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Jonathan D. Reid

IBM

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Publication

Featured researches published by Jonathan D. Reid.

Archive | 1986

Structure of the Double Layer and Rates of Ion Crossings at “Single” Immiscible Liquid/Liquid (L/L) Interfaces

Jonathan D. Reid; Owen R. Melroy; William E. Bronner; Harold C. Hughes; Petr Vanysek; Richard P. Buck

Separation of bulk and interfacial kinetic properties for two-interface, ion-transmitting, ion-exchanging membrane systems is not theoretically possible in all situations.

Archive | 1999

Method of electroplating semiconductor wafer using variable currents and mass transfer to obtain uniform plated layer

Jonathan D. Reid; Robert J. Contolini; Edward C. Opocensky; Evan E. Patton; Eliot K. Broadbent

Archive | 1997

Method and apparatus for treating surface including virtual anode

Jonathan D. Reid; Steve Taatjes

Archive | 1997

Electroplating anode including membrane partition system and method of preventing passivation of same

Jonathan D. Reid; Robert J. Contolini; John O. Dukovic

Archive | 2001

Electroplating process for avoiding defects in metal features of integrated circuit devices

Jonathan D. Reid; David Charles Smith; Steven T. Mayer; Jon Henri; Sesha Varadarajan

Archive | 1998

Electric potential shaping apparatus for holding a semiconductor wafer during electroplating

Robert J. Contolini; Jonathan D. Reid; Evan E. Patton; Jingbin Feng; Steve Taatjes; John O. Dukovic

Archive | 1997

Electric potential shaping method for electroplating

Robert J. Contolini; Jonathan D. Reid; Evan E. Patton; Jingbin Feng; Steve Taatjes; John O. Dukovic

Archive | 2000

Copper electroplating apparatus

Steven T. Mayer; Evan E. Patton; Robert L. Jackson; Jonathan D. Reid

Archive | 1998

Electroplating chamber with rotatable wafer holder and pre-wetting and rinsing capability

Jonathan D. Reid; Steven W. Taatjes; Robert J. Contolini; Evan E. Patton

Archive | 1992

Method for fabricating metal core layers for a multi-layer circuit board

John M. Brauer; Frederick R. Christie; William Howell Lawrence; Ashit Mehta; Jonathan D. Reid; William J. Summa

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Collaboration

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Steven T. Mayer

Lawrence Livermore National Laboratory

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Evan E. Patton

IBM

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Robert J. Contolini

IBM

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Seshasayee Varadarajan

Lam Research

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John O. Dukovic

IBM

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James R. Loomis

IBM

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Thomas A. Ponnuswamy

Lam Research

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Tighe A. Spurlin

Lam Research

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Steve Taatjes

IBM

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Arthur Gordon Starks

IBM

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