Jianhui Chen

Magnesium thin film as a doping-free back surface field layer for hybrid solar cells

In this work, a magnesium (Mg) thin film with a low work function is introduced to obtain a downward energy band at the rear surface of a hybrid solar cell to achieve the function of a back surface field (BSF) similar to the conventional n-n+ high-low junction, i.e., favouring the majority carrier transport and suppressing minority carrier recombination. The open circuit voltages (Voc) of the hybrid solar cells with the Mg BSF layer achieve a clear improvement over those containing only the conventional metal electrode (e.g., Ag), resulting in an increase in the power conversion efficiency (PCE) of the hybrid solar cells from 9.2% to 12.3%. The Suns-Voc measurement determined using a Sinton tool gives Voc as a function of light intensity and shows that Voc increases linearly with the light intensity for the solar cell with the Mg BSF but increases first and then stabilises for the cells without the Mg BSF. This result is attributed to a difference in back surface recombination, further confirming the effi...

Silicon surface passivation by polystyrenesulfonate thin films

The use of polystyrenesulfonate (PSS) thin films in a high-quality passivation scheme involving the suppression of minority carrier recombination at the silicon surface is presented. PSS has been used as a dispersant for aqueous poly-3,4-ethylenedioxythiophene. In this work, PSS is coated as a form of thin film on a Si surface. A millisecond level minority carrier lifetime on a high resistivity Si wafer is obtained. The film thickness, oxygen content, and relative humidity are found to be important factors affecting the passivation quality. While applied to low resistivity silicon wafers, which are widely used for photovoltaic cell fabrication, this scheme yields relatively shorter lifetime, for example, 2.40 ms on n-type and 2.05 ms on p-type wafers with a resistivity of 1–5 Ω·cm. However, these lifetimes are still high enough to obtain high implied open circuit voltages (Voc) of 708 mV and 697 mV for n-type and p-type wafers, respectively. The formation of oxides at the PSS/Si interface is suggested to ...

Oxygen vacancy as fatigue evidence of La0.5Sr0.5CoO3/PbZr0.4Ti0.6O3/La0.5Sr0.5CoO3 capacitors

La0.5Sr0.5CoO3 (LSCO) films grown on SrTiO3 substrates, cooled at reduced oxygen pressures, ranging from 8×104 to 1×10−4 Pa, from the depostion temperature, are used as the bottom electrodes of PbZr0.4Ti0.6O3 (PZT) capacitors to study the impact of oxygen stoichiometry of the LSCO bottom electrodes on the structural and physical properties of LSCO/PZT/LSCO capacitors. It is found that the tetragonality, polarization and fatigue-resistance of PZT films decrease with the decrease of the cooling oxygen pressure. Almost 60% polarization degradation occurs for the PZT capacitor with the LSCO bottom electrode cooled in 1×10−4 Pa oxygen up to 1010 switching cycles, indicating that the oxygen vacancy of the bottom electrode can result in fatigue of the LSCO/PZT/LSCO capacitor.

On the light-induced enhancement in photovoltaic performance of PEDOT:PSS/Si organic-inorganic hybrid solar cells

Light-induced degradation has been identified to be a critical issue for most silicon-based solar cell technologies. This study presents an observation of an opposite light-induced enhancement (LIE) effect in photovoltaic performance in poly(3,4-ethylthiophene):polystyrenesulfonate/n-Si organic-inorganic hybrid solar cells. The reduced density of interface states under light soaking (LS) is found to be responsible for the LIE of the hybrid solar cells. An increased minor carrier lifetime under LS and a switchable photoluminescence intensity while applying a voltage bias are observed, providing evidence for the underlying physical mechanism.

Achievement of two logical states through a polymer/silicon interface for organic-inorganic hybrid memory

A hysteresis loop of minority carrier lifetime vs voltage is found in polystyrenesulfonate (PSS)/Si organic-inorganic hybrid heterojunctions, implying an interfacial memory effect. Capacitance-voltage and conductance-voltage hysteresis loops are observed and reveal a memory window. A switchable interface state, which can be controlled by charge transfer based on an electrochemical oxidation/deoxidation process, is suggested to be responsible for this hysteresis effect. We perform first-principle total-energy calculations on the influence of external electric fields and electrons or holes, which are injected into interface states on the adsorption energy of PSS on Si. It is demonstrated that the dependence of the interface adsorption energy difference on the electric field is the origin of this two-state switching. These results offer a concept of organic-inorganic hybrid interface memory being optically or electrically readable, low-cost, and compatible with the flexible organic electronics.

Control of epitaxial growth at a-Si:H/c-Si heterointerface by the working pressure in PECVD*

The epitaxial-Si (epi-Si) growth on the crystalline Si (c-Si) wafer could be tailored by the working pressure in plasma-enhanced chemical vapor deposition (PECVD). It has been systematically confirmed that the epitaxial growth at the hydrogenated amorphous silicon (a-Si:H)/c-Si interface is suppressed at high pressure (hp) and occurs at low pressure (lp). The hp a-Si:H, as a purely amorphous layer, is incorporated in the lp-epi-Si/c-Si interface. We find that: (i) the epitaxial growth can also occur at a-Si:H coated c-Si wafer as long as this amorphous layer is thin enough; (ii) with the increase of the inserted hp layer thickness, lp epi-Si at the interface is suppressed, and the fraction of a-Si:H in the thin films increases and that of c-Si decreases, corresponding to the increasing minority carrier lifetime of the sample. Not only the epitaxial results, but also the quality of the thin films at hp also surpasses that at lp, leading to the longer minority carrier lifetime of the hp sample than the lp one although they have the same amorphous phase.