Joon-kyu Seo
Samsung
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Publication
Featured researches published by Joon-kyu Seo.
international integrated reliability workshop | 2004
Kwang-Jin Lee; Joon-kyu Seo; J.W. Jung; G.J. Jung; Jusuk Lee; Sangpill Hwang; C.K. Yoon
In this report, the phenomenon of standby state current failure of dynamic random access memory (DRAM), which incorporates a low voltage to high voltage CMOS level-up shifter, was investigated. As a result, DRAM standby current failure due to on/off time delay of the level shifter circuit has been identified as being responsible for n-MOSFET ON-state current decrease by hot carrier injection (HCI).
Archive | 2012
Joon-kyu Seo; Kyung-A Kang; Ji-yeon Kwak; Hyun-Jin Kim; Hyun-jung Song; Sung-Sik Yoo; Ju-Youn Lee; Dong-Seok Ryu; Min-Kyu Park
Archive | 2013
Joon-kyu Seo; Hyun-Jin Kim; Nipun Kumar; Yong-Yeon Lee; Chang-Soo Lee
Archive | 2013
Ji-yeon Kwak; Kyung-A Kang; Joon-kyu Seo; Sang-keun Jung; Geun-Ho Lee
Archive | 2013
Joon-kyu Seo; Young-joon Choi; Ji-yeon Kwak; Hyun-Jin Kim; Yeo-Jun Yoon
Archive | 2011
Joon-kyu Seo
Archive | 2013
Joon-kyu Seo; Jung-joo Sohn; Hyun-Jin Kim; Geun-Ho Lee
Archive | 2012
Joon-kyu Seo; Kyung-A Kang; Ji-yeon Kwak; Ju-Youn Lee
Archive | 2011
Joon-kyu Seo; Hyun-Jin Kim; Ji-yeon Kwak; Jin Ra
Archive | 2013
Il-kook Yun; Joon-kyu Seo; Chang-Soo Lee
