Jiaoying Huang

A method of FPGA interconnect resources testing by using XDL-based configuration

FPGA is widely used in military and aerospace applications and FPGA testing is the most effective means to ensure the reliability of them. Interconnect Resources testing is one of the most important parts of FPGA testing since that most of the faults occur on Interconnect Resources. FPGA needs to be configured as specified circuits before being tested and conventional HDL-based configuration can not achieve controllability of the resources to be tested. In order to solve this problem, we propose a XDL-based configuration. In this paper, grammar and design flow of XDL were analyzed firstly. Then structure of interconnect resources of Xilinx Spartan-3 FPGA and their description using XDL were studied. According to the structure of the interconnect resources, a BIST structure was built to implement the test of them. Through C++ programming, we got XDL programs automatically. With four configurations, we implemented the testing of hex lines across CLBs and not across CLBs as well as double line across CLBs and not across CLBs. The method could solve the problem of uncontrollability of the resources to be tested efficiently.

Notice of Retraction Ultrasonic based pressure measurement by using cross-correlation

Non-intrusive pressure measurement has the crucial role to the failure diagnosis and detection of hydraulic system where the conventional measurement instruments fail to make the necessary pressure readings within the sealed pipes. The measurement principle based on ultrasonic method was discussed in this paper. In order to make the processed method be suit for the hydraulic pipes which diameter of the pipes is less than 15mm and improve the measuring accuracy, a time delay estimation method based on cross-correlation theory was proposed. By applying the ultrasonic method and cross-correlation theory, the testing platform of pressure via time delay measurement was designed. The simulation and testing results indicate that the proposed method is feasible for non-intrusive measurement of pressure. It offers a new online pressure measurement method for hydraulic system which diameter of the pipes is less than 15mm.

Discussion on multilayer ceramic replacements for tantalum capacitors

Since ceramic capacitors are good for high frequency smoothing while risk of transient & oscillation, tantalum capacitors are good for compromise, relatively easy for reliable DC/DC design. In order to resolve transient failures of tantalum capacitances, discussion on multilayer ceramic capacitors (MLCC) replacement for tantalum capacitors was presented in this paper. Firstly, performance comparison of MLCC and tantalum capacitances was studied. Then MLCC mechanical robustness against cracking was analyzed. In order to achieve the mechanical robustness against cracking, some installation process was proposed. The results indicated that MLCC metal stent can provide a high-capacity, which solve the stress defect caused in manufacture process. Also it can meet the high reliability requirement.

Online life assessment method of operational amplifier based on accelerated degradation test

Operational amplifier is the basis of analog circuit technology, whose reliability is very important for circuit system. In order to collect parameters online and to assess working life of operational amplifier, a parameters online testing system was designed. This system is consisted of a typical operating circuit and a electrical connection of the test circuit for device under test(DUT). Besides, parameters which are tested by the test circuit can be collected by a data acquisition system. And values of parameters can be displayed on PC. And an accelerated degradation test(ADT) is designed, a heat source and thermocouple were pasted on the back of the heat sink so that the temperature of heat source can be controlled. Finally, the life of this operational amplifier operating under normal stresses can be assessed by mathematical methods. The results indicate that the proposed method is valid for online life assessment of operational amplifier.

Prediction method of crystal resonator storage life based on LS-SVM

A method of data processing - least squares support vector machine (LS-SVM), has been introduced to predict the storage life of crystal resonator. Several environmental factors have been investigated for their effects on the degradation of the function of quartz crystal resonator, the main degradation mechanisms of crystal resonator are studied and analyzed to figure out the trend of the performance parameters in the long-term storage, the frequency deviation is determined as the sensitive degradation parameter of crystal resonator. When temperature is the only accelerated stress, the gradation model of frequency deviation has been combined with the Arrhenius model to obtain the regression function about frequency deviation, and by means of LS-SVM, the storage life prediction of crystal resonator can be modeled and computed. The accelerated storage life test of the crystal resonator JA8 is designed, the degradation data collected of frequency deviation are put into the LS-SVM model, and with the result that storage life of crystal resonator can be predicted successfully. This model takes advantage of LS-SVM to solve how to build small samples and nonlinear model and process test data in storage life prediction of crystal resonator, which improves the prediction accuracy and computing efficiency and will be very practical and promotional.

Perniciousness analysis of IC hardware Trojan based on characteristic function deployment

New hardware security threats are emerging, meanwhile detection and recognition technologies are immature for unknown types. This paper introduces a relation matrix to analysis perniciousness of IC hardware Trojan. The relation matrix is based on characteristic deployment includes concealment of trigger and harmfulness of payload. Results of this paper can be used to measure the perniciousness of different types of hardware Trojan, also provide a way to predict new hardware threats, in this way help to defend unknown hardware attacks and improve detection efficiency.

Study of single event transient induced by heavy-ion in NMOS transistor and CMOS inverter: Study of single event transient induced by heavy-ion in NMOS transistor and CMOS inverter

SET has become the main concern of radiation effect researchers as technology scales down and increasing sensitivity of modern integrated circuits. Transient response induced by heavy‐ion, especially the impact of parasitic bipolar amplification in both the NMOS transistor and the CMOS inverter, is investigated in this paper. The bipolar effect of the bulk NMOS transistor has been studied through transient current measurements by using 3‐D simulation. The simulation of a 3‐D structure has confirmed the enhancement effect due to the bipolar‐like structure inherent to the NMOS transistor. With regard to the CMOS inverter, waveforms of transient voltage pulse are fully measured via 2‐D mixed‐mode simulation. In addition, the impact of LET on transient voltage pulse amplitude and width is analyzed; also, the effect of load capacitance on voltage pulse amplitude is discussed as well. The 2‐D mixed‐mode simulation results indicate that SET pulse amplitude increases with the value of LET due to enhancement of drift, while SET pulse width increases with the LET for the reason of more significant parasitic bipolar amplification effect. In addition, SET pulse amplitude increases monotonically with the load capacitance. This paper further investigates the bipolar amplification mechanism in bulk MOSFET and analyzes the variation of transient voltage pulse in different conditions in deep submicron device.

A PCA and Mahalanobis distance-based detection method for logical hardware Trojan: A PCA and Mahalanobis distance-based detection method for logical hardware Trojan

Due to wide application of FPGA devices, which are easy to be attacked by HTs, it has been risen up more concern on chip security. In order to ensure the efficiency of detection, side‐channel analysis is used to detect HTs. However, existing methods for HT detection cannot detect the LHTs with the small size, which takes up lower than 1% area of the whole chip, considering that signal of LHTs is drowned in process deviations. To complete the side‐channel analysis for LHT, we proposed an algorithm that combines PCA and Mahalanobis distance to improve the accuracy of LHTs detection. In addition, performed on FPGA of Xilinx, a sample of LHTs was designed and verified, which took up nearly 0.1% area of the whole chip. The influence of process deviation on the power consumption of FPGA was simulated by Hspice. A set of power‐frequency data of golden FPGA was generated by Matlab as panel data, which was considering the influence. Another two sets of FPGA with and without LHT were generated to test the accuracy of the proposed method. For LHT and golden FPGA, the detection accuracy of proposed method is 99% and 87%, respectively.

Study on degradation of propagation delay time and low-frequency noise of high-speed optocoupler

CTR (Current transfer ratio) is generally used to characterize the reliability parameters of optocoupler in engineering. However, high-speed optocoupler has a different structure from the common optocoupler, therefore its most important parameter should be propagation delay time. In addition, CTR serving as the macroscopic parameters, its changes can’t directly reflect microscopic changes of the internal defects in device. It is discovered that the number of microscopic defects in the device and the level of low-frequency noise shows a positive correlation. In terms of high-speed optocoupler, this paper proposed a method of combining propagation delay time and low-frequency noise to evaluate the storage reliability. The paper demonstrated how to design circuit to test these parameters and obtain their variations trajectory in accelerated degradation test. In this paper, 20 VO2630 devices were divided into four groups, and a accelerated test at 100°C, 125°C, 150°C and 175°C was conducted to monitor propagation delay time and other parameters related with low-frequency noise. These parameters had different degrees of degradation. This paper showed the degradation process of propagation delay time. It was found that the initial value of propagation delay time was nearly identical, but parameters related with low-frequency noise had different initial values. The larger the initial value of low frequency noise is, the faster propagation delay time will degrade. The main cause of degradation of propagation delay time is Schottky clamped transistor degradation. Finally, this paper discussed the advantages and disadvantages about utilizing conventional electrical parameters or low frequency noise to evaluate the reliability.

Error analysis and amelioration method of internal vapor analysis test for small hermetic devices

This paper is commissioned to find the mechanism which leads to badly consistency IVA test results and the defects in IVA test sequence for small devices (package volumes  0.03cc), thereby to improves the test method. Package materials and executing seal processes were studied to find the mechanism that leads to badly consistency IVA test result. And analysis of the test tolerance and the sensitive measure steps was presented. A way to solve problem of inlet pressure depression was to redesign the fixture tools for small hermetic devices. This redesign follows the principle to eliminate the vacuum cavity when applying a fixture too. Test result turns out stable and reliable in the later practical engineering after redesign, which proves that the amelioration of IVA test method is effective.