Kozi Nishida
Mitsubishi
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Publication
Featured researches published by Kozi Nishida.
Integrated Ferroelectrics | 2014
T. Kozu; M. Yamaguchi; M. Kawaguchi; Hiromi Shima; Jin Woong Kim; Masako Matsuoka; Kozi Nishida; Takashi Yamamoto
Deep UV Raman spectroscopy is expected as a technique to evaluate diamond like carbon (DLC) because it observes sp3 bonds peak, called T-peak, and sp2 bonds, called G-peak, directly. To use the advantage of deep UV Raman spectroscopy, we show the evaluation of sp2 bonds rich DLC, called a-C:H, and several type of sp3 bond rich, called ta-C. The a-C:H samples are thermal treatment sample which are evaluated by visible Raman on empirical rule. These were evaluated by Deep UV Raman. It is considered that Deep UV Raman spectroscopy is versatile technique for evaluating diamond like carbon.
Integrated Ferroelectrics | 2014
Masako Matsuoka; Masamichi Nishide; Takeshi Tai; Jin Woong Kim; Hiromi Shima; Takashi Katoda; H. Funakubo; Kozi Nishida; Takashi Yamamoto
The influence of the post-deposition cooling speed on the domain formation process of PbTiO3 films was investigated using MOCVD equipment combined with in-situ Raman spectroscopy. The accumulation and relaxation of strain during the post-deposition cooling process is responsible for the domain structure. The Curie temperature for fast cooling is lower than that for slow cooling. Additionally, the residual strain with fast cooling is smaller than that with slow cooling. These observations suggest that the volume fraction of the c-domain is larger for fast cooling and that the atmospheric conditions during the first post-deposition cooling process may control the domain structure.
Integrated Ferroelectrics | 2013
Takeshi Tai; Kiyotaka Wasa; Jin Woong Kim; T. Kouzu; Masako Matsuoka; Masamichi Nishide; Hiromi Shima; Kozi Nishida; Takashi Yamamoto
Single-c-domain/single-crystal PZT thin films grown by rf magnetron sputtering on SrRuO3/Pt/MgO substrates was investigated by Raman spectroscopy. The Raman spectroscopy measurement revealed that the sputter deposited thin film has high quality and highly c domain oriented. In addition, Raman spectroscopy revealed the local strain configuration in the sputtered thin films from the surface to the substrates. These local stresses were discussed with dielectric property.
Archive | 1985
Isao Sasaki; Kozi Nishida; Masaru Morimoto; Takashi Yamamoto
Sen-i Gakkaishi | 1984
Isao Sasaki; Kozi Nishida; Masaru Morimoto; Hisao Anzai; Hideaki Makino
Archive | 1988
Isao Sasaki; Kozi Nishida; Masaru Morimoto; Hisao Anzai; Hideaki Makino
Archive | 1982
Kazuo Kishida; Naoki Yamamoto; Kozi Nishida; Toshihito Narita; Yasumasa Sato
Archive | 1987
Hisao Anzai; Hideaki Makino; Isao Sasaki; Kozi Nishida; Masaru Morimoto
Archive | 1989
Isao Sasaki; Kozi Nishida; Hisao Anzai
Archive | 1986
Hisao Anzai; Hideaki Makino; Isao Sasaki; Kozi Nishida; Masaru Morimoto