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Jürgen Riedmann

Leica Microsystems

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Publication

Featured researches published by Jürgen Riedmann.

Archive | 2006

Divergence and convergence setting apparatus for use in scanning microscope, has positional device including piezoelectric element having tubular area which is varied by voltage application

Jürgen Riedmann

Archive | 2006

Optische Anordnung für ein Mikroskop und ein Mikroskop

Jürgen Riedmann

Archive | 2012

Microscope e.g. confocal laser scan microscope, has illuminating light source such as laser light source that illuminates sample with illuminating light, and scanner that deflects illuminating light to optically scan one side of sample

Jürgen Riedmann

Archive | 2006

Optical arrangement for scan microscope, has optical component for wavelength dependent influence of light beam diameter in such a way that beam diameter in objective is proportional to wavelength, such that airy-dics has same diameter

Jürgen Riedmann; Frank Schreiber

Archive | 2006

Device for investigating microscopic samples comprises a measuring unit integrated into the lens of a microscope

Jürgen Riedmann

Archive | 2006

Optical arrangement for use in multi-photon laser microscope, has chromatic error correcting device with pulse stretcher, where stretcher is placed in area of beam expansion system and integrated into system

Jürgen Riedmann; Volker Leimbach

Archive | 2006

Verfahren zum Erkennen von Dunkelzuständen bei der spektroskopischen oder mikroskopischen Untersuchung von fluoreszenten Proben und Vorrichtung zur spektroskopischen oder mikroskopischen Untersuchung von fluoreszenten Proben

Jürgen Riedmann; Werner Knebel; Lioba Kuschel

Archive | 2005

Scanning microscope for non-descan detection of detection light emitted from a specimen has a detector and a fiber optical light guide to supply detection light to the detector

Heinrich Ulrich; Jürgen Riedmann

Archive | 2005

Verfahren zum Erkennen von Dunkelzuständen bei der spektroskopischen oder mikroskopischen Untersuchung von fluoreszenten Proben und Vorrichtung zur spektroskopischen oder mikroskopischen Untersuchung von fluoreszenten Proben A method of detecting dark states in the spectroscopic or fluorescent microscopic examination of samples and apparatus for the spectroscopic or microscopic examination of fluorescent samples

Werner Knebel; Lioba Kuschel; Jürgen Riedmann

Archive | 2005

Beam-deflection device for a scan microscope has two beam-tilting units to deflect a beam of light on an axis that does not coincide with the axis of incident light

Jürgen Riedmann

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Collaboration

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Lioba Kuschel

Leica Microsystems

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Werner Knebel

Leica Microsystems

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Volker Leimbach

Leica Microsystems

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Birk Holger

Leica Microsystems

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Frank Schreiber

Leica Microsystems

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Heinrich Ulrich

Leica Microsystems

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Ingo Böhm

Leica Microsystems

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Ulrich Heinrich

Leica Microsystems

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