Jens-Peter Ruske
University of Jena
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Featured researches published by Jens-Peter Ruske.
Applied Optics | 2002
Ulrich Grusemann; Brit Zeitner; Matthias Rottschalk; Jens-Peter Ruske; Andreas Tünnermann; Andreas Rasch
We demonstrate an integrated-optical unbalanced Mach-Zehnder interferometer in lithium niobate for detecting wavelength shifts of light sources, such as laser diodes and superluminescentdiodes at lambda = 844 nm. The output signal can be used to stabilize the light source. Because of the temperature dependence of the effective refractive index and the thermal expansion of the substrate, the device acts also as a temperature sensor. The temperature sensitivity of the interferometer was compensated for by the combination of proton exchanged- and annealed proton exchanged-channel waveguides by approximately two orders of magnitude. The thermo-optic coefficients of the extraordinary effective refractive index in integrated optical channel waveguides in LiNbO8 have been measured with high accuracy over a temperature range from 10 degrees C to 40 degrees C.
Nanofabrication Technologies and Device Integration | 1994
Matthias Rottschalk; Jens-Peter Ruske; Kay Hornig; Andreas Rasch
Singlemode strip waveguides at the wavelengths (lambda) equals0.514 micrometers and (lambda) equals0.488 micrometers have been fabricated in potassium titanyl phosphate (KTiOPO4 or KTP) by rubidium- potassium ion exchange in molten mixtures of RbNO3/KNO3/Ba(NO3)2. The technological parameters had been chosen by means of theoretical calculations concerning the singlemode region of the effective strip waveguide index N00 at the given wavelength. Measured near field distributions and insertion losses of the strip waveguides led to a typical attenuation of about 2 dB/cm for TM polarization at (lambda) equals0.514 micrometers . The light-induced refractive index changes (photorefractive effect) have been measured as a function of time, wavelength, and optical mode intensity. Electro-optic phase modulators have been successfully investigated concerning dynamic Vpi measurements, the electric-optical field overlap and dc-drift phenomena by using a special interferometric setup based on a two-beam interference of two neighboring strip waveguides.
Archive | 1996
Andreas Rasch; Matthias Rottschalk; Jens-Peter Ruske; Volker Dipl Ing Groeber
Physica Status Solidi (a) | 2011
Jens Thomas; Matthias Heinrich; Peter Zeil; Vinzenz Hilbert; K. Rademaker; Robert Riedel; Stefan Ringleb; Carsten Dubs; Jens-Peter Ruske; Stefan Nolte; Andreas Tünnermann
Archive | 1996
Andreas Rasch; Matthias Rottschalk; Jens-Peter Ruske; Volker Dipl Ing Groeber
Archive | 2001
Andreas Tuennermann; Holger Zellmer; Jens-Peter Ruske
Archive | 1996
Andreas Rasch; Matthias Rottschalk; Jens-Peter Ruske; Volker Dipl Ing Groeber
Archive | 1996
Andreas Rasch; Matthias Rottschalk; Jens-Peter Ruske; Volker Gröber
Journal of Lightwave Technology | 1995
Matthias Rottschalk; Jens-Peter Ruske; Kay Hornig; Steffen Steinberg; Gert Hagner; Andreas Rasch
Archive | 2000
Jens-Peter Ruske; Andreas Tünnermann; H. Zellmer