K. Minder

Electroluminescence at 375nm from a ZnO∕GaN:Mg∕c-Al2O3 heterojunction light emitting diode

n-ZnO∕p-GaN:Mg heterojunction light emitting diode (LED) mesas were fabricated on c-Al2O3 substrates using pulsed laser deposition for the ZnO and metal organic chemical vapor deposition for the GaN:Mg. High crystal quality and good surface morphology were confirmed by x-ray diffraction and scanning electron microscopy. Room temperature (RT) photoluminescence (PL) showed an intense main peak at 375nm and a negligibly low green emission indicative of a near band edge excitonic emission from a ZnO layer with low dislocation/defect density. The LEDs showed I-V characteristics confirming a rectifying diode behavior and a RT electroluminescence (EL) peaked at about 375nm. A good correlation between the wavelength maxima for the EL and PL suggests that recombination occurs in the ZnO layer and that it may be excitonic in origin. This also indicates that there is significant hole injection from the GaN:Mg into the ZnO.

Hole-initiated multiplication in back-illuminated GaN avalanche photodiodes

Avalanche p-i-n photodiodes were fabricated on AlN templates for back illumination. Structures with different intrinsic layer thicknesses were tested. A critical electric field of 2.73MV∕cm was estimated from the variation of the breakdown voltage with thickness. From the device response under back and front illumination and the consequent selective injection of holes and electrons in the junction, ionization coefficients were obtained for GaN. The hole ionization coefficient was found to be higher than the electron ionization coefficient as predicted by theory. Excess multiplication noise factors were also calculated for back and front illumination, and indicated a higher noise contribution for electron injection.

Avalanche multiplication in AlGaN based solar-blind photodetectors

Avalanche multiplication has been observed in solar-blind AlGaN-based p-i-n photodiodes. Upon ultraviolet illumination, the optical gain shows a soft breakdown starting at relatively low electric fields, eventually saturating without showing a Geiger mode breakdown. The devices achieve a maximum optical gain of 700 at a reverse bias of 60 V. By modeling the device, it is found that this corresponds to an electric-field strength of 1.7MV∕cm.

Geiger-mode operation of back-illuminated GaN avalanche photodiodes

The authors report the Geiger-mode operation of back-illuminated GaN avalanche photodiodes. The devices were fabricated on transparent AlN templates specifically for back illumination in order to enhance hole-initiated multiplication. The spectral response in Geiger-mode operation was analyzed under low photon fluxes. Single photon detection capabilities were demonstrated in devices with areas ranging from 225to14063μm2. Single photon detection efficiency of 20% and dark count rate <10kHz were achieved in the smallest devices.

Scaling in back-illuminated GaN avalanche photodiodes

Avalanche p-i-n photodiodes of various mesa areas were fabricated on AlN templates for back illumination for enhanced performance through hole-initiated multiplication, and the effects of increased area on device performance were studied. Avalanche multiplication was observed in mesa sizes up to 14063μm2 under linear mode operation. Uniform gain and a linear increase of the dark current with area were demonstrated.

On the interface properties of ZnO/Si electroluminescent diodes

ZnO layers grown on n−-Si(100), n+-Si(100), and n−-Si(111) substrates by pulsed-laser deposition were found to give electroluminescence. Light emission was observed in the form of discrete spots for currents over 1 mA with a white appearance to the naked eye. The intensity of these spots showed an erratic behavior over time, appearing and disappearing at random, while showing an associated random telegraph noise in the current signal. Regardless the substrate used, the electroluminescence spectra had a main broadband emission centered at about 600 nm and a relatively small peak at around 380 nm which corresponds to the energy of ZnO near band edge emission. Furthermore, the devices exhibited rectifying characteristics, whose current blocking direction depended on the substrate orientation. Optimization of ZnO conductivity and performing sample growth in N2 ambient were found to be critical to enhance the emission intensity. Rutherford backscattering characterization revealed the existence of an intermixed...

Etching of ZnO towards the Development of ZnO Homostructure LEDs

Although ZnO has recently gained much interest as an alternative to the III-Nitride material system, the development of ZnO based optoelectonic devices is still in its infancy. Significant material breakthroughs in p-type doping of ZnO thin films and improvements in crystal growth techniques have recently been achieved, making the development of optoelectonic devices possible. ZnO is known to be an efficient UV-emitting material (~380 nm) at room temperature, optical UV lasing of ZnO has been achieved, and both homojunction and hybrid heterojunction LEDs have been demonstrated. In this paper, processing techniques are explored towards the achievement of a homo-junction ZnO LED. First, a survey of current ZnO processing methods is presented, followed by the results of our processing research. Specifically, we have examined etching through an n-ZnO layer to expose and make contact to a p-ZnO layer.

Solar-blind avalanche photodiodes

There is a need for semiconductor based UV photodetectors to support avalanche gain in order to realize better performance and more effectively compete with existing photomultiplier tubes. However, there are numerous technical issues associated with the realization of high-quality solar-blind avalanche photodiodes (APDs). In this paper, APDs operating at 280 nm, within the solar-blind region of the ultraviolet spectrum, are investigated. The devices consist of an Al0.38Ga0.62N active region grown atop a high quality AlN template layer designed to allow back illumination of the devices through the sapphire substrate. These devices perform well in the unbiased mode of operation. Under the application of large reverse bias these devices show a soft breakdown starting at relatively low electric fields. The devices achieve a maximum optical gain of ~1000 at a reverse bias of ~90 Volts, which corresponds to an electric field strength of 2.5 MV/cm. The origins of this gain are discussed in detail and modeling of the devices is used to investigate the electric field build up in the multiplication region.

III-nitride photon counting avalanche photodiodes

In order for solar and visible blind III-nitride based photodetectors to effectively compete with the detective performance of PMT there is a need to develop photodetectors that take advantage of low noise avalanche gain. Furthermore, in certain applications, it is desirable to obtain UV photon counting performance. In this paper, we review the characteristics of III-nitride visible-blind avalanche photodetectors (APDs), and present the state-of-the-art results on photon counting based on the Geiger mode operation of GaN APDs. The devices are fabricated on transparent AlN templates specifically for back-illumination in order to enhance hole-initiated multiplication. The spectral response and Geiger-mode photon counting performance are analyzed under low photon fluxes, with single photon detection capabilities being demonstrated in smaller devices. Other major technical issues associated with the realization of high-quality visible-blind APDs and Geiger mode APDs are also discussed in detail and solutions to the major problems are described where available. Finally, future prospects for improving upon the performance of these devices are outlined.

High Optical Response in Forward Biased (In,Ga)N–GaN Multiquantum-Well Diodes Under Barrier Illumination

The authors report on the current-voltage (I-V) characteristic under forward biases obtained in low leakage, small size p-(In,Ga)N-GaN-n multiquantum well diodes. Under barrier illumination, the devices present a high optical response with capabilities to detect optical powers in the pW range without further amplification. This response is attributed to the screening of the internal electric fields. Recombination times of a few seconds are found to be associated to this mechanism. Moreover, a step-like feature is found in the I-V characteristic before the diode turn-on voltage. Our model proposes tunneling current through the multiquantum-well structure as responsible of this feature. Fast modulation of the tunneling effect under barrier illumination is used to evaluate the detection of low photon fluxes.