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James W. Kramer

Zygo Corporation

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Publication

Featured researches published by James W. Kramer.

Archive | 2001

Height scanning interferometry method and apparatus including phase gap analysis

Peter de Groot; James W. Kramer

Archive | 2001

Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum

Peter J. de Groot; Xavier Colonna de Lega; Leslie L. Deck; James W. Kramer

Archive | 2011

Method and device for determining geometric property of test object and optical profiling system

James F. Biegen; Groot Peter De; Lega Xavier Colonna De; Leslie L. Deck; David Grigg; James W. Kramer; グリッグ、デイビッド; ダブリュ． クレイマー、ジェームズ; デ レーガ、グザヴィエ コロンナ; グルート、ピーター デ; エル． デック、レスリー; ビーゲン、ジェームズ

Archive | 2010

Höhenabtast-Interferometer zum Bestimmen der Absolutposition und des Oberflächenprofils eines Objekts im Hinblick auf ein Datum

Peter de Groot; Xavier Colonnia de Middletown Lega; Leslie L. Deck; James W. Kramer

Archive | 2001

Optische Systeme zur Messung der Form und der geometrischen Abmessungen von Präzisionsbauteilen Optical systems for measuring the shape and the geometrical dimensions of precision components

Groot Peter De; De Lega Xavier Colonna; David Grigg; James F. Biegen; Leslie L. Deck; James W. Kramer

Archive | 2001

Höhenabtast interferometer for determining the absolute position and the surface profile of an object with respect to a date

Leslie L. Deck; Peter De Middletown Groot; James W. Kramer; Xavier Colonnia de Middletown Lega

Archive | 2001

Verfahren und vorrichtung zur höhenabtastenden interferometrie mit phasendifferenz-analyse

Groot Peter De; James W. Kramer

Archive | 2001

Optische Systeme zur Messung der Form und der geometrischen Abmessungen von Präzisionsbauteilen

Groot Peter De; De Lega Xavier Colonna; David Grigg; James F. Biegen; Leslie L. Deck; James W. Kramer

Archive | 2001

Höhenabtast-Interferometer zum Bestimmen der Absolutposition und des Oberflächenprofils eines Objekts im Hinblick auf ein Datum Höhenabtast interferometer for determining the absolute position and the surface profile of an object in terms of a date

Leslie L. Deck; Peter De Middletown Groot; James W. Kramer; Xavier Colonnia de Middletown Lega

Archive | 2001

Verfahren und Einrichtungen zur Bestimmung einer geometrischen Eigenschaft eines Versuchsgegenstands sowie optisches Profilmesssystem Methods and means for determining a geometric property of a test object and optical profile measuring system

Peter J. de Groot; Xavier Colonna de Lega; David Grigg; James F. Biegen; Leslie L. Deck; James W. Kramer

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Leslie L. Deck

Zygo Corporation

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Groot Peter De

Zygo Corporation

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David Grigg

Zygo Corporation

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James F. Biegen

Zygo Corporation

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Peter de Groot

Zygo Corporation

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Xavier Colonna de Lega

Zygo Corporation

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Xavier Colonnia de Middletown Lega

Zygo Corporation

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De Lega Xavier Colonna

Zygo Corporation

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Peter J. de Groot

PerkinElmer

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Lega Xavier Colonna De

Zygo Corporation

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