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Dive into the research topics where Jochen Bruckbauer is active.

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Featured researches published by Jochen Bruckbauer.


Advanced Materials | 2014

An Organic Down‐Converting Material for White‐Light Emission from Hybrid LEDs

Neil J. Findlay; Jochen Bruckbauer; Anto Regis Inigo; Benjamin Breig; Sasikumar Arumugam; David J. Wallis; R. W. Martin; Peter J. Skabara

A novel BODIPY-containing organic small molecule is synthesized and employed as a down-converting layer on a commercial blue light-emitting diode (LED). The resulting hybrid device demonstrates white-light emission under low-current operation, with color coordinates of (0.34, 0.31) and an efficacy of 13.6 lm/W; four times greater than the parent blue LED.


Applied Physics Letters | 2011

High resolution cathodoluminescence hyperspectral imaging of surface features in InGaN/GaN multiple quantum well structures

Jochen Bruckbauer; P. R. Edwards; T. Wang; R. W. Martin

InGaN/GaN multiple quantum wells (MQWs) have been studied by using cathodoluminescence hyperspectral imaging with high spatial resolution. Variations in peak emission energies and intensities across trenchlike features and V-pits on the surface of the MQWs are investigated. The MQW emission from the region inside trenchlike features is redshifted by approximately 45 meV and more intense than the surrounding planar regions of the sample, whereas emission from the V-pits is blueshifted by about 20 meV and relatively weaker. By employing this technique to the studied nanostructures it is possible to investigate energy and intensity shifts on a 10 nm length scale.


Microscopy and Microanalysis | 2012

High-resolution cathodoluminescence hyperspectral imaging of nitride nanostructures

P. R. Edwards; Lethy Krishnan Jagadamma; Jochen Bruckbauer; C. Liu; Philip A. Shields; Duncan W. E. Allsopp; T. Wang; R. W. Martin

Hyperspectral cathodoluminescence imaging provides spectrally and spatially resolved information on luminescent materials within a single dataset. Pushing the technique toward its ultimate nanoscale spatial limit, while at the same time spectrally dispersing the collected light before detection, increases the challenge of generating low-noise images. This article describes aspects of the instrumentation, and in particular data treatment methods, which address this problem. The methods are demonstrated by applying them to the analysis of nanoscale defect features and fabricated nanostructures in III-nitride-based materials.


Applied Physics Letters | 2013

Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope

G. Naresh-Kumar; C. Mauder; K. Wang; Simon Kraeusel; Jochen Bruckbauer; P. R. Edwards; Benjamin Hourahine; H. Kalisch; Andrei Vescan; C. Giesen; M. Heuken; A. Trampert; C. Trager-Cowan

Threading dislocations, stacking faults, and associated partial dislocations significantly degrade the optical and electrical properties of materials such as non-polar III-nitride semiconductor thin films. Stacking faults are generally difficult to detect and quantify with existing characterization techniques. We demonstrate the use of electron channeling contrast imaging in the scanning electron microscope to non-destructively reveal basal plane stacking faults terminated by partial dislocations in m-plane GaN and InGaN/GaN multiple quantum well structures grown on γ-LiAlO2 by metal organic vapor phase epitaxy.


Microscopy and Microanalysis | 2014

Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN

G. Naresh-Kumar; Jochen Bruckbauer; P. R. Edwards; Simon Kraeusel; B. Hourahine; R. W. Martin; M. J. Kappers; M. A. Moram; Stephen Lovelock; Rachel A. Oliver; Colin J. Humphreys; C. Trager-Cowan

We combine two scanning electron microscopy techniques to investigate the influence of dislocations on the light emission from nitride semiconductors. Combining electron channeling contrast imaging and cathodoluminescence imaging enables both the structural and luminescence properties of a sample to be investigated without structural damage to the sample. The electron channeling contrast image is very sensitive to distortions of the crystal lattice, resulting in individual threading dislocations appearing as spots with black-white contrast. Dislocations giving rise to nonradiative recombination are observed as black spots in the cathodoluminescence image. Comparison of the images from exactly the same micron-scale region of a sample demonstrates a one-to-one correlation between the presence of single threading dislocations and resolved dark spots in the cathodoluminescence image. In addition, we have also obtained an atomic force microscopy image from the same region of the sample, which confirms that both pure edge dislocations and those with a screw component (i.e., screw and mixed dislocations) act as nonradiative recombination centers for the Si-doped c-plane GaN thin film investigated.


Journal of Applied Physics | 2014

Influence of stress on optical transitions in GaN nanorods containing a single InGaN/GaN quantum disk

YiDing Zhuang; Jochen Bruckbauer; Philip A. Shields; P. R. Edwards; R. W. Martin; D. W. E. Allsopp

Cathodoluminescence (CL) hyperspectral imaging has been performed on GaN nanorods containing a single InGaN quantum disk (SQD) with controlled variations in excitation conditions. Two different nanorod diameters (200 and 280 nm) have been considered. Systematic changes in the CL spectra from the SQD were observed as the accelerating voltage of the electron beam and its position of incidence are varied. It is shown that the dominant optical transition in the SQD varies across the nanorod as a result of interplay between the contributions of the deformation potential and the quantum-confined Stark effect to the transition energy as consequence of radial variation in the pseudomorphic strain.


Nanotechnology | 2013

Probing light emission from quantum wells within a single nanorod

Jochen Bruckbauer; P. R. Edwards; J. Bai; T. Wang; R. W. Martin

Significant improvements in the efficiency of optoelectronic devices can result from the exploitation of nanostructures. These require optimal nanocharacterization techniques to fully understand and improve their performance. In this study we employ room temperature cathodoluminescence hyperspectral imaging to probe single GaN-based nanorods containing multiple quantum wells (MQWs) with a simultaneous combination of very high spatial and spectral resolution. We have investigated the strain state and carrier transport in the vicinity of the MQWs, demonstrating the high efficiencies resulting from reduced electric fields. Power-dependent photoluminescence spectroscopy of arrays of these nanorods confirms that their fabrication results in partial strain relaxation in the MQWs. Our technique allows us to interrogate the structures on a sufficiently small length scale to be able to extract the important information.


Journal of Materials Chemistry C | 2013

Linear oligofluorene-BODIPY structures for fluorescence applications

Neil J. Findlay; Clara Orofino-Pena; Jochen Bruckbauer; Saadeldin E. T. Elmasly; Sasikumar Arumugam; Anto Regis Inigo; Alexander L. Kanibolotsky; R. W. Martin; Peter J. Skabara

A family of linear oligofluorene-BODIPY structures, containing either a ter- or quaterfluorene unit, have been prepared, in which the attachment of the oligofluorene chain to the BODIPY unit is switched between the meso- and beta-positions. Each member of this family was investigated by UV-vis absorption and photoluminescence spectroscopy, cyclic voltammetry and thermal studies (TGA and DSC) to determine their suitability as emissive layers in hybrid luminescent devices. One candidate was then successfully deployed as a down converter to convert UV to visible light.


Applied Physics Letters | 2014

Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN

Gunnar Kusch; Haoning Li; P. R. Edwards; Jochen Bruckbauer; Thomas C. Sadler; P. J. Parbrook; R. W. Martin

The influence of substrate miscut on Al0.5Ga0.5 N layers was investigated using cathodoluminescence (CL) hyperspectral imaging and secondary electron imaging in an environmental scanning electron microscope. The samples were also characterized using atomic force microscopy and high resolution X-ray diffraction. It was found that small changes in substrate miscut have a strong influence on the morphology and luminescence properties of the AlGaN layers. Two different types are resolved. For low miscut angle, a crack-free morphology consisting of randomly sized domains is observed, between which there are notable shifts in the AlGaN near band edge emission energy. For high miscut angle, a morphology with step bunches and compositional inhomogeneities along the step bunches, evidenced by an additional CL peak along the step bunches, are observed.


Japanese Journal of Applied Physics | 2013

Optical properties of GaN nanorods containing a single or multiple InGaN quantum wells

Yi D. Zhuang; Szymon Lis; Jochen Bruckbauer; Simon E. J. O'Kane; Philip A. Shields; P. R. Edwards; J. Sarma; R. W. Martin; D. W. E. Allsopp

Measurements of light emission from GaN nanorods of diameter between 80 and 350 nm, containing either a three-well multiple InGaN quantum well or a single quantum well, have been performed by photoluminescence (PL) and cathodoluminescence (CL) hyperspectral imaging. The PL underwent a Stark shift to the blue as the nanorod diameter was reduced, indicating substantial relaxation of the compressive strain in the quantum wells. The intensity of the nanorod emission per unit area can exceed that of the planar starting material. The CL measurements revealed that the wavelength of the quantum well emission varied with radial position in the nanorod. Simulations by a modal expansion method revealed that the light extraction efficiency varies with radial position and the variation is dependent on nanorod diameter. Finite difference time domain simulations showed that Bloch mode formation in the buffer layer below the nanorods impacts on the light extraction.

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R. W. Martin

University of Strathclyde

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P. R. Edwards

University of Strathclyde

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C. Trager-Cowan

University of Strathclyde

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G. Naresh-Kumar

University of Strathclyde

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T. Wang

University of Sheffield

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L. Jiu

University of Sheffield

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B. Hourahine

University of Strathclyde

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Neil J. Findlay

University of Strathclyde

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J. Bai

University of Sheffield

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