Leif Glaser

Absolute cross sections for photoionization of Xeq + ions (1 q 5) at the 3d ionization threshold

The photon-ion merged-beams technique has been employed at the new Photon-Ion spectrometer at PETRA III for measuring multiple photoionization of Xeq + (q = 1–5) ions. Total ionization cross sections have been obtained on an absolute scale for the dominant ionization reactions of the type hν + Xeq + → Xer + + (q − r)e− with product charge states q + 2 ≤ r ≤ q + 5. Prominent ionization features are observed in the photon-energy range 650–750 eV, which are associated with excitation or ionization of an inner-shell 3d electron. Single-configuration Dirac–Fock calculations agree quantitatively with the experimental cross sections for non-resonant photoabsorption, but fail to reproduce all details of the measured ionization resonance structures.

Nanometer resolution optical coherence tomography using broad bandwidth XUV and soft X-ray radiation.

Optical coherence tomography (OCT) is a non-invasive technique for cross-sectional imaging. It is particularly advantageous for applications where conventional microscopy is not able to image deeper layers of samples in a reasonable time, e.g. in fast moving, deeper lying structures. However, at infrared and optical wavelengths, which are commonly used, the axial resolution of OCT is limited to about 1 μm, even if the bandwidth of the light covers a wide spectral range. Here, we present extreme ultraviolet coherence tomography (XCT) and thus introduce a new technique for non-invasive cross-sectional imaging of nanometer structures. XCT exploits the nanometerscale coherence lengths corresponding to the spectral transmission windows of, e.g., silicon samples. The axial resolution of coherence tomography is thus improved from micrometers to a few nanometers. Tomographic imaging with an axial resolution better than 18 nm is demonstrated for layer-type nanostructures buried in a silicon substrate. Using wavelengths in the water transmission window, nanometer-scale layers of platinum are retrieved with a resolution better than 8 nm. XCT as a nondestructive method for sub-surface tomographic imaging holds promise for several applications in semiconductor metrology and imaging in the water window.

Single Shot Polarization Characterization of XUV FEL Pulses from Crossed Polarized Undulators

Polarization control is a key feature of light generated by short-wavelength free-electron lasers. In this work, we report the first experimental characterization of the polarization properties of an extreme ultraviolet high gain free-electron laser operated with crossed polarized undulators. We investigate the average degree of polarization and the shot-to-shot stability and we analyze aspects such as existing possibilities for controlling and switching the polarization state of the emitted light. The results are in agreement with predictions based on Gaussian beams propagation.

Characterization of spatial coherence of synchrotron radiation with non-redundant arrays of apertures.

A method to characterize the spatial coherence of soft X-ray radiation from a single diffraction pattern is presented. The technique is based on scattering from non-redundant arrays (NRAs) of slits and records the degree of spatial coherence at several relative separations from 1 to 15 µm, simultaneously. Using NRAs the spatial coherence of the X-ray beam at the XUV X-ray beamline P04 of the PETRA III synchrotron storage ring was measured as a function of different beam parameters. To verify the results obtained with the NRAs, additional Youngs double-pinhole experiments were conducted and showed good agreement.

Polarization measurement of free electron laser pulses in the VUV generated by the variable polarization source FERMI

FERMI, based at Elettra (Trieste, Italy) is the first free electron laser (FEL) facility operated for user experiments in seeded mode. Another unique property of FERMI, among other FEL sources, is to allow control of the polarization state of the radiation. Polarization dependence in the study of the interaction of coherent, high field, short-pulse ionizing radiation with matter, is a new frontier with potential in a wide range of research areas. The first measurement of the polarization-state of VUV light from a single-pass FEL was performed at FERMI FEL-1 operated in the 52 nm-26 nm range. Three different experimental techniques were used. The experiments were carried out at the end-station of two different beamlines to assess the impact of transport optics and provide polarization data for the end user. In this paper we summarize the results obtained from different setups. The results are consistent with each other and allow a general discussion about the viability of permanent diagnostics aimed at monitoring the polarization of FEL pulses.

Angle resolved photoelectron spectroscopy of two-color XUV-NIR ionization with polarization control.

Electron emission caused by extreme ultraviolet (XUV) radiation in the presence of a strong near infrared (NIR) field leads to multiphoton interactions that depend on several parameters. Here, a comprehensive study of the influence of the angle between the polarization directions of the NIR and XUV fields on the two-color angle-resolved photoelectron spectra of He and Ne is presented. The resulting photoelectron angular distribution strongly depends on the orientation of the NIR polarization plane with respect to that of the XUV field. The prevailing influence of the intense NIR field over the angular emission characteristics for He(1s) and Ne(2p) ionization lines is shown. The underlying processes are modeled in the frame of the strong field approximation (SFA) which shows very consistent agreement with the experiment reaffirming the power of the SFA for multicolor-multiphoton ionization in this regime.

Photoelectron angular distribution studies of the outer valence states of N2

We present angle resolved photoelectron data for the ionization of all N2 outer valence shells namely the 3σg, 1πu and 2σu states in the photon energy region from 19 to 50 eV with a photon energy step width down to 20 meV. Signatures due to the autoionization of doubly excited Rydberg states and the corresponding vibrational progression are observed in the dipole electron angular distribution parameter β. They are compared with recent calculations. We also find evidence for theoretically predicted sharp resonance effects due to channel coupling in the electron angular distribution of 1 π−1u. Shape resonance and channel coupling effects are discussed for all outer valence orbitals with respect to recent theoretical findings.

Note: Soft X-ray transmission polarizer based on ferromagnetic thin films

A transmission polarizer for producing elliptically polarized soft X-ray radiation from linearly polarized light is presented. The setup is intended for use at synchrotron and free-electron laser beamlines that do not directly offer circularly polarized light for, e.g., X-ray magnetic circular dichroism (XMCD) measurements or holographic imaging. Here, we investigate the degree of ellipticity upon transmission of linearly polarized radiation through a cobalt thin film. The experiment was performed at a photon energy resonant to the Co L3-edge, i.e., 778 eV, and the polarization of the transmitted radiation was determined using a polarization analyzer that measures the directional dependence of photo electrons emitted from a gas target. Elliptically polarized radiation can be created at any absorption edge showing the XMCD effect by using the respective magnetic element.

Oscillatory behavior of the valence photoionization properties of N2 and O2 due to coherent photoelectron emission from two sites

Coherent two-center photoelectron emission has been predicted for all electron subshells. So far, however, is has been only proven for the innermost 1s-subshell only. We present first results for the valence photoionization of N2 and O2 showing oscillatory behavior in both, the partial cross section σ and the angular distribution asymmetry parameter β.