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Dive into the research topics where L. Jallet is active.

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Featured researches published by L. Jallet.


IEEE Transactions on Instrumentation and Measurement | 1991

Characterization of diode detectors used in six-port reflectometers

E. Bergeault; Bernard Huyart; G. Geneves; L. Jallet

A method for characterizing in situ the diodes used as power detectors in six-port network analyzers is presented. The method requires only two unknown loads which are connected at the measurement ports. Measurement results obtained for one-port and two-port devices with a dual six-port realized in the 2-18-GHz frequency range are reported. In order to show the influence of frequency, these results are compared to those obtained using a midband characterization of the diode detectors. >


conference on precision electromagnetic measurements | 1993

A six-port reflectometer calibration using Schottky diodes operating in AC detection mode

S.A. Chahine; Bernard Huyart; E. Bergeault; L. Jallet

This works presents a six-port reflectometer in W frequency band (75-110 GHz) using Schottky diodes as power detectors. A linearization procedure and an AC detection technique are used to improve the measurement accuracy. In addition, a calibration procedure requiring two standards, a matched waveguide and a short circuit, is described. A comparison between experimental results obtained by the six-port reflectometer and other automatic network analyzers is presented. >


IEEE Transactions on Instrumentation and Measurement | 1997

On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements

G. Berghoff; E. Bergeault; Bernard Huyart; L. Jallet

The complete calibration of a double six-port network analyzer includes constants for the measurement of wave ratios (S-parameters) as well as constants for absolute power level measurements for nonlinear device characterization. This paper describes how a complete set of constants can be obtained for on-wafer measurements from a complete calibration in a coaxial measurement plane and a subsequent on-wafer calibration with the minimum number of elements.


conference on precision electromagnetic measurements | 1990

The design of a six-port reflectometer with frequency-independent calibration procedure

E. Bergeault; G. Geneves; B. Huyart; L. Jallet

The accuracy in the measurement of an unknown reflection coefficient using a six-port automatic network analyzer (ANA) depends in part on the stability of the calibration constants of the system. A six-port reflectometer whose configuration minimizes the variations of these parameters with frequency is described. The advantages of a six-port configuration include a weakly and slowly frequency-dependent calibration process. Consequently, uncertainties due to the variations of the six-port parameters with RF-source stability are reduced. There is no need for a synthesized source, and the number of calibration points can be reduced while the symmetrical distribution of the q/sub i/ points can be kept over the whole frequency range.<<ETX>>


conference on precision electromagnetic measurements | 1998

Source-pull and multiharmonic load-pull measurements based on six-port techniques

G. Berghoff; O. Gibrat; E. Bergeault; B. Huyart; L. Jallet

An original measurement system for nonlinear microwave power transistor characterization, using six-port reflectometers, is presented. It allows independent active tuning of the output impedances at f/sub 0/ and 2f/sub 0/ (multiharmonic load-pull) and variation of the source impedance at the input port at f/sub 0/ (source-pull). Experimental results are shown for a commercial GaAs MESFET power transistor.


conference on precision electromagnetic measurements | 1994

Large signal load-pull measurements using six-port reflectometers

F. Deshours; E. Bergeault; L. Jallet; Bernard Huyart

This paper describes an active load-pull measurement system, using two six-port junctions for nonlinear characterization of power transistors. Load-pull measurements on a 600 /spl mu/m MESFET have been performed at 2 GHz.<<ETX>>


conference on precision electromagnetic measurements | 2000

An automated multiharmonic source-pull/load-pull system based on six-port techniques

O. Gibrat; E. Bergeault; B. Huyart; L. Jallet; M. Rivier

We have improved our existing Source-Pull/Load-Pull setup to allow independent active tuning, both at fundamental and second harmonic frequency, of the load and source impedance of the device-under-test (DUT). We will present experimental results to validate the calibration procedure and to show the accuracy of the measurements.


Archive | 1996

Conception, rÉalisation et performances d’un analyseur de rÉseaux millimÉtrique À six accÈs

Soubhi Abou Chahine; Bernard Huyart; Eric Bergeault; L. Jallet

This paper presents the design, realization and performance of a six-port network analyzer in W frequency band (75–110 GHz). Schottky diodes operating in AC detection mode are used as power detectors. A new calibration method taking into consideration the imperfection components of the system, especially the flexible waveguide and the couplers is described. Finally, a comparison between experimental results performed with the six-port network analyzer and other measurement systems available in the W-band are presented.RésuméCet article présente la conception, la réalisation et les performances d’un analyseur de réseaux utilisant deux réflectomètres à six accès dans la bande de fréquence W (75–110 GHz). Des diodes Schottky fonctionnant dans un mode alternatif sont utilisées comme détecteurs de puissance. Une nouvelle méthode d’étalonnage tenant compte des imperfections des composants du système et notamment du guide souple et des coupleurs est proposée. Enfin, les résultats expérimentaux en réflexion ainsi qu’en transmission de divers dispositifs sont comparés à ceux obtenus par d’autres analyseurs de réseaux disponibles en bande W.Cet article presente la conception, la realisation et les performances d’un analyseur de reseaux utilisant deux reflectometres a six acces dans la bande de frequence W (75–110 GHz). Des diodes Schottky fonctionnant dans un mode alternatif sont utilisees comme detecteurs de puissance. Une nouvelle methode d’etalonnage tenant compte des imperfections des composants du systeme et notamment du guide souple et des coupleurs est proposee. Enfin, les resultats experimentaux en reflexion ainsi qu’en transmission de divers dispositifs sont compares a ceux obtenus par d’autres analyseurs de reseaux disponibles en bande W.


european microwave conference | 1994

A Millimeter Network Analyser Incorporating a Single Six-Port Junction

S. Abou chahine; Bernard Huyart; B. Vuijk; E. Bergeault; L. Jallet

This paper presents an Automatic Network Analyzer (ANA) using a single six-port junction in the W frequency band (75-110 GHz). Its analysis, design, and testing are described. A calibration procedure requiring two standards and a new calibration technique are used to determine the full scattering parameters of the DUT. Finally, a comparison between experimental results performed with the six-port network analyzer and the other measurement systems available in the W frequency band is presented.


Microwave and Optical Technology Letters | 1994

An active load‐pull measurement system using two six‐port reflectometers

F. Deshours; E. Bergeault; L. Jallet; Bernard Huyart

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B. Huyart

École Normale Supérieure

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G. Geneves

Conservatoire national des arts et métiers

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