John Michael Nicholson
Ford Motor Company
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Featured researches published by John Michael Nicholson.
SAE transactions | 2004
P.-C. Lin; S.-H. Lin; Jwo Pan; Tsung-Yu Pan; John Michael Nicholson; M. A. Garman
Microstructures and failure mechanisms of spot friction welds in aluminum 6111-T4 lap-shear specimens are investigated based on experimental observations. Two types of tools, a Type I tool with a flat tool shoulder and a Type II tool with a concave tool shoulder, were used to join the aluminum sheets with different processing parameters. Optical micrographs of the cross sections of spot friction welds made by the two types of tools in lap-shear specimens before and after failure are examined. These spot friction welds show the failure mode of nugget pullout under lap-shear loading conditions. However, the micrographs show different microstructures and failure mechanisms for spot friction welds made by the two types of tools with different processing parameters. The experimental observations suggest that under lap-shear loading conditions, the failure is initiated near the stir zone in the middle part of the nugget and the failure propagates along the circumference of the nugget to final fracture.
Journal of Electronic Packaging | 1994
Tsung-Yu Pan; Ronald R. Cooper; Howard Douglas Blair; Thomas J. Whalen; John Michael Nicholson
Long-term reliability of electronic packaging has become a greater challenge as a result of ever increasing power requirements and the decreasing size of electronic packages. In this study, the effects of three variables on plated-through hole (PTH) design have been investigated on the thermal cycling fatigue lives in four-layered printed wiring boards (PWB’s). These three variables were evaluated at two levels each: (a) hole size (0.030 and 0.040 in.), (b) internal pad (presence or absence), and (c) epoxy-plugged holes (plugged or unplugged). The electrical resistance was measured on 40 test boards with 23 design of 8 daisy-chain PTH nets each. Full factorial analysis and analysis of variance indicate that all three factors had significant influence on PTH fatigue life, but no two-factor or three-factor interactions were found. Metallurgical analysis reveals that the failure mechanism is barrel cracking near the internal pad. This mechanism has been illustrated by a finite element analysis in this study and correlated by a SEM stereoimaging analysis in the literature. The increase of electrical resistance with thermal cycles correlates well with an analytical barrel crack model. The crack length in each net at specific cycles is calculated, but fails to match predictions from a fracture mechanics model.
Archive | 1976
Andre Ezis; John Michael Nicholson
Archive | 1998
Howard Douglas Blair; John Michael Nicholson; Tsung-Yu Pan
Journal of Electronic Materials | 2002
William J. Boettinger; Carol A. Handwerker; B Newbury; Tsung-Yu Pan; John Michael Nicholson
Archive | 1976
Andre Ezis; John Michael Nicholson
Archive | 2001
Richard L. Allor; David Robert Collins; John Michael Nicholson; Grigoriy Grinberg
Archive | 1991
Gary M. Crosbie; Ronald L. Predmesky; John Michael Nicholson
Archive | 1995
Gary M. Crosbie; Ronald L. Predmesky; John Michael Nicholson
Archive | 2002
Allen Dennis Roche; John Michael Nicholson; Richard L. Allor; Samir Samir