Judson Sloan Marte
General Electric
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Judson Sloan Marte.
International Congress on Applications of Lasers & Electro-Optics | 2004
Wenwu Zhang; Judson Sloan Marte; David Peter Mika; Michael Evans Graham; Brian Harlow Farrell; Marshall Gordon Jones
Laser forming is currently a laboratory technique that is beginning to see industrial applications. In this paper, we discuss practical concerns and review the progress of laser forming at GE Global Research. Two applications, 3D shape tuning and precision tube bending, are presented. Topics include considerations for industrial applications, methods for qualifying a process window, materials characterization, path planning, and system integration.Laser forming is currently a laboratory technique that is beginning to see industrial applications. In this paper, we discuss practical concerns and review the progress of laser forming at GE Global Research. Two applications, 3D shape tuning and precision tube bending, are presented. Topics include considerations for industrial applications, methods for qualifying a process window, materials characterization, path planning, and system integration.
Microscopy and Microanalysis | 2009
Andrew Deal; R Bhat; Richard DiDomizio; Judson Sloan Marte; Pazhayannur Ramanathan Subramanian
Ultrafine grained (UFG) alloys, those with grain sizes significantly below 1 micron, are of general interest from both a property and processing standpoint. Improved mechanical properties have been reported, and many materials are under investigation [1,2]. The nanoscale nature of these materials, however, provides a significant number of characterization challenges. Here we discuss the use of Electron Backscatter Diffraction (EBSD) to characterize the grain size of ultrafine grained Ti-6Al-4V (UFG Ti64). UFG Ti64 was produced by near-isothermal Multi-axis Forging (MAF) [3]. Samples of this material were heat treated to study the static coarsening of the alpha phase, and hot compression tests were performed on UFG Ti64specimens to examine dynamic coarsening behavior. After heat treatment or compression, samples were metallographically prepared in conductive 1.25 inch mounts according to a modified version of a published technique [4]. To understand the coarsening kinetics, it was essential to quantify the average alpha grain size of the material. A high spatial resolution and ability to examine large areas for statistical purposes were critical requirements for this task, making a FEG-SEM with EBSD the instrumentation of choice. Since large EBSD measurements are on the order of hours, even with modern camera speeds, maintaining mechanical and thermal stability of the SEM was critical. Accordingly, the FEGSEM used for UFG grain size measurements was enclosed to isolate it from thermal oscillations inherent to HVAC systems. A chiller with precise PID temperature control was installed to keep the lens cooling stable. These modifications helped keep the short-term temperature fluctuations below 0.5C. To minimize long term mechanical or thermal drift, the sample was positioned for analysis under appropriate beam conditions and then rested for a minimum of 3 hours prior to the EBSD measurements. Long term temperature drift was typically less than 1C. Figure 1 shows the band contrast for a small region of tested UFG Ti64 material. Small maps such as these were used to examine the resolution of the EBSD measurements and get a sense of the grain size. Reasonable grain size statistics, however, were accumulated through EBSD line scans along the tilt axis. For each measurement, the step size within each line was 20nm, and lines were spaced between 1 and 50 microns apart. Scan times were on the order of 14 hours. Initial results of the static coarsening experiments are shown in Figure 2, compared with conventional Ti64 material analyzed optically. The EBSD measurements show that the alpha grain size of the UFG Ti64 is reasonably stable with respect to static coarsening at 650C. It remained submicron after an hour and remained below 3 microns after 77 hours.
Archive | 2004
Pazhayannur Ramanathan Subramanian; Reed Roeder Corderman; Sundar Amancherla; Ramkumar Kashyap Oruganti; Thomas M. Angeliu; Shyh-Chin Huang; Suchismita Sanyal; Dheepa Srinivasan; Krishnamurthy Anand; Michael Larsen; Judson Sloan Marte; Dennis Michael Gray
Investigations on nanostructured metallic systems have shown that exceptional property enhancements are potentially achievable through structural refinement to the nano-scale. While dramatic property improvements have been reported on these materials in the past, significant technical challenges exist in processing, as well as in retention of microstructural stability and useful properties at elevated temperatures. This presentation will summarize the key challenges in developing nanostructured metallic systems, and highlight our progress and selected successes in the understanding of structure-property relationships in bulk nanostructures as well as nanostructured multilayered systems. Work in nanoparticle dispersion-strengthened metallic systems will also be highlighted in this presentation.
Archive | 2003
Pazhayannur Ramanathan Subramanian; Thomas M. Angeliu; Reed Roeder Corderman; Shyh-chin Huang; Judson Sloan Marte; Dennis Michael Gray; Krishnamurthy Anand; Dheepa Srinivasan; Ramkumar Kashyap Oruganti; Sundar Amancherla
Archive | 2003
Melvin Robert Jackson; Bernard Patrick Bewlay; Judson Sloan Marte; Pazhayannur Ramanathan Subramanian; Ji-Cheng Zhao
Materials Science and Engineering A-structural Materials Properties Microstructure and Processing | 2005
Ramkumar Kashyap Oruganti; Pazhayannur Ramanathan Subramanian; Judson Sloan Marte; Michael Francis Xavier Gigliotti; Sundar Amancherla
Archive | 2001
Ralph James Carl; Gerald Burt Kliman; Juliana Chiang Shei; Mark Gilbert Benz; Judson Sloan Marte
Archive | 2007
Judson Sloan Marte; Xianrui Huang; Evangelos Trifon Laskaris; Bruce Alan Knudsen; Thomas Robert Raber; Robert John Zabala; James William Bray; Paul Shadforth Thompson; Sergio Paulo Martins Loureiro; Curtis Alan Johnson; Sylvia Marie Decarr
Archive | 2003
Thomas Robert Raber; Judson Sloan Marte; Evangelos Trifon Laskaris; Sergio Paulo Martins Loureiro; Robert John Zabala; Bruce Alan Knudsen; Kathleen Amm; Bruce Campbell Amm; James William Bray
Archive | 2005
David Thomas Ryan; James B. Ryan; Evangelos Trifon Laskaris; Kathleen Melanie Amm; Bruce Alan Knudsen; Judson Sloan Marte; Thomas Robert Raber; Robert John Zabala; James William Bray; Bruce Campbell Amm; Sergio Paulo Martins Loureiro