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Dive into the research topics where Lars Johnsen is active.

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Featured researches published by Lars Johnsen.


Proceedings of SPIE | 2010

Next-generation test equipment for micro-production

Kay Gastinger; Lars Johnsen; Malgorzata Kujawinska; Michal Jozwik; Uwe D. Zeitner; Peter Dannberg; Jorge Albero; Sylwester Bargiel; Christoph Schaeffel; Stephan Beer; Rudolf Moosburger; Patrick Lambelet; Marco Pizzi

The paper introduces different approaches to overcome the large ratio between wafer size and feature size in the testing step of micro production. For the inspection of Micro(Opto)ElectroMechanicalSystems (M(O)EMS) a priori information are available to optimise the inspection process. The EU-project SMARTIEHS develops a new concept for high volume M(O)EMS testing. The design of the test station and the fabrication of the first components are presented and the advancements compared to the state of the art are introduced within the following fields: micro-optical interferometer design, micro-optical production, smart-pixel camera and mechanical design. Furthermore the first demonstrators are introduced and experimental results are presented.


Optical Measurement Systems for Industrial Inspection VII | 2011

Inspection of processes during silicon wafer sawing using low coherence interferometry in the near infrared wavelength region

Kay Gastinger; Lars Johnsen; Ove Simonsen; Astrid Aksnes

Multi-wire sawing of silicon wafers is a tribological process. Slurry consisting of small silicon carbide particles embedded in polyethyleneglycol carries out the abrasive material removal process. During this process small silicon chips are removed from the bulk material. Low coherence interferometry (LCI) is widely used for high accuracy surface topography measurements of materials. This paper presents an application of LCI where the surface of a material (silicon) is inspected from the inside. Light in the near infrared (NIR) wavelength region is used. High spatial resolution is necessary to be able to observe the processes on the micro scale. Therefore a modified solid immersion approach is suggested. That makes it possible to reach a spatial resolution in the range of the illumination wavelength. The topography changes produced by the chippings are in the range of some micrometers. To be able to estimate the volumes of the Si chippings interferometric phase measurements are applied.


Tenth International Conference on Optical Fibre Sensors | 1994

Practical fiber optic sensor for measuring large mechanical deformations

Kjetil Johannessen; Lars Johnsen

A fiber-optic sensor for measuring large mechanical deformations based on a digital use of fringes in a polarimeter was developed and tested in the laboratory. Two sensors were mounted on an air cushion catamaran and used for measuring strain in the fiberglass laminates and thereby also the relative movement of the two hulls. The data were logged together with other ship movement data and provided useful information on the craft performance.


Archive | 2010

FENESTRATION SYSTEM WITH SOLAR CELLS

Tore Kolås; Ragnar Fagerberg; Lars Johnsen


Journal of Thermal Science and Engineering Applications | 2012

Heat Transfer During Multiwire Sawing of Silicon Wafers

Lars Johnsen; Jan Erik Olsen; Trond Bergstrøm; Kay Gastinger


Proceedings of SPIE, the International Society for Optical Engineering | 2010

Near infrared low coherence speckle interferometry (NIR-LCSI) as a tool for the investigation of silicon in solar cell production

Kay Gastinger; Lars Johnsen


world conference on photovoltaic energy conversion | 2011

Transflection, a new illumination technique for in line crack detection in crystalline silicon wafers

Lars Johnsen


world conference on photovoltaic energy conversion | 2011

Microscopic Near Infrared (NIR) Investigation of the Fundamental Abrasion Process in Wire Sawing of Silicon

A. Aksnes; O. Simonsen; N. Espallargas; K. Gastinger; S.N. Armada; Lars Johnsen


world conference on photovoltaic energy conversion | 2010

Microscopic Near Infrared (NIR) Imaging for Investigation of the Saw-Channel Surface During Wire-Sawing of Silicon

Lars Johnsen; Kay Gastinger


Archive | 2004

Multiplexeur/demultiplexeur optique et egaliseur de canaux

Ragnar Fagerberg; Steinar Neegård; Kjetil Johannessen; Lars Johnsen

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Astrid Aksnes

Norwegian University of Science and Technology

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Ove Simonsen

Norwegian University of Science and Technology

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Malgorzata Kujawinska

Warsaw University of Technology

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Michal Jozwik

Warsaw University of Technology

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Jorge Albero

Centre national de la recherche scientifique

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Sylwester Bargiel

Centre national de la recherche scientifique

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