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Kei-wean C. Yang

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Publication

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IEEE Transactions on Electron Devices | 1983

Mechanisms of the negative-resistance characteristics in AC thin-film electroluminescent devices

Kei-wean C. Yang; S.J.T. Owen

A model describing the mechanism responsible for generating the negative-resistance phenomenon found in hysteretic ZnS:Mn ACTFEL devices is presented. This model, which is based on simple physics intuitions rather than elaborate mathematical and numerical analyses, outlines several essential device parameters that are necessary to induce the negative-resistance effect.

Archive | 1989

Color filter grouping for addressing matrixed display devices

Kei-wean C. Yang

Archive | 2002

Measurement probe providing signal control for an EOS/ESD protection module

Kei-wean C. Yang

Archive | 2005

Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities

Kei-wean C. Yang

Archive | 1990

Trench structured charge-coupled device

Kei-wean C. Yang; John Edwards Taggart

Archive | 2008

Differential Measurement Probe Having a Ground Clip System for the Probing Tips

Kei-wean C. Yang; Mark W. Nightingale; Paul G. Chastain

Archive | 1996

STN displays having high contrast, with purple polarizer and residual birefringence causing greenish-gold or purplish-blue coloring

Kei-wean C. Yang

Archive | 1988

Tilted channel, serial-parallel-serial, charge-coupled device

Kei-wean C. Yang; John Edward Taggart; Raymond Hayes; Joseph R Peter

Archive | 2004

Measurement probe system with EOS/ESD protection

Kei-wean C. Yang

Archive | 1988

Charge-coupled device channel with countinously graded built-in potential

Kei-wean C. Yang; John Edward Taggart

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Mark W. Nightingale

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John Edward Taggart

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Paul G. Chastain

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Gary W. Reed

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John Edwards Taggart

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Joseph R Peter

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Raymond Hayes

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