Kyung-Suk Kim

Analysis of an internal crack of pressure pipeline using ESPI and shearography

In this study, shearography and ESPI have been used for quantitative analysis of an internal crack of pipeline and both of them have proved to be suitable to qualitatively detect inside crack. However, shearography needs several critical? factors including the amount of shearing, shearing direction and induced load for the quantitative evaluation of the inside crack. In this study, the factors were optimized for the quantitative analysis and the size of cracks has been determined. Although the critical? factors in shearography have been optimized, it is difficult to determine the factors exactly because they are related to the details of cracks. On the other hand, ESPI is independent of the details of a crack and only the induced load plays an important role. The out-of-plane displacement was measured under the optimized load and the measured results were numerically differentiated, which resulted in an equivalent to the shearogram. The size of cracks can be determined quantitatively without any detail of a crack.

Wavelet analysis based deconvolution to improve the resolution of scanning acoustic microscope images for the inspection of thin die layer in semiconductor

Scanning acoustic microscopy (SAM) is used as an important non-destructive test tool in semiconductor reliability evaluation and failure analysis. However, inspection of thin die layer has proven difficult as the reflected signals from the die top and bottom are superimposed. Conventional deconvolution techniques have been used for the improvement of time resolution in A-scan signal, however, they are not effective for SAM signal because the waveform of the reflected echo is quite different from the incident waveform due to the frequency dependent attenuation and the focal effect. In this paper, in order to overcome this difficulty, a new signal processing method, wavelet analysis based deconvolution technique is proposed. Its validity is approved by computer simulations and practical performances are demonstrated by experiments for the fabricated semiconductor sample.

Residual Stress Measurement of Flat Welded Specimen by Electronic Speckle Pattern Interferometry

Abstract The size and distribution of welding residual stress and welding deformation in welding structures have an effect on various sorts of damage like brittle failure, fatigue failure and stress corrosion cracking. So, research for this problem is necessary continuously. In this study, non-destructive technique using laser electronic speckle pattern interferometry, plate of welding specimen according to the external load on the entire behavior of residual stress are presented measurement techniques. Once, welding specimen force tensile loading, using electronic speckle pattern interferometry is measured. welding specimen of base metal and weld zone measure strain from measured result, this using measure elastic modulus. In this study, electronic speckle pattern interferometry use weld zone and base metal parts of the strain differences using were presented in residual stress calculated value, This residual stress value ​were calculated by numerical calculation. Consequently, ​weld zone of modulus high approximately 3.7 fold beside base metal and this measured approximately 8.46 MPa.

Application Angle of Defects Detection in the Pipe Using Lock-in Infrared Thermography

This perform research of angle rated defect detection conditions and nuclear power plant piping defect detection by lock-In infrared thermography technique. Defects were processed according to change for wall-thinning length, Circumference orientation angle and wall-thinning depth. In the used equipment IR camera and two halogen lamps, whose full power capacitany is 1 kW, halogen lamps and target pipe`s distance fixed 2 m. To analysis of the experimental results ensure for the temperature distribution data, by this data measure for defect length. Reliability of lock-In infrared thermography data is higher than Infrared thermography data. This through research, Shape of angle rated defect is identified industry place. It help various angles defect detection in the nuclear power plant in operation.

Defect Depth Measurement of Straight Pipe Specimen Using Shearography

Abstract In the nuclear industry, wall thinning defect of straight pipe occur the enormous loss in life evaluation and safety evaluation. To use non-destructive technique, we measure deformation, vibration, defect evaluation. But, this techniques are a weak that is the measurement of the wide area is difficult and the time is caught long. In the secondary side of nuclear power plants mostly used steel pipe, artificiality wall thinning defect make in the side and different thickness make to the each other. wall thinning defect part of deformation measure by using shearography. In addition, optical measurement through deformation, vibration, defect evaluation evaluate pipe and thickness defects of pressure vessel is to evaluate quantitatively. By shearography interferometry to measure the pipes internal wall thinning defect and the variation of pressure use the proposed technique, the quantitative defect is to evaluate the thickness of the surplus. The amount of deformation use thickness of surplus prediction of the actual thickness defect and approximately 7 percent error by ensure reliability. According to pressure the amount of deformation and the thickness of the surplus through DB construction, nuclear power plant pipe use wall thinning part soundness evaluation. In this study, pressure vessel of thickness defect measure proposed nuclear pipe of wall thinning defect prediction and integrity assessment technology development. As a basic research defected theory and experiment, pressure vessel of advanced stability and soundness and maintainability is expected to contribute foundation establishment.

Precision displacement measurement using a modulating ESPI

Laser interferometry is widely used as a measuring system in many fields because of its high resolution and ability to measure a broad area in real-time all at once. In conventional LASER interferometry, for example Out-of-plane ESPI(Electronic Speckle Pattern Interferometry), In plane ESPI, Shearography and Holography, it uses PZT or other components as a phase shift instrumentation to extract 3D deformation data, vibration mode and others. However, in most cases PZT has some disadvantages, which include non-linear errors and limited time of use. In the present study, a new type of LASER interferometry using a laser diode is proposed. Using LASER Diode Sinusoidal Phase Modulating (LD-SPM) interferometry, the phase modulation can directly modulated by controlling the LASER Diode injection current thereby eliminating the need for PZT and its components. This makes the interferometry more compact. This paper reports on a new approach to the LD Modulating interferometry that involves four-bucket phase shift method. This study proposes a four-bucket phase mapping algorithm, which developed to have a guaranteed application, to stabilize the system in the field and to be a user-friendly GUI. In this paper, LD modulating interferometry had shown the theory for LD wavelength modulation and sinusoidal phase modulation. Four-bucket phase mapping algorithm then introduced.