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Featured researches published by Kwan-Sun Yoon.


Japanese Journal of Applied Physics | 2007

Kinetic monte carlo modeling of boron diffusion in strained silicon

Young-Kyu Kim; Kwan-Sun Yoon; Joong-Sik Kim; Taeyoung Won

We discuss the boron diffusion in a biaxial tensile-strained {001} Si and SiGe layer using the kinetic Monte Carlo (KMC) method. We created strain in silicon by adding a germanium mole fraction to the silicon in order to perform a theoretical analysis. The generation of strain in silicon influences the diffusivity as well as the penetration profile during the implantation. The strain energy of the charged defects was calculated from ab initio calculation whereas the diffusivity of boron was extracted from the Arrhenius formula. Hereby, the influence of the germanium content on the dopant diffusivity was estimated. Our KMC study revealed that the diffusion of the B atoms was retarded with increasing germanium mole fraction in the strained silicon layer. Furthermore, we derived the functional dependence of the in-plane strain as well as the out-of-plane strain on the germanium mole fraction, which is based on the distribution of equivalent stress along the Si/SiGe interface.


Molecular Simulation | 2008

Atomistic modelling for boron diffusion in strained silicon substrate

Young-Kyu Kim; Kwan-Sun Yoon; Joong-Sik Kim; Han-Geon Kim; Taeyoung Won

We discuss the issue of boron diffusion in biaxial tensile strained {001} Si and SiGe layer with kinetic Monte Carlo (KMC) method. We created strain in silicon by artificially adding a germanium mole fraction to the silicon in order to perform a theoretical analysis. The strain energy of the charged defects was calculated from ab initio calculation whereas the diffusivity of boron was extracted from the Arrhenius formula. Hereby, the influence of the germanium content on the diffusivity of the impurity atom was estimated. Our KMC study revealed that the diffusion of the boron atoms was retarded with increasing germanium mole fraction in the strained silicon layer. Furthermore, we derived the functional dependence of the in-plane strain as well as the out-of-plane strain as a function of the germanium mole fraction, which is based on the distribution of equivalent stress along the Si/SiGe interface.


Molecular Simulation | 2008

Ab-initio study on indium diffusion in silicon substrate under hydrostatic stress

Kwan-Sun Yoon; Young-Kyu Kim; Taeyoung Won

In this paper, we report our ab-initio study on indium diffusion in strained Si. We investigated the minimum energy path as well as the migration energy for indium atoms in the hydrostatic strained silicon wherein the strain was incorporated by constructing a silicon layer on SiGe substrate with 20% germanium mole fraction. The ab-initio calculation allowed us to figure out the lowest-energy structure (InS+Sii Td) and the next lowest energy structure (Ini Td) during indium diffusion. The energy of migration barrier was also predicted from the nudged elastic band and climbing nudged elastic band method. Consequently, we found that the energy barrier was a little higher than the case of unstrained Si.


international semiconductor device research symposium | 2005

Determination of Evolution Path for B/sub m/I/sub n/ Clusters in Atomistic Model

Jae-Hyun Yoo; Chi-Ok Hwang; Kwan-Sun Yoon; Jung-Sik Kim; Taeyoung Won

In this paper, we report our study on the determination on the evolution path and dominant BmIn clusters during boron diffusion using a simple atomistic model for describing the kinetic Monte Carlo (KMC). It has been known that clusters generated after ion implantation play a decisive role in the enhanced boron diffusion at the tail region in contrast to the immobile property at the peak region. Our model, which is based on the simple continuum model [2], takes the intermediate clusters into account as well as dominant clusters for understanding the evolutionary behaviour of boron interstitial clusters during boron diffusion. We found out that the intermediate clusters such as B3I3 and B2I3 play a significant role despite that the lifetime of the corresponding intermediate clusters are relatively short due to low binding energies. Additionally, our investigation revealed that the density of BI2 clusters increased at the beginning of the annealing process while the density of B3I increased at a later stage. Also, we found the evolution path of dominant clusters from B2I to B3I during annealing. Finally, KMC simulation results were compared with experimental data, which demonstrated an excellent agreement


Journal of the Korean Physical Society | 2006

Atomistic simulation for a Nano-CMOS process : From ion implantation to diffusion

Jae-Hyun Yoo; Kwan-Sun Yoon; Joong-Sik Kim; Taeyoung Won


Journal of Nanoscience and Nanotechnology | 2007

Atomistic simulation of boron diffusion with charged defects and diffusivity in strained Si/SiGe.

Young-Kyu Kim; Kwan-Sun Yoon; Joong-Sik Kim; Taeyoung Won


Journal of the Korean Physical Society | 2006

First-principles investigation of indium diffusion in a silicon substrate

Kwan-Sun Yoon; Chi-Ok Hwang; Jae-Hyun Yoo; Taeyoung Won


Journal of the Korean Physical Society | 2007

Ab-Initio Calculation for Boron Diffusion in Si/SiGe Strained Layers

Young-Kyu Kim; Kwan-Sun Yoon; Joong-Sik Kim; Han-Geon Kim; Taeyoung Won


Journal of the Korean Physical Society | 2007

Kinetic Monte Carlo (KMC) modeling for boron diffusion in strained silicon

Young-Kyu Kim; Kwan-Sun Yoon; Joong-Sik Kim; Taeyoung Won


Journal of the Korean Physical Society | 2007

Determination of the KMC Parameters for Indium Diffusion in Silicon Substrates via an Ab-Initio Calculation

Kwan-Sun Yoon; Chi-Ok Hwang; Taeyoung Won

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Jinsu Yoo

United States Department of Energy

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