Joel M. Murray
General Dynamics
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Publication
Featured researches published by Joel M. Murray.
Applied Optics | 2014
Joel M. Murray; Jean Wei; Jacob O. Barnes; Jonathan E. Slagle; Shekhar Guha
A simple technique is introduced for measuring the refractive index of plane-parallel samples having thickness of the order of a millimeter. The refractive index values are reported for six bulk semiconductors, each index measured at two infrared wavelengths using this method. The values are found to be within a few percent of those in literature for four semiconductors. The other two semiconductors were newly grown ternary alloys (CdMgTe and CdMnTe), for which the refractive index values have not been reported previously at the wavelengths studied here.
Proceedings of SPIE | 2008
Leonel P. Gonzalez; Joel M. Murray; Vincent M. Cowan; Shekhar Guha
Irradiance scan measurements of the nonlinear absorption and refraction coefficients of CdTe were performed at room temperature and at 77 K and compared to the values obtained in previous experiments using a different technique.
Proceedings of SPIE | 2010
Leonel P. Gonzalez; Joel M. Murray; Amelia Carpenter; Derek Upchurch; Jacob O. Barnes; Peter G. Schunemann; Kevin T. Zawilski; Shekhar Guha
μA 760 μm thick GaAs crystal was grown using HVPE. Transmission spectrum of this sample showed minimal absorption for light having photon energy below the bandgap energy, indicating the absence of the EL2 defects commonly found in Bridgman grown samples. Irradiance dependent absorption measured at 1.535 μm using 100 ns duration laser pulses showed increased nonlinear absorption in the HVPE grown GaAs compared to Bridgman grown samples. The dominant nonlinear absorption process in both samples was absorption due to free carriers generated by two-photon absorption. The HVPE grown sample showed higher nonlinear absorption due to longer carrier lifetimes.
Optical Materials Express | 2018
Jean Wei; Joel M. Murray; Frank Kenneth Hopkins; Douglas M. Krein; Kevin T. Zawilski; Peter G. Schunemann; Shekhar Guha
Ordinary and extraordinary refractive indices of CdSiP2 were measured and a Sellmeier equation was obtained for the first time to our knowledge over the temperature range 90 to 450 K. The index values were used to calculate the crystal temperature and phase-matching angle dependence of the generated wavelengths in the nonlinear frequency conversion of a range of pump wavelengths. A good match was obtained between the calculated values of the wavelengths and some experimental measurements.
conference on lasers and electro optics | 2013
Saima Husaini; Jonathan E. Slagle; Joel M. Murray; Shekhar Guha; Leonel P. Gonzalez; Robert Bedford
Nonlinear optical studies are carried out on graphene-based polymer composites in the nanosecond and picosecond temporal regime. These graphene-composites demonstrate saturable absorption followed by reverse saturable absorption which depends on graphene content and operation regime.
conference on lasers and electro optics | 2008
Joel M. Murray; Vincent M. Cowan; Leonel P. Gonzalez; Shekhar Guha
Values of the nonlinear absorption and nonlinear refraction coefficients of InP were measured at different temperatures using picosecond and nanosecond durations lasers operating at 1064 nm and 1570 nm.
Frontiers in Optics | 2007
Joel M. Murray; Vince Cowan; Leonel P. Gonzalez; Partha S. Dutta; Geeta Rajagopalan; Srinivasan Krishnamurthy; Z. G. Yu; Shekhar Guha
Nonlinear optical properties of novel ternary semiconductor crystals were determined at several wavelengths between 1 and 2 micrometers using a wavelength tunable, picosecond duration laser. Measured values were compared to theoretical calculations.
Journal of Electronic Materials | 2012
Jean Wei; Joel M. Murray; Jacob O. Barnes; Leonel P. Gonzalez; Shekhar Guha
Optical Materials Express | 2018
Jean Wei; Joel M. Murray; Jacob O. Barnes; Douglas M. Krein; Peter G. Schunemann; Shekhar Guha
Archive | 2018
Jean Wei; Joel M. Murray; Frank Kenneth Hopkins; Douglas M. Krein; Kevin T. Zawilski; Peter G. Schunemann; Shekhar Guha