Johannes van Ek
Seagate Technology
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Featured researches published by Johannes van Ek.
Archive | 2001
M. L. Plumer; Johannes van Ek; Dieter Weller
1 Introduction to Micromagnetic Recording Physics.- 2 Microstructure of Longitudinal Media.- 3 Magnetization Dynamics and Thermal Fluctuations in Fine Grains and Films.- 4 Measurement of Dynamic Properties in Thin-Films.- 5 Thermal Effects in High-Density Recording Media.- 6 Dynamic Effects in High-Density Recording Media.- 7 Patterned Media.- 8 Perpendicular Recording Media.- 9 Self-Assembled Magnetic Nanoparticle Arrays.- 10 Theory of Magnetotransport for Magnetic Recording.- 11 Recording Head Design.
Journal of Applied Physics | 1999
Sining Mao; Jim Giusti; Nurul Amin; Johannes van Ek; Ed Murdock
Giant magnetoresistance (GMR) responses were studied in micron-sized IrMn pinned spin valve stripes. As the stripe height is decreased both the pinning field and free layer bias field increase while the GMR ratio stays almost constant. The free layer coercivity becomes zero for the shortest stripe while the pinned layer coercivity drops slightly at high aspect ratio. The pinned layer switching field is enhanced in the patterned films, indicating a strong magnetostatic coupling between the free and pinned layer that was further simulated micromagnetically.
Journal of Applied Physics | 2002
Alexander M. Shukh; Johannes van Ek
The effect of magnetic anisotropy constants and inter-granular exchange coupling on properties of hcp CoCrX perpendicular media was studied by micromagnetic modeling. It was found that the second anisotropy constant K2 reduces the energy barrier, coercivity HC, saturation field HS and, as a result, promotes writeability of the media for fixed anisotropy field HK. HC inversely decreases with the increase of K2/K1 ratio. Exchange coupling modifies a domain structure of the media in a virgin state and slope of hysteresis loop by reducing the coercivity and saturation field, and marginally increasing the nucleation field. Magnetic domains were found even in the decoupled media. The minimal domain size is about 2.5⋅dG, where dG is an average grain size of the media. The domain size increases exponentially with the inter-granular exchange. The transition parameter and dc noise is reduced with increased exchange coupling. At a specific exchange coupling the dependence of the transition parameter on the exchange ...
Journal of Applied Physics | 2001
Sheryl Foss-Schroeder; Johannes van Ek; Dian Song; Darrell Louder; Ghanim Al-Jumaily; Pat J. Ryan; Craig Prater; Ed Hachfeld; Matt Wilson; Robert Tench
A scanning probe microscope which combines probe contacts for the supply of current with a magnetic force microscope (MFM) for fully automated imaging of electrically active, patterned sensor-like devices across a wafer was developed. This was used for magnetoresistive sensitivity mapping (MSM) of giant magnetoresistive sensors with different stabilization schemes. Multiple measurements of sensors showed that the MSM images were very repeatable. The complex image patterns varied significantly from sensor to sensor across a wafer. With MFM tips magnetized perpendicular to the ferromagnetic films in the sensor, MSM signals at the top and bottom of the sensor were significantly more intense than signals at the sensor interior. Results from micromagnetic calculations were found to be consistent with the experimental observations.
Archive | 2005
Song Sheng Xue; Mark T. Kief; Johannes van Ek; Nural Amin; Olle Gunner Heinonen; Kaizhong Gao; Patrick J. Ryan
Archive | 2002
M. L. Plumer; Nurul Amin; Vee S. Kong; Richard P. Michel; Johannes van Ek
Archive | 1998
Brenda A. Everitt; Johannes van Ek
Archive | 2004
Taras Pokhil; Nurul Amin; Steven Paul Bozeman; Steven Kalderon; Andrzej Stankiewicz; Ned Tabat; Pu-Ling Lu; Johannes van Ek; Janusz Nowak; Patrick J. Ryan
Archive | 2006
Nurul Amin; Johannes van Ek; Kaizhong Gao; Olle Gunner Heinonen; Mark T. Kief; Patrick J. Ryan; Song Sheng Xue; グンナー ヘイノネン オルレ; ガオ カイズォン; シェン シュエ ソン; アミン ヌラル; ジョゼフ ライアン パトリック; トマス キーフ マーク; ファン エク ヨハネス
Archive | 2002
M. L. Plumer; Nurul Amin; Vee S. Kong; Richard P. Michel; Johannes van Ek