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Dive into the research topics where John D. Gillaspy is active.

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Featured researches published by John D. Gillaspy.


Science | 1995

Microlithography by using neutral metastable atoms and self-assembled monolayers.

Karl K. Berggren; A Bard; James L. Wilbur; John D. Gillaspy; A G. Helg; Jabez J. McClelland; S L. Rolston; William Danial Phillips; Mara Prentiss; George M. Whitesides

Lithography can be performed with beams of neutral atoms in metastable excited states to pattern self-assembled monolayers (SAMs) of alkanethiolates on gold. An estimated exposure of a SAM of dodecanethiolate (DDT) to 15 to 20 metastable argon atoms per DDT molecule damaged the SAM sufficiently to allow penetration of an aqueous solution of ferricyanide to the surface of the gold. This solution etched the gold and transformed the patterns in the SAMs into structures of gold; these structures had edge resolution of less than 100 nanometers. Regions of SAMs as large as 2 square centimeters were patterned by exposure to a beam of metastable argon atoms. These observations suggest that this system may be useful in new forms of micro- and nanolithography.


Journal of Physics B | 2001

Highly charged ions

John D. Gillaspy

This paper reviews some of the fundamental properties of highly charged ions, the methods of producing them (with particular emphasis on table-top devices), and their use as a tool for both basic science and applied technology. Topics discussed include: charge dependence and scaling laws along isoelectronic or isonuclear sequences (for wavefunction size or Bohr radius, ionization energy, dipole transition energy, relativistic fine structure, hyperfine structure, Zeeman effect, Stark effect, line intensities, linewidths, strength of parity violation, etc), changes in angular momentum coupling schemes, selection rules, interactions with surfaces, electron-impact ionization, the electron beam ion trap (EBIT), ion accelerators, atomic reference data, cosmic chronometers, laboratory x-ray astrophysics, vacuum polarization, solar flares, ion implantation, ion lithography, ion microprobes (SIMS and x-ray microscope), nuclear fusion diagnostics, nanotechnology, quantum computing, cancer therapy and biotechnology.


Journal of Physics B | 2008

EUV spectra of highly-charged ions W54+?W63+ relevant to ITER diagnostics

Yu. Ralchenko; Ilija Draganic; Joseph N. Tan; John D. Gillaspy; Joshua M. Pomeroy; Joseph Reader; U. Feldman; Glenn E. Holland

We report the first measurements and detailed analysis of extreme ultraviolet (EUV) spectra (4–20 nm) of highly-charged tungsten ions W54+ to W63+ obtained with an electron beam ion trap (EBIT). Collisional-radiative modelling is used to identify strong electric-dipole and magnetic-dipole transitions in all ionization stages. These lines can be used for impurity transport studies and temperature diagnostics in fusion reactors, such as ITER. Identifications of prominent lines from several W ions are confirmed by the measurement of isoelectronic EUV spectra of Hf, Ta and Au. We also discuss the importance of charge-exchange recombination for the correct description of ionization balance in the EBIT plasma.


Journal of Physics B | 2007

Spectra of W39+–W47+ in the 12–20 nm region observed with an EBIT light source

Yuri Ralchenko; Joseph Reader; Joshua M. Pomeroy; Joseph N. Tan; John D. Gillaspy

We observed spectra of highly ionized tungsten in the extreme ultraviolet with an electron beam ion trap (EBIT) and a grazing-incidence spectrometer at the National Institute of Standards and Technology. Stages of ionization were distinguished by varying the energy of the electron beam between 2.1 keV and 4.3 keV and correlating the energies with spectral line emergence. The spectra were calibrated by reference lines of highly ionized iron produced in the EBIT. Identification of the observed lines was aided by collisional-radiative modelling of the EBIT plasma. Good quantitative agreement was obtained between the modelling results and the experimental observations. Our line identifications complement recent results for W40+–W45+ observed in a tokamak plasma by Putterich et al (2005 J. Phys. B: At. Mol. Opt. Phys. 38 3071). For most lines we agree with their assignment of ionization stage. Additionally, we present new identifications for some allowed and forbidden lines of W39+, W44+, W46+ and W47+. The uncertainties of our wavelengths range from 0.002 nm to 0.010 nm.


The Astrophysical Journal | 2000

Emission-Line Intensity Ratios in Fe XVII Observed with a Microcalorimeter on an Electron Beam Ion Trap

J. M. Laming; I Kink; Endre Takacs; J. V. Porto; John D. Gillaspy; Eric H. Silver; Herbert W. Schnopper; Simon R. Bandler; Nancy S. Brickhouse; S. S. Murray; Marco Barbera; A. K. Bhatia; G. A. Doschek; N. Madden; D. Landis; Jeffrey W. Beeman; E. E. Haller

We report new observations of emission line intensity ratios of Fe XVII under controlled experimental conditions, using the National Institute of Standards and Technology electron beam ion trap (EBIT) with a microcalorimeter detector. We compare our observations with collisional-radiative models using atomic data computed in distorted wave and R-matrix approximations, which follow the transfer of the polarization of level populations through radiative cascades. Our results for the intensity ratio of the 2p6 1S0-2p53d 1P1 15.014 A line to the 2p6 1S0-2p53d 3D1 15.265 A line are 2.94 ± 0.18 and 2.50 ± 0.13 at beam energies of 900 and 1250 eV, respectively. These results are not consistent with collisional-radiative models and support conclusions from earlier EBIT work at the Lawrence Livermore National Laboratory that the degree of resonance scattering in the solar 15.014 A line has been overestimated in previous analyses. Further observations assess the intensity ratio of the three lines between the 2p6-2p53s configurations to the three lines between the 2p6-2p53d configurations. Both R-matrix and distorted wave approximations agree with each other and our experimental results much better than most solar and stellar observations, suggesting that other processes not present in our experiment must play a role in forming the Fe XVII spectrum in solar and astrophysical plasmas.


Physical Review A | 2011

Spectroscopy of diagnostically-important magnetic-dipole lines in highly-charged 3d n ions of tungsten

Yu. Ralchenko; Ilija Draganic; D. Osin; John D. Gillaspy; Joseph Reader

An electron beam ion trap (EBIT) is used to measure extreme ultraviolet spectra between 10 nm and 25 nm from highly-charged ions of tungsten with an open 3d shell (W XLVIII through W LVI). We found that almost all strong lines are due to the forbidden magnetic-dipole (M1) transitions within 3d n ground configurations. A total of 37 spectral lines are identified for the first time using detailed collisional-radiative (CR) modeling of the EBIT spectra. A new level-merging scheme for compactification of rate equations is described. The CR simulations for Maxwellian plasmas show that several line ratios involving these M1 lines can be used to reliably diagnose temperature and density in hot fusion devices.


Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 1998

Non-kinetic Damage on Insulating Materials by Highly Charged Ion Bombardment

D C. Parks; Martin P. Stockli; E W. Bell; L P. Ratliff; Robert W. Schmieder; F. G. Serpa; John D. Gillaspy

Abstract We have measured the damage caused by the impact of low velocity, highly charged ions on insulating surfaces. Atomic force microscopy allows us to observe directly the surface topography with nanometer resolution. Using constant velocity (100 keV) Xe q + ions (25 ⩽ q ⩽ 50) impinging on mica, we observe damage caused by single ion impacts. Impact sites typically are circular hillocks. Within the range and accuracy of the data, the height and volume of the damaged regions are well approximated by a linear function of ion potential energy.


Journal of Vacuum Science & Technology B | 1997

Self-assembled monolayers exposed by metastable argon and metastable helium for neutral atom lithography and atomic beam imaging

Allen J. Bard; Karl K. Berggren; James L. Wilbur; John D. Gillaspy; S L. Rolston; Jabez J. McClelland; William D. Phillips; Mara Prentiss; George M. Whitesides

We used a beam of noble gas atoms in a metastable excited state to expose a thin (1.5 nm) self-assembled monolayer resist applied over a gold-coated silicon wafer. We determined exposure damage as a function of dose of metastable atoms by processing the samples in a wet-chemical etch to remove the gold from unprotected regions and then measuring the reflectivity with a laser and observing the microstructure with an atomic force microscope. We found that the minimum dose required to damage the resist substantially was 1.7(3)×1015 atoms/cm2 for metastable helium, and 25(7)×1015 atoms/cm2 for metastable argon.


The Astrophysical Journal | 2000

Laboratory Astrophysics Survey of Key X-Ray Diagnostic Lines Using A Microcalorimeter on an Electron Beam Ion Trap

Eric H. Silver; Herbert W. Schnopper; Simon R. Bandler; Nancy S. Brickhouse; S. S. Murray; Marco Barbera; Endre Takacs; John D. Gillaspy; J. V. Porto; I Kink; J. M. Laming; N. Madden; D. Landis; Jeffrey W. Beeman; E. E. Haller

Cosmic plasma conditions created in an electron beam ion trap (EBIT) make it possible to simulate the dependencies of key diagnostic X-ray lines on density, temperature, and excitation conditions that exist in astrophysical sources. We used a microcalorimeter for such laboratory astrophysics studies because it has a resolving power ≈1000, quantum efficiency approaching 100%, and a bandwidth that spans the X-ray energies from 0.2 keV to 10 keV. Our microcalorimeter, coupled with an X-ray optic to increase the effective solid angle, provides a significant new capability for laboratory astrophysics measurements. Broadband spectra obtained from the National Institute of Standards and Technology EBIT with an energy resolution approaching that of a Bragg crystal spectrometer are presented for nitrogen, oxygen, neon, argon, and krypton in various stages of ionization. We have compared the measured line intensities to theoretical predictions for an EBIT plasma.


Journal of Vacuum Science & Technology B | 1998

Masked Ion Beam Lithography with Highly Charged Ions

John D. Gillaspy; D C. Parks; L P. Ratliff

Masked ion beam lithography using highly charged ions is demonstrated for the first time by producing an array of hundreds of ordered micrometer wide dots using Xe44+ on poly(methylmethacrylate) resist. At low dose, exposure of the resist is incomplete and isolated single-ion impact sites can be seen within the exposed areas. Atomic force microscope images of the single-ion impact sites show craters with a width of 24 nm. At high dose, the exposure is complete and the dot morphology is consistent with limitations from the mask. Scanning electron microscope images indicate that the sidewall slope is steeper than four.

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Joseph N. Tan

National Institute of Standards and Technology

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Joshua M. Pomeroy

National Institute of Standards and Technology

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E Takacs

University of Debrecen

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Joseph Reader

National Institute of Standards and Technology

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L P. Ratliff

National Institute of Standards and Technology

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Yuri Ralchenko

National Institute of Standards and Technology

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Eric H. Silver

Smithsonian Astrophysical Observatory

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J. M. Laming

United States Naval Research Laboratory

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J. V. Porto

National Institute of Standards and Technology

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