Is this you? Create Your Porfile
Avatar

Jeffrey Alan Hawthorne

Network

Latest external collaboration on country level. Dive into details by clicking on the dots.

Explore More

Hotspot

Dive into the research topics where Jeffrey Alan Hawthorne is active.

Explore More

Publication

Featured researches published by Jeffrey Alan Hawthorne.

Archive | 2006

INSPECTION SYSTEM AND APPARATUS

M. Brandon Steele; Jeffrey Alan Hawthorne

Archive | 2005

Semiconductor wafer inspection system

M. Brandon Steele; Jeffrey Alan Hawthorne

Archive | 2004

Wafer inspection system

M. Brandon Steele; Jeffrey Alan Hawthorne; Chun Ho Kim; David C Sowell

Archive | 2004

Wafer inspection using a nonvibrating contact potential difference probe (nonvibrating kelvin probe)

M. Brandon Steele; Jeffrey Alan Hawthorne; Chunho Kim; David C Sowell

Archive | 2007

Defect classification utilizing data from a non-vibrating contact potential difference sensor

Jeffrey Alan Hawthorne; M. Brandon Steele; Yeyuan Yang; Mark Schulze

Archive | 2004

SURFACE INSPECTION USING A NON-VIBRATING CONTACT POTENTIAL PROBE

M. Brandon Steele; Jeffrey Alan Hawthorne; Chunho Kim; David C Sowell

Archive | 2004

Measurement of motions of rotating shafts using non-vibrating contact potential difference sensor

Jeffrey Alan Hawthorne; M. Brandon Steele

Archive | 2007

Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination

Jeffrey Alan Hawthorne; M. Brandon Steele; Yeyuan Yang; Mark Schulze

Archive | 2010

PATTERNED WAFER INSPECTION SYSTEM USING A NON-VIBRATING CONTACT POTENTIAL DIFFERENCE SENSOR

Mark Schulze; Jun Liu; Jeffrey Alan Hawthorne

Archive | 2010

Système d'inspection de tranche à motif utilisant un capteur à différence de potentiel à contact non vibrant

Mark Schulze; Jun Liu; Jeffrey Alan Hawthorne

Explore More

Collaboration

Dive into the Jeffrey Alan Hawthorne's collaboration.

Explore More
Researchain Logo
Decentralizing Knowledge