Kwan-Wook Jung
Samsung
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Publication
Featured researches published by Kwan-Wook Jung.
IEEE Electron Device Letters | 2004
Wan-Shick Hong; Kwan-Wook Jung; Joon-hoo Choi; Byung-Keun Hwang; Kyuha Chung
Thin-film transistor liquid crystal display (TFT-LCD) panels of a high transmittance structure were fabricated by using a low-/spl kappa/ dielectric film as a passivation layer. The low-dielectric films were successfully deposited and patterned using a conventional plasma-enhanced chemical vapor deposition (PECVD) and plasma-assisted etching techniques. The interface between the a-Si channel and the overlaying passivation was modified by appropriate plasma treatment prior to the low-/spl kappa/ deposition. TFTs having the a-Si:C:O:H passivation showed a transfer characteristics similar to that of conventional TFTs. The high transmittance panel showed brightness approximately 30% higher than that of a standard panel without degrading other display characteristics, such as crosstalk.
Applied Physics Letters | 2002
Hee Joon Kim; Gyuseong Cho; Joon-hoo Choi; Kwan-Wook Jung
In this letter, we report the leakage current of amorphous silicon (a-Si:H) p-i-n photodiodes, of which the p layer is formed by ion shower doping. The ion shower doping technique has an advantage over plasma-enhanced chemical vapor deposition (PECVD) in the fabrication of a large-area amorphous silicon flat-panel detector. The leakage current of the ion shower diodes shows a better uniformity within a 30 cm×40 cm substrate than that of the PECVD diodes. However, it shows a higher leakage current of 2–3 pA/mm2 at −5 V. This high current originates from the high injection current at the p-i junction.
SID Symposium Digest of Technical Papers | 2003
Wan-Shick Hong; Kwan-Wook Jung; Sung-Hoon Yang; Kyuha Chung; Byung-Keun Hwang; Glenn Cerny
Fabrication of TFT-LCD panels of high resolution and aperture ratio was demonstrated by using a low-k dielectric film as a passivation layer for the first time. The low-k dielectric films were successfully deposited and patterned using a conventional PECVD and plasma-assisted etching techniques, causing no drastic modification to the standard TFT process. Thin film transistors having the a-Si:C:O:H passivation showed a transfer characteristics similar to that of conventional TFTs. The high transmittance panel showed brightness approximately 30% higher than that of a standard panel without degrading other display characteristics, such as cross-talk.
Archive | 2009
Joong-Hyun Mun; Jang-kun Song; Yong-Woo Choi; Bo-Sung Kim; Kwan-Wook Jung; Jung-Ho Lee; Hyo-Rak Nam
Archive | 2005
Joong-Hyun Mun; Jang-kun Song; Yong-Woo Choi; Bo-Sung Kim; Kwan-Wook Jung; Jung-Ho Lee; Hyo-Rak Nam
Archive | 2002
Sung-Hoon Yang; Wan-Shick Hong; Kwan-Wook Jung
Archive | 2006
Joon-hoo Choi; Wan-Shick Hong; Dae-jin Kwon; Kwan-Wook Jung; Sang-Gab Kim; Kyu-Ha Jung
Archive | 2006
Bo Sung Kim; Kwan-Wook Jung; Wan-Shick Hong; Sang-Gab Kim; Mun-pyo Hong
Archive | 2007
Jae-Beom Choi; Young-Jin Chang; Kwan-Wook Jung; Seung-Hwan Shim
Archive | 2001
Joong-Hyun Mun; Jang-kun Song; Yong-Woo Choi; Bo-Sung Kim; Kwan-Wook Jung; Jung-Ho Lee; Hyo-Rak Nam