Kevin Edward Lupton
Dow Corning
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Publication
Featured researches published by Kevin Edward Lupton.
Journal of Plastic Film and Sheeting | 1999
Peter G. Pape; Dale Earl Hauenstein; Kevin Edward Lupton
Various silicone process aid candidates were evaluated and compared to alternative process aids for their effect on surface properties of extruded linear low density polyethylene (LLDPE). Their performance was influenced by the silicone polymer structure and the concentration of the silicone polymer in the polyethylene resin. An increase in the polarity of functional groups on the silicone polymer resulted in an increase in the effect on surface properties of extruded LLDPE. Silicone concentrations in the range 220 to 3520 ppm in the polyethylene resin gave significant reduction in surface roughness caused by melt fracture during extrusion. Concentrations of 10000 ppm or less gave coefficient of friction values of 0.3 or below. Beneficial effects on extruder parameters, such as the reduction of extrusion pressure, current, and output were also observed.
Organosilicon Chemistry Set: From Molecules to Materials | 1998
Gerald Alphonse Gornowicz; Kevin Edward Lupton; David Joseph Romenesko; Kim Struble; Hongxi Zhang
Archive | 1998
Dale Earl Hauenstein; Arnold Wade Lomas; Kevin Edward Lupton; David Joseph Romenesko
Journal of Vinyl & Additive Technology | 2000
Kevin Ryan; Kevin Edward Lupton; Peter G. Pape; Vivian Brian John
Archive | 2001
Haruhiko Furukawa; Yoshitsugu Morita; Kevin Edward Lupton; David Joseph Romenesko
Archive | 1996
Wei Chen; Kevin Edward Lupton; David Joseph Romenesko; Randall Gene Schmidt; Hongxi Zhang
Archive | 1996
Leon Neal Cook; Richard Allen Hessick; Kevin Edward Lupton; David Joseph Romenesko; Randall Gene Schmidt; Hongxi Zhang
Archive | 1996
Wei Chen; Hongxi Zhang; Kevin Edward Lupton; David Joseph Romenesko; Randall Gene Schmidt
Archive | 1997
Wei Chen; Kevin Edward Lupton; David Joseph Romenesko; Randall Gene Schmidt; Hongxi Zhang
Archive | 1997
Leon Neal Cook; Richard Allen Hessick; Kevin Edward Lupton; David Joseph Romenesko; Randall Gene Schmidt; Hongxi Zhang