Katherine F. Davies

Pitman Closeness of Order Statistics to Population Quantiles

In this article, Pitman closeness of sample order statistics to population quantiles of a location-scale family of distributions is discussed. Explicit expressions are derived for some specific families such as uniform, exponential, and power function. Numerical results are then presented for these families for sample sizes n = 10,15, and for the choices of p = 0.10, 0.25, 0.75, 0.90. The Pitman-closest order statistic is also determined in these cases and presented.

Pitman closeness, monotonicity and consistency of best linear unbiased and invariant estimators for exponential distribution under Type II censoring

Comparisons of best linear unbiased estimators with some other prominent estimators have been carried out over the last 50 years since the ground breaking work of Lloyd [E.H. Lloyd, Least squares estimation of location and scale parameters using order statistics, Biometrika 39 (1952), pp. 88–95]. These comparisons have been made under many different criteria across different parametric families of distributions. A noteworthy one is by Nagaraja [H.N. Nagaraja, Comparison of estimators and predictors from two-parameter exponential distribution, Sankhyā Ser. B 48 (1986), pp. 10–18], who made a comparison of best linear unbiased (BLUE) and best linear invariant (BLIE) estimators in the case of exponential distribution. In this paper, continuing along the same lines by assuming a Type II right censored sample from a scaled-exponential distribution, we first compare BLUE and BLIE of the exponential mean parameter in terms of Pitman closeness (nearness) criterion. We show that the BLUE is always Pitman closer than the BLIE. Next, we introduce the notions of Pitman monotonicity and Pitman consistency, and then establish that both BLUE and BLIE possess these two properties.

Pitman Closeness Comparison of Best Linear Unbiased and Invariant Predictors for Exponential Distribution in One- and Two-Sample Situations

Best linear unbiased, best linear invariant, and maximum likelihood predictors are commonly used in reliability studies for predicting either censored failure times or lifetimes from a future life-test. In this article, by assuming a Type-II right-censored sample from an exponential distribution, we compare best linear unbiased (BLUP) and best linear invariant (BLIP) predictors of the censored order statistics in the one-sample case and order statistics from a future sample in the two-sample case, in terms of Pitman closeness criterion. Some specific conclusions are drawn and supporting numerical results are presented.

Simultaneous Pitman closeness of progressively type-II right-censored order statistics to population quantiles

In this work, we extend prior results concerning the simultaneous Pitman closeness of order statistics (OS) to population quantiles. By considering progressively type-II right-censored samples, we derive expressions for the simultaneous closeness probabilities of the progressively censored OS to population quantiles. Explicit expressions are deduced for the cases when the underlying distribution has bounded and unbounded supports. Illustrations are provided for the cases of exponential, uniform and normal distributions for various progressive type-II right-censoring schemes and different quantiles. Finally, an extension to the case of generalized OS is outlined.

Correlation-Type Goodness of Fit Test for Extreme Value Distribution Based on Simultaneous Closeness

In reliability studies, one typically would assume a lifetime distribution for the units under study and then carry out the required analysis. One popular choice for the lifetime distribution is the family of two-parameter Weibull distributions (with scale and shape parameters) which, through a logarithmic transformation, can be transformed to the family of two-parameter extreme value distributions (with location and scale parameters). In carrying out a parametric analysis of this type, it is highly desirable to be able to test the validity of such a model assumption. A basic tool that is useful for this purpose is a quantile–quantile (QQ) plot, but in its use, the issue of the choice of plotting position arises. Here, by adopting the optimal plotting points based on Pitman closeness criterion proposed recently by Balakrishnan et al. (2010b), and referred to as simultaneous closeness probability (SCP) plotting points, we propose a correlation-type goodness of fit test for the extreme value distribution. We compute the SCP plotting points for various sample sizes and use them to determine the mean, standard deviation and critical values for the proposed correlation-type test statistic. Using these critical values, we carry out a power study, similar to the one carried out by Kinnison (1989), through which we demonstrate that the use of SCP plotting points results in better power than with the use of mean ranks as plotting points and nearly the same power as with the use of median ranks. We then demonstrate the use of the SCP plotting points and the associated correlation-type test for Weibull analysis with an illustrative example. Finally, for the sake of comparison, we also adapt two statistics proposed by Gan and Koehler (1990), in the context of probability–probability (PP) plots, based on SCP plotting points and compare their performance to those based on mean ranks. The empirical study also reveals that the tests from the QQ plot have better power than those from the PP plot.

Computation of optimal plotting points based on Pitman closeness with an application to goodness-of-fit for location-scale families

Plotting points of order statistics are often used in the determination of goodness-of-fit of observed data to theoretical percentiles. Plotting points are usually determined by using nonparametric methods which produce, for example, the mean- and median-ranks. Here, we use a distribution-based approach which selects plotting points (quantiles) based on the simultaneous-closeness of order statistics to population quantiles. We show that the plotting points so determined are robust over a multitude of symmetric distributions and then demonstrate their usefulness by examining the power properties of a correlation goodness-of-fit test for normality.

Two-sample Pitman closeness comparison under progressive Type-II censoring

In this paper, we consider two problems concerning two independent progressively Type-II censored samples. We first consider the Pitman closeness (PC) of order statistics from two independent progressively censored samples to a specific population quantile. We then consider the point prediction of a future progressively censored order statistic and discuss the determination of the closest progressively censored order statistic from the current sample according to the simultaneous closeness probabilities. For both these problems, explicit expressions are derived for the pertinent PC probabilities, and then special cases are given as examples. For various censoring schemes, we also present numerical results for the standard uniform, standard exponential, and standard normal distributions. Finally, a distribution-free result for the median is obtained.

Exact Nonparametric Meta-Analysis of Lifetime Data From Systems With Known Signatures

In this paper, a mixture representation is derived for the pooled system lifetimes arising from a life-test on two or more independent samples. The components of each system are assumed to have the same common absolutely continuous distribution, but the system signature may vary between the samples. These mixtures are then used for developing exact nonparametric inference in the form of confidence intervals for quantiles of component or system lifetimes, as well as prediction intervals for future component or system lifetimes. Examples are finally provided to illustrate the developed methods. It is noted that testing with systems rather than components directly can reduce the expected number of failures while maintaining nominal coverage probability.

Nonparametric prediction of future order statistics

Prediction of censored order statistics from a Type-II censored sample can be done with trivial bounds having perfect confidence. However, given independent samples from the same absolutely continuous distribution, improved bounds can be attained. In this regard, we develop here point prediction based on L-statistics for predicting order statistics (OS) from a future sample as well as for predicting censored OS from a Type-II censored sample. An example is taken to illustrate these ideas, and the limiting case wherein a single independent sample is arbitrarily large is also discussed.

Some results on order statistics generated by two simulation methods

In this paper, we consider joint distributions of order statistics generated by two simulation methods. By using these distributions, we study the nature of dependence and exceedence probabilities between them.