Junyue Wang

TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy

A suite of GUI programs written in MATLAB for advanced data collection and analysis of full-field transmission X-ray microscopy data including mosaic imaging, tomography and XANES imaging is presented.

Computed tomography algorithm based on diffraction-enhanced imaging setup

Recently taking advantage of the novel diffraction-enhanced imaging (DEI) method, one very effective and practical phase contrast imaging technique—a new x-ray computed tomography scheme based on DEI (DEI-CT) showed promising results, really superior to those of conventional CT imaging. In this letter, we show that the application of the conventional CT reconstruction algorithm is not always satisfactory for the new DEI-CT imaging and a new mathematical framework for imaging reconstruction is presented. Experimental data collected at the Beijing synchrotron radiation facility are also discussed using the new algorithm.

Direct computed tomographic reconstruction for directional-derivative projections of computed tomography of diffraction enhanced imaging

X-ray diffraction enhanced imaging based on synchrotron radiation has extremely high sensitivity of weakly absorbing low-Z samples in medical and biological fields. This letter is dedicated to a direct reconstruction algorithm for directional-derivative projections of computed tomography of diffraction enhanced imaging. It is a “one-step” algorithm and does not require any restoration processing compared with the current “two-step” methods. The actual values of the sample’s refractive index decrement can be estimated from its reconstruction images directly. The algorithm is proven by the actual experiment at the Beijing Synchrotron Radiation Facility and the reconstructed images are described finally.

3D elemental sensitive imaging using transmission X-ray microscopy.

Determination of the heterogeneous distribution of metals in alloy/battery/catalyst and biological materials is critical to fully characterize and/or evaluate the functionality of the materials. Using synchrotron-based transmission x-ray microscopy (TXM), it is now feasible to perform nanoscale-resolution imaging over a wide X-ray energy range covering the absorption edges of many elements; combining elemental sensitive imaging with determination of sample morphology. We present an efficient and reliable methodology to perform 3D elemental sensitive imaging with excellent sample penetration (tens of microns) using hard X-ray TXM. A sample of an Al–Si piston alloy is used to demonstrate the capability of the proposed method.

A new iterative algorithm to reconstruct the refractive index

The latest developments in x-ray imaging are associated with techniques based on the phase contrast. However, the image reconstruction procedures demand significant improvements of the traditional methods, and/or new algorithms have to be introduced to take advantage of the high contrast and sensitivity of the new experimental techniques. In this letter, an improved iterative reconstruction algorithm based on the maximum likelihood expectation maximization technique is presented and discussed in order to reconstruct the distribution of the refractive index from data collected by an analyzer-based imaging setup. The technique considered probes the partial derivative of the refractive index with respect to an axis lying in the meridional plane and perpendicular to the propagation direction. Computer simulations confirm the reliability of the proposed algorithm. In addition, the comparison between an analytical reconstruction algorithm and the iterative method has been also discussed together with the convergent characteristic of this latter algorithm. Finally, we will show how the proposed algorithm may be applied to reconstruct the distribution of the refractive index of an epoxy cylinder containing small air bubbles of about 300 micro of diameter.

Application of synchrotron radiation to TXRF analysis of metal contamination on silicon wafer surfaces

Synchrotron Radiation based Total Reflection X-ray Fluorescence (TXRF) has been shown to meet the critical needs of the semiconductor industry for the analysis of transition metal impurities on silicon wafer surfaces. The current best detection limit achieved at the Stanford Synchrotron Radiation Laboratory (SSRL) for Ni is 8 x 10 7 atoms/cm 2 which is a factor of 50 better than what can be achieved using laboratory based sources. SSRL has established a TXRF facility which meets the cleanliness and stability requirements of the semiconductor industry. This has enabled both industrial and academic researchers to address industrially relevant problems. In addition research is being carried out for the analysis of light elements such as Al and Na.

Phase retrieval using polychromatic illumination for transmission X-ray microscopy.

An alternative method for quantitative phase retrieval in a transmission X-ray microscope system at sub-50-nm resolution is presented. As an alternative to moving the sample in the beam direction in order to analyze the propagation-introduced phase effect, we have illuminated the TXM using X-rays of different energy without any motor movement in the TXM system. Both theoretical analysis and experimental studies have confirmed the feasibility and the advantage of our method, because energy tuning can be performed with very high energy resolution using a double crystal monochromator at a synchrotron beam line, and there is zero motor error in TXM system in our approach. High-spatial-resolution phase retrieval is accomplished using the proposed method.

Nanoscale elemental sensitivity study of Nd2Fe14B using absorption correlation tomography

Transmission X‐ray microscopy (TXM) is a rapidly developing technique with the capability of nanoscale three dimensional (3D) real‐space imaging. Combined with the wide range in energy tunability from synchrotron sources, TXM enables the retrieval of 3D microstructural information with elemental/chemical sensitivity that would otherwise be inaccessible. The differential absorption contrast above and below absorption edges has been used to reconstruct the distributions of different elements, assuming the absorption edges of the interested elements are fairly well separated. Here we present an “Absorption Correlation Tomography” (ACT) method based on the correlation of the material absorption across multiple edges. ACT overcomes the significant limitation caused by overlapping absorption edges, significantly expands the capabilities of TXM, and makes it possible for fully quantitative nano‐scale 3D structural investigation with chemical/elemental sensitivity. The capability and robustness of this new methodology is demonstrated in a case study of an important type of rare earth magnet (Nd2Fe14B). Microsc. Res. Tech. 76:1112–1117, 2013.

Fabrication of high-aspect-ratio Fresnel zone plates by e-beam lithography and electroplating

The fabrication of gold Fresnel zone plates, by a combination of e-beam lithography and electrodeposition, with a 30 nm outermost zone width and a 450 nm-thick structure is described. The e-beam lithography process was implemented with a careful evaluation of applied dosage, tests of different bake-out temperatures and durations for the photoresist, and the use of a developer without methylisobutylketone. Electrodeposition with a pulsed current mode and with a specially designed apparatus produced the desired high-aspect-ratio nanostructures. The fabricated zone plates were examined by electron microscopy and their performances were assessed using a transmission X-ray microscope. The results specifically demonstrated an image resolution of 40 nm.

Diffraction enhanced imaging: a simple model

Based on pinhole imaging and conventional x-ray projection imaging, a more general DEI (diffraction enhanced imaging) equation is derived using simple concepts in this paper. Not only can the new DEI equation explain all the same problems as with the DEI equation proposed by Chapman, but also some problems that cannot be explained with the old DEI equation, such as the noise background caused by small angle scattering diffracted by the analyser.