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Dive into the research topics where Jiann-Rong Lee is active.

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Featured researches published by Jiann-Rong Lee.


Process Monitoring with Optical Fibers and Harsh Environment Sensors | 1999

Noncoherent light interferometry as a thickness gauge

Harry Wayne Harris; Jiann-Rong Lee; Michael A. Marcus

This paper describes the development and evaluation of an automated measurement system for assessing at-line and on- line polyester thickness uniformity. The instrument is based on non-coherent light interferometry and includes a dual- interferometer, single mode optical fibers, sample coupling optics, custom electronics, data acquisition system, transport mechanism, data outputs, and computer. The principles of operation and measurement system performance are discussed. The use of the measurement data for measuring machine parameters in addition to thickness uniformity will be shown. Experiments were performed on an extruder machine to determine the suitability of the instrument and the optical probe design for on-line measurements. An automated measurement system was also developed for assessing at-line web thickness uniformity. The instrumentation for the at- line measurements was the same as the on-line system except a sample transport system was added.


Environmental and Industrial Sensing | 2001

Low-coherence light interferometry, instrumentation design, and application development

Michael A. Marcus; Jiann-Rong Lee; Harry Wayne Harris

A high-resolution (sub micron accuracy) fiber optic coupled dual Michelson interferometer based instrument has been developed and is being utilized in a variety of process monitoring applications. The instrument includes both coherent and non-coherent light sources, custom application dependent optical probes and sample interfaces, a Michelson interferometer, custom electronics, a Pentium based PC with data acquisition cards and LabWindows CVI based application specific software. This paper describes the development of this instrument with special emphasis on applications development. The principles behind robust instrument design hardware, software and user interfaces are discussed.


Process Monitoring with Optical Fibers and Harsh Environment Sensors | 1999

Digital camera focus assessment using a camera flange-mounted fiber optic probe

Michael A. Marcus; Jiann-Rong Lee; Stanley Gross; Timothy M. Trembley

During the assembly of high-end digital cameras, it is necessary to determine the location and orientation of the imager plane in order to assess the cameras focusing capability. An apparatus based on non-coherent light interferometry has been developed, which performs these test immediately after the digital imager is installed into the camera body. The instrument includes a camera lens flange- mountable multipoint fiber optic probe, an optical multiplexer and a non-coherent light interferometer measurement system with LabWindows CVI software specifically developed for this purpose. This talk describes the principle of the measurement, the fiber optic probe design, and presents results demonstrating the performance capability of the apparatus.


Archive | 1998

Method for determining the retardation of a material using non-coherent light interferometery

Michael A. Marcus; Jiann-Rong Lee


Archive | 2001

Interferometric-based external measurement system and method

Michael A. Marcus; Jiann-Rong Lee; Donald R. Lowry; Timothy M. Trembley


Archive | 1998

Method for measuring material thickness profiles

Michael A. Marcus; Jiann-Rong Lee; Stanley Gross; Harry Wayne Harris


Archive | 2003

Measurement method and apparatus of an external digital camera imager assembly

Michael A. Marcus; Eric A. Dilella; Jiann-Rong Lee; Donald R. Lowry; Timothy M. Trembley


Archive | 1998

Apparatus for measuring material thickness profiles

Michael A. Marcus; Jiann-Rong Lee; Harry Wayne Harris; Richard R. Kelbe


Archive | 2002

Apparatus and method for measuring digital imager, package and wafer bow and deviation from flatness

Michael A. Marcus; Thomas F. Kaltenbach; Duane M. Courtney; Jiann-Rong Lee


Archive | 1998

Method for processing interferometric measurement data

Michael A. Marcus; Jiann-Rong Lee

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