the entire composition range. In all cases these complex quantities were shown to be constrained by Bergman–Milton bounds.


IEEE Transactions on Microwave Theory and Techniques | 1999

Full-wave analysis of a split-cylinder resonator for nondestructive permittivity measurements

Michael D. Janezic; James R. Baker-Jarvis

This paper presents a full-wave analysis of the split-cylinder resonator. We outline a model where the fringing fields are rigorously accounted for and the resonance condition is derived. Using this model, a method for nondestructively measuring the complex permittivity of materials is examined. Measurements of the complex permittivity for low-loss dielectric materials using the split-cylinder resonator agree well with measurements made in a cylindrical cavity. An uncertainty analysis for the complex permittivity is also provided.


IEEE Transactions on Instrumentation and Measurement | 1992

A nonlinear least-squares solution with causality constraints applied to transmission line permittivity and permeability determination

James R. Baker-Jarvis; Richard G. Geyer; Paul D. Domich

A technique for the solution of one-port and two-port scattering equations for complex permittivity and permeability determination is presented. Using a nonlinear regression procedure, the model determines parameters for the specification of the spectral functional form of complex permittivity and permeability. The method is based on a nonlinear regression technique and uses the fact that a causal, analytic function can be represented by poles and zeros. The technique allows the accurate determination of many low- and high-permittivity dielectric and magnetic materials in either the low- or high-loss range. The model allows for small adjustments, consistent with the physics of the problem, to independent variable data such as angular frequency, sample length, sample position, and cut-off wavelength. The model can determine permittivity and permeability for samples where sample length, sample position, and sample holder length are not known precisely. The problem of local minima is discussed. >


IEEE Instrumentation & Measurement Magazine | 2010

High-frequency dielectric measurements

James R. Baker-Jarvis; Michael D. Janezic; Donald C. DeGroot

The demands on dielectric material measurements have increased over the years as electrical components have been miniaturized and device frequency bands have increased. Well-characterized dielectric measurements on thin materials are needed for circuit design, minimization of crosstalk, and characterization of signal-propagation speed. Bulk material applications have also increased. For accurate dielectric measurements, each measurement band and material geometry requires specific fixtures. Engineers and researchers must carefully match their material system and uncertainty requirements to the best available measurement system. Broadband measurements require transmission-line methods, and accurate measurements on low-loss materials are performed in resonators. The development of the most accurate methods for each application requires accurate fixture selection in terms of field geometry, accurate field models, and precise measurement apparatus.

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Michael D. Janezic

National Institute of Standards and Technology

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Richard G. Geyer

National Institute of Standards and Technology

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Jerzy Krupka

Warsaw University of Technology

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Pavel Kabos

Colorado State University

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Billy F. Riddle

National Institute of Standards and Technology

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Christopher L. Holloway

National Institute of Standards and Technology

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Sung Kim

National Institute of Standards and Technology

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Bill Riddle

National Institute of Standards and Technology

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Edward F. Kuester

University of Colorado Boulder

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John H. Grosvenor

National Institute of Standards and Technology

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