Joseph Abel
Utah State University
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Publication
Featured researches published by Joseph Abel.
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena | 2012
Joseph Abel; Akitomo Matsubayashi; J. J. Garramone; V. P. LaBella
The temperature dependence of the spin lifetime and spin diffusion coefficient of exfoliated multilayer graphene is measured using nonlocal spin detection and spin precession measurements. Low impedance cobalt contacts are utilized for spin injection and readout. A decrease in spin lifetime with increasing temperature is observed as well as an increase in the spin diffusion coefficient with increasing temperature. This observation provides some insight into the relevant spin relaxation mechanisms that are occurring in this trilayer graphene sample.
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena | 2012
Joseph Abel; Akitomo Matsubayashi; Thomas Murray; Christos D. Dimitrakopoulos; Damon B. Farmer; Ali Afzali; Alfred Grill; Chun-Yung Sung; V. P. LaBella
Nonlocal Hanle spin precession devices are fabricated on wafer scale epitaxial graphene utilizing conventional and scalable processing methods. To improve spin injection and reduce contact related spin relaxation, hafnium oxide is utilized as an interface barrier between the graphene on SiC(0001) and ferromagnetic metal contacts. The hafnium oxide layer is deposited by atomic layer deposition utilizing an organic seed layer. Spin precession is observed in the epitaxial graphene.
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena | 2012
Ilona Sitnitsky; J. J. Garramone; Joseph Abel; P. Xu; S. D. Barber; Matt L. Ackerman; J. Kevin Schoelz; P. M. Thibado; V. P. LaBella
Ballistic electron emission microscopy (BEEM) was performed to obtain current versus bias characteristics of nonepitaxial nanometer-thick Au on p-type GaAs in order to accurately measure the local Schottky barrier height. Hole injection BEEM data were averaged from thousands of spectra for various Au film thicknesses and then used to determine the attenuation length of the energetic charge carriers as a function of tip bias. The authors report an increase in attenuation length at biases near the Schottky barrier, providing evidence for the existence of coherent BEEM currents in Schottky diodes. These results provide additional evidence for the conservation of the parallel momentum of charge carriers at the metal–semiconductor interface.
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena | 2012
Joseph Abel; Akitomo Matsubayashi; V. P. LaBella
A custom sample holder is integrated into a commercially available cryostat that allows for mounting of the sample perpendicular to the standard mounting position. This is enables measurements to be performed with a magnetic field oriented in the plane of the sample, expanding the capabilities of the instrument. A cobalt/aluminum oxide/cobalt spin valve is utilized to demonstrate the functionality of the sample holder.
Journal of Crystal Growth | 2008
Joseph Abel; Dong Jun Kim; E. Addison Everett; Haeyeon Yang
Bulletin of the American Physical Society | 2013
Akitomo Matsubayashi; Joseph Abel; Dhiraj Prasad Sinha; Ji Ung Lee; V. P. LaBella
Bulletin of the American Physical Society | 2012
Joseph Abel; Akitomo Matsubayashi; Christos D. Dimitrakopoulos; Damon B. Farmer; Ali Afzali; Alfred Grill; Chun-Yung Sung; V. P. LaBella
Bulletin of the American Physical Society | 2012
Akitomo Matsubayashi; Joseph Abel; Dhiraj Prasad Sinha; Ji Ung Lee; V. P. LaBella
Bulletin of the American Physical Society | 2011
J. J. Garramone; Joseph Abel; V. P. LaBella
Bulletin of the American Physical Society | 2011
Joseph Abel; Akitomo Matsubayashi; J. J. Garramone; Christos D. Dimitrakopoulos; Alfred Grill; C.Y. Sung; V. P. LaBella