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Kobayashi Kazutoshi

Kyoto Institute of Technology

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Publication

Featured researches published by Kobayashi Kazutoshi.

IEICE Technical Report; IEICE Tech. Rep. | 2016

Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process

Yabuuchi Michitarou; Oshima Azusa; Komawaki Takuya; Kobayashi Kazutoshi; Kishida Ryo; Furuta Jun; Weckx Pieter; Kaczer Ben; Matsumoto Takashi; Onodera Hidetoshi

IEEE Conference Proceedings | 2016

65nmバルクと薄膜BOX FDSOIプロセスにおけるプラズマ誘起損傷と負バイアス温度不安定性の間の相関【Powered by NICT】

Kishida Ryo; Kobayashi Kazutoshi

Technical report of IEICE. VLD | 2015

Methodology for Reduction of Timing Margin by Considering Correlation between Process Variation and BTI

Yabuuchi Michitarou; Kobayashi Kazutoshi

Technical report of IEICE. VLD | 2014

Impact of CMOS Transistor Random Telegraph Noise on Combinational Circuit Delay

Matsumoto Takashi; Kobayashi Kazutoshi; Onodera Hidetoshi

IEICE Technical Report; IEICE Tech. Rep. | 2014

Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process

Kishida Ryo; Oshima Azusa; Kobayashi Kazutoshi

IEICE Technical Report; IEICE Tech. Rep. | 2014

Characterization of Random Telegraph Noise using Inhomogeneous Ring Oscillator

Nishimura Shohei; Matsumoto Takashi; Kobayashi Kazutoshi; Onodera Hidetoshi

IEICE Technical Report; IEICE Tech. Rep. | 2013

Evaluations of Variations on Ring Oscillators from Plasma Induced Damage in Bulk and SOTB Processes

Kishida Ryo; Yabuuchi Michitarou; Oshima Azusa; Kobayashi Kazutoshi

Technical report of IEICE. VLD | 2011

Degradation of Oscillation Frequency of Ring Oscillators Placed on a 90 nm FPGA

Ishii Shouhei; Kobayashi Kazutoshi

IEICE Technical Report; IEICE Tech. Rep. | 2010

A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop Capable of Protecting Soft Errors on the C-element

Furuta Jun; Hamanaka Chikara; Kobayashi Kazutoshi; Onodera Hidetoshi

IEICE Technical Report; IEICE Tech. Rep. | 2010

A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor

Matsumoto Takashi; Makino Hiroaki; Kobayashi Kazutoshi; Onodera Hidetoshi

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Matsumoto Takashi

Kyoto University

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Ishii Shouhei

Kyoto Institute of Technology

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