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Dive into the research topics where K. R. Murali is active.

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Featured researches published by K. R. Murali.


Thin Solid Films | 1986

Preparation and properties of zinc phosphide thin films

K. R. Murali; B. S. V. Gopalam; J. Sobhanadri

Abstract Zinc phosphide (Zn3P2) was prepared by the carbon reduction process. Thin films of Zn3P2 were evaporated onto glass substrates at various substrate temperatures. Films evaporated onto substrates at and above 220 °C were polycrystalline in nature. Films of different thicknesses were grown and their electrical conductivity was measured in the temperature range 100–300 K. Four characteristic energy gaps of 1.3, 1.66, 1.75 and 1.82 eV were obtained from the analysis of the optical absorption spectrum.


Materials Science and Engineering | 1988

Growth and characterization of CuInSe2 films by close-space evaporation

K. R. Murali; S.K. Viswanathan; B.S.V. Gopalam

Abstract CuInSe 2 thin films were prepared on mica substrates using an evaporation technique which involved varying the distance between the source and the substrate. Films evaporated on substrates at distances less than 1 cm from the source exhibited preferential orientation in the (112) direction. The grain size increased from 0.5 to 1.0 μ m as the source substrate distance decreased from 3 to 1 cm. The conductivity increased with a decrease in the distance between the source and substrate. Electron probe microanalysis of these films showed that films coated on substrates farther away from the source had a slight selenium deficiency and an excess of indium. Three characteristic energy gaps of 1.01, 1.25 and 2.4 eV were obtained from an analysis of the optical absorption spectrum. The optical transition probability for valence band to conduction band transitions was estimated to be 10.91 eV which gives an admixture of copper d states to the valence band of 32%.


Materials Science and Engineering | 1987

Properties of Zn3P2 films grown by close space evaporation

K. R. Murali

Zn3P2 thin films have been prepared on mica substrates by the evaporation technique, varying the distance between the source and substrate. Films evaporated on substrates at distances less than 3 cm from the source were polycrystalline in nature. The grain size increased from 0.2 to 0.8 μm as the source-to-substrate distance decreased from 3 to 1 cm. The variation in electrical conductivity has been studied in the temperature range 100–300 K. The conductivity increases with an increase in temperature and with a decrease in distance between the source and substrate. These results have been analysed on the basis of Motts variable-range hopping mechanism. Four characteristic energy gaps of 1.3, 1.52, 1.68 and 1.88 eV were obtained from an analysis of the optical absorption spectrum.


Materials Science and Engineering | 1986

The role of impurities in the dielectric properties of Zn3P2 phosphide crystals

K. R. Murali; A. Subrahmanyam; J. Sobhanadri

Abstract The dielectric properties of zinc phosphide (Zn3P2) crystals doped with impurities such as magnesium, indium, tin and selenium have been studied in the frequency range 103–105 Hz and in the temperature T range 300–500 K. It may be inferred from the present study that doping Zn3P2 with the above-mentioned impurities results either in a reduction in the number of grain boundaries or in a decrease in the space charge density at room temperature. At higher temperatures the behaviour is not systematic.


Journal of Materials Science Letters | 1986

Growth and optical properties of CuGaSe2 thin films

K. R. Murali; B. S. V. Gopalam; J. Sobhanadri


Journal of Materials Science Letters | 1985

Preparation and properties of copper gallium telluride

K. R. Murali; B. S. V. Gopalam; J. Sobhanadri


Physica Status Solidi (a) | 1990

Color Centers in Irradiated NaF: Mn++ Crystals

K. R. Murali; Y. V. G. S. Murti


Journal of Materials Science Letters | 1986

Aspects of the electrical conductivity of flash-evaporated CulnTe2 thin films

S. Kasi Viswanathan; D. Krishna Rao; K. R. Murali; B. S. V. Gopalam


Physica Status Solidi (a) | 1985

Dielectric properties of zinc phosphide

A. Subrahmanyam; K. R. Murali; B. S. V. Gopalam; J. Sobhanadri


Journal of Materials Science Letters | 1988

Effect of vacuum annealing on the electrical properties of Zn3P2 thin films

K. R. Murali; B. S. V. Gopalam

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B. S. V. Gopalam

Indian Institute of Technology Madras

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J. Sobhanadri

Indian Institute of Technology Madras

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A. Subrahmanyam

Indian Institute of Technology Madras

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B.S.V. Gopalam

Indian Institute of Technology Madras

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D. Krishna Rao

Indian Institute of Technology Madras

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M. Sundaram

Indian Institute of Technology Madras

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P. R. Vaya

Indian Institute of Technology Madras

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S. Kasi Viswanathan

Indian Institute of Technology Madras

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S.K. Viswanathan

Indian Institute of Technology Madras

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Y. V. G. S. Murti

Indian Institute of Technology Madras

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