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Dive into the research topics where Keisuke Kawame is active.

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Featured researches published by Keisuke Kawame.


international conference on industrial electronics control and instrumentation | 1992

Automated color inspection system for color CRT displays

Toshio Asano; Keisuke Kawame; Jun Mochizuki; N. Fukuhara

An automated white uniformity inspection system for high-resolution color CRTs (cathode ray tubes) was developed. White uniformity is the general evaluation of whiteness on CRT screens and is especially important for CRTs used in computer display terminals. A color television camera was used to obtain color data on a CRT screen at high speed. Perceptual color differences on chrominance signal color space are discussed. An algorithm for white uniformity inspection is presented using the chrominance signals. Color contrast between a defect region and the background, hue, area, and edge strength of the defect was used for the evaluation. The validity of the algorithm has been verified by experimental results.<<ETX>>


Archive | 1989

Picture quality testing method and apparatus for color cathode-ray tube

Keisuke Kawame; Toshio Asano; Jun Mochizuki


Archive | 1998

Resolving power evaluation method and specimen for electron microscope

Taiji Kitagawa; Mitsugu Sato; Goroku Shimoma; Tadanori Takahashi; Naoto Yoshida; Masayuki Yukii; Takanori Ninomiya; Tatsuo Horiuchi; Keisuke Kawame


Archive | 1998

Electron microscope, its resolution evaluating method and manufacture of semiconductor therewith

Tatsuo Horiuchi; Keisuke Kawame; Taiji Kitagawa; Takanori Ninomiya; Minoru Noguchi; Goroku Shimoma; Tadanori Takahashi; Masayuki Yukii; 五六 下間; 隆典 二宮; 泰治 北川; 立夫 堀内; 啓介 川目; 稔 野口; 正幸 雪井; 忠範 高橋


Archive | 1996

Method and system for evaluating image quantity of color display and manufacture of color display

Toshiro Asano; Nobuo Kawai; Keisuke Kawame; Taiji Kitagawa; Atsushi Mochizuki; Kaoru Sakai; 泰治 北川; 啓介 川目; 望月 淳; 信雄 河合; 敏郎 浅野; 薫 酒井


Archive | 1997

Inspection method of plasma display panel and manufacture of plasma display panel

Toshiro Asano; Tadashi Furukawa; Mikio Hongo; Keisuke Kawame; 正 古川; 啓介 川目; 幹雄 本郷; 敏郎 浅野


Archive | 1997

Evaluation method for resolving power of electron microscope and sample for it

Tatsuo Horiuchi; Keisuke Kawame; Taiji Kitagawa; Takanori Ninomiya; Mitsugi Sato; Goroku Shimoma; Tadanori Takahashi; Naoto Yoshida; Masayuki Yukii; 五六 下間; 隆典 二宮; 佐藤 貢; 泰治 北川; 直人 吉田; 立夫 堀内; 啓介 川目; 正幸 雪井; 忠範 高橋


Archive | 1997

Chromaticity measuring method

Toshiro Asano; Tatsuo Horiuchi; Nobuo Kawai; Keisuke Kawame; 立夫 堀内; 啓介 川目; 信雄 河合; 敏郎 浅野


Archive | 2005

Resolving power evaluation method for electron microscope

Taiji Kitagawa; Mitsugu Sato; Goroku Shimoma; Tadanori Takahashi; Naoto Yoshida; Masayuki Yukii; Takanori Ninomiya; Tatsuo Horiuchi; Keisuke Kawame


Archive | 1998

A method of estimating the resolving power of an electron microscope

Tatsuo Horiuchi; Keisuke Kawame; Taiji Kitagawa; Takanori Ninomiya; Mitsugu Hitachinaka-shi Sato; Goroku Shimoma; Tadanori Takahashi; Naoto Yoshida; Masayuki Yukii

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