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Dive into the research topics where Krzysztof Strzecha is active.

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Featured researches published by Krzysztof Strzecha.


instrumentation and measurement technology conference | 2001

Automatic investigation of surface phenomena in high temperature solid and liquid contacts

Dominik Sankowski; Jacek Senkara; Krzysztof Strzecha; S. Jezewski

In the paper newly developed system for automatic measurements of surface properties is presented. The results obtained with the device described in this paper are far more accurate than those obtained by means of the currently applied non automatic methods based on the operators evaluation.


instrumentation and measurement technology conference | 1999

Computerized device with CCD camera for measurement of surface tension and wetting angle in solid-liquid systems

Dominik Sankowski; Krzysztof Strzecha; S. Jezewski; Jacek Senkara; W. Lobodzinski

In this paper, a computerized device with the CCD camera for the automatic determination of important surface properties of liquid and solid in contact is described. This device is based on image processing algorithms. The system is capable of measuring the surface tension (surface energy) of liquid and the wettability of a solid surface in the wide range of temperatures, up to 1800/spl deg/C. The results obtained with this device are far more accurate than those obtained by means of the currently applied, extremely time consuming non-automatic methods and the operators subjective evaluation.


international conference on perspective technologies and methods in mems design | 2008

Drop shape analysis for measurements of surface tension and wetting angle of metals at high temperatures

Krzysztof Strzecha; Tomasz Koszmider

New metals drop shape analysis algorithms are presented in this paper. They concerns utilization of digital image processing and analysis methods in process of wetting tension and contact angle measurements at high temperatures.


international conference on experience of designing and applications of cad systems in microelectronics | 2003

Computerized system for assessment of quality of solders

Dominik Sankowski; Jacek Senkara; Krzysztof Strzecha

Computerized System for Assessment of Quality of Solders Dominik Sankowski, Jacek Senkara, Krzysztof Strzecha Absnacr Assumptions for building computerized system for assessment of quality of wlden are presented in this paper. This tester will allow to provide technologibl investigations within the framework of statandarired t n k for tho development of ne6 technologies and inspection of the implemented ones. parameters, and finally from the requirements to be met by a joint. . . II. PHYSICAL PRELIMINAR~ES


international conference on perspective technologies and methods in mems design | 2006

Application Of The Edge-Based Image Segmentation

Krzysztof Strzecha; Anna Fabijańska; Dominik Sankowski

In this paper computerized system fcr high temperature measurements of superficial properties has been presented. The process of superficial properties determination is based on digital image processing and analysis algorithms. Image segmentation methods in aforementioned system have been discussed. Particular attention has been paid to new approach for edge-based image segmentation involving parallel performance of gradient operator and thresholding mechanism


international conference on experience of designing and applications of cad systems in microelectronics | 2001

Image segmentation algorithm based on statistical pattern recognition methods

Krzysztof Strzecha

Presents a newly developed segmentation algorithm, based on k-NN statistical pattern recognition rule. This algorithm uses arbitrary surface description as the primitive and can be described as a region growing method.


international conference on perspective technologies and methods in mems design | 2008

New segmentation algorithms of metal’s drop images from thermo-wet system

Tomasz Koszmider; Krzysztof Strzecha

In this paper new metals drop image segmentation algorithms are presented. They concern utilization of digital processing and analysis of drop images at high temperatures in a process of wetting tension and contact angle measurements.


Archive | 2011

Algorithm for Accurate Determination of Contact Angles in Vision System for High-Temperature Measurements of Metals and Alloys Surface Properties

Tomasz Koszmider; Krzysztof Strzecha; Anna Fabijańska; Marcin Bakala

In this paper problem of contact angle determination using image processing and analysis algorithms is considered. Specifically, algorithms developed for computerised system for high temperature measurements of surface properties of metals and alloys are introduced. Application of the proposed methods allows to overcome limitations caused by specimen intense thermal radiation and obtain accurate values of surface tension in a wide range of temperatures.


instrumentation and measurement technology conference | 2003

The development of image processing and analysis unit for building a solderability tester

Dominik Sankowski; Krzysztof Strzecha

Absfrcrd In this paper problems which occurs during development of image processing and anaIysis unit for hightemperafure measurement system are presented Described vision unit were built especially for computerized sysiem for measurement of solderability by means of measure of the basic measurabIe quantifies characterizing interfaciaI interactions: the surface energy (suface tension) of the liquid phase and the exlreme weftability of the base with liquid


international conference on modern problems of radio engineering, telecommunications and computer science | 2002

Application of k-NN based segmentation algorithm in system for automated measurement of surface phenomena

Dominik Sankowski; Krzysztof Strzecha

This paper presents the application of a new segmentation algorithm in a computer-based system for high temperature measurements of superficial properties. This newly developed segmentation algorithm is based on statistical pattern recognition theory.

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Dominik Sankowski

Lodz University of Technology

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Anna Fabijańska

Lodz University of Technology

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Jacek Senkara

Warsaw University of Technology

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Marcin Bąkała

Lodz University of Technology

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