John Rivière
University of Oxford
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Featured researches published by John Rivière.
Archive | 2009
John Rivière; Sverre Myhra
Introduction, J. C. Riviere and S. Myhra Problem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. Riviere Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. Hoflund Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. Rading Surface and Interface Analysis by Scanning Probe Microscopy, S. Myhra Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments J. M. Titchmarsh Synchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. Prince Quantifi cation of Surface and Near-Surface Composition by AES and XPS, S. Tougaard Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. Titchmarsh In-Depth Analysis/Profiling, F. Reniers and C. R. Tewell Characterization of Nanostructured Materials, M. Werner, A. Crossley, and C. Johnston Problem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. Martin Problem-Solving Methods in Surface Analysis Metallurgy, R. K. Wild Composites, P. M. A. Sherwood Minerals, Ceramics, and Glasses, R. St. C. Smart and Z. Zhang Catalyst Characterization, W. E. S. Unger and T. Gross Surface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. Griesser Adhesion Science and Technology, J. F. Watts Electron Spectroscopy in Corrosion Science, J. E. Castle
European Physical Journal B | 1988
Sverre Myhra; John Rivière; A M Stewart; Peter Conrad Healy
X-ray photoelectron spectroscopy has been carried out on HoBa2Cu3O7-x (on abraded, fractured and ion beam reduced surfaces). These measurements show that there are only minor differences with similarly obtained results from YBa2Cu3O7-x. The spectral features of the Ln species (Y and Ho), the O 1s, and Ba 3d envelopes are considered in some detail. The low energy contribution to the O 1s envelope has been assigned in part to the effects of Ba−O bonding, either in the LnBa2Cu3O7-x material, or in BaO in minor phase regions, and in part to the effects of the electronic linkage of the Cu planes in the superconducting compound. The anomalous low binding energy contributions to the Ba 3d envelope are also specific to the electronic structure of these materials. It is likely that Ba (and Sr and Ca for the Bi-Sr-Ca-C-O system) plays an important electronic, as well as structural role, in promoting high temperature superconductivity.
Philosophical Magazine Letters | 1988
Peter Conrad Healy; Sverre Myhra; John Rivière; A M Stewart; J. G. Thompson
Abstract Observations by X-ray photoelectron spectroscopy on LnBa2Cu3O7−x (Ln = Y and Ho) show that there are no significant surface electronic differences as a result of substitution of Y by Ho. The O 1s and Ba 3d envelopes exhibit fine structure which appears to be related to significant electronic and structural properties of the 1–2–3 compounds. Namely, the low-binding-energy component of the O 1s envelope is due to Ba─o bonding as well as being specific to the electronic linkage of the Cu layers in the orthorhombic structure. The anomalous low-binding-energy contribution to the Ba 3d envelope suggests that Ba may play an important electronic role as well as a structural role. There is further evidence that Sr and Ca play similar roles in the related Bi─Sr─Ca─Cu─O high-T c compounds.
Materials Chemistry and Physics | 1990
Sverre Myhra; Peter Conrad Healy; C.F. Jones; H.E. Bishop; P. Marriott; John Rivière; A M Stewart
Abstract The fracture faces of Cl-doped YBa 2 Cu 3 O 7−x have been investigated by XPS and AES. It has been found that Cl will segregate to grain boundaries and free surfaces. There is little, if any, evidence for the direct substitution of Cl into O sites. However, the doping with Cl will promote both the formation of non-superconducting phases and the deleterious effects of weak links.
American Mineralogist | 1984
Sverre Myhra; David Savage; Alan Atkinson; John Rivière
Archive | 2012
Sverre Myhra; John Rivière
American Mineralogist | 1988
Sverre Myhra; Timothy John White; Sue E. Kesson; John Rivière
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition | 2011
Henning Bubert; John Rivière; Wolfgang Werner
Archive | 2012
Sverre Myhra; John Rivière
Archive | 2012
Sverre Myhra; John Rivière