L. Y. Li

High-temperature plasticity measurements using synchrotron X-rays

Synchrotron X-rays coupled with high-pressure deformation facilities have transformed the tools for studying the rheological properties of materials at high pressure and temperature. The new D-DIA device is capable of producing 15 GPa of pressure at 2000 K and simultaneously introducing a differential stress field that can attain steady state flow with strains reading in excess of 50%. X-ray transparent anvils enable diffraction in both the vertical and horizontal directions, providing sufficient information to define differential stress in the sample while the strain rate is monitored by X-ray images. This new tool opens the door to new studies relevant to the processes deep within the Earth, illuminating the dynamics of deep earthquakes and mantle flow.