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Featured researches published by Ling Xie.


Nanotechnology | 2016

Shrinking of silicon nanocrystals embedded in an amorphous silicon oxide matrix during rapid thermal annealing in a forming gas atmosphere

M. van Sebille; A. Fusi; Ling Xie; Hasan Ali; R.A.C.M.M. van Swaaij; Klaus Leifer; Miro Zeman

We report the effect of hydrogen on the crystallization process of silicon nanocrystals embedded in a silicon oxide matrix. We show that hydrogen gas during annealing leads to a lower sub-band gap absorption, indicating passivation of defects created during annealing. Samples annealed in pure nitrogen show expected trends according to crystallization theory. Samples annealed in forming gas, however, deviate from this trend. Their crystallinity decreases for increased annealing time. Furthermore, we observe a decrease in the mean nanocrystal size and the size distribution broadens, indicating that hydrogen causes a size reduction of the silicon nanocrystals.


Journal of Applied Physics | 2013

Optoelectronic properties of p-i-n heterojunctions based on germanium nanocrystals

Stéphanie Parola; Etienne Quesnel; Viviane Muffato; Ling Xie; Klaus Leifer; J. Coignus; A. Slaoui

We investigated the possibility of using physical vapour deposited Ge nanocrystals (NCs) in optoelectronic devices such as solar cells. We have prepared p-i-n heterojunctions based on p+-doped Si substrate/undoped Ge NCs/ZnO:Al layer stacks and their optoelectronic properties were characterised. Under light, the generation of photo-carriers from the Ge NCs themselves was demonstrated. The photovoltaic behaviour of the p-i-n structure was also highlighted, with a measured Voc of 224 mV compared to 580 mV in theory. The discrepancy between theory and experiment was discussed on the basis of TEM observations, optical and carrier generation measurements as well as modelling.


Ultramicroscopy | 2018

Quantitative EMCD by use of a double aperture for simultaneous acquisition of EELS

Hasan Ali; Tobias Warnatz; Ling Xie; Björgvin Hjörvarsson; Klaus Leifer

The weak signal strength in electron magnetic circular dichroism (EMCD) measurements remains one of the main challenges in the quantification of EMCD related EELS spectra. As a consequence, small variations in peak intensity caused by changes of background intervals, choice of method for extraction of signal intensity and equally differences in sample quality can cause strong changes in the EMCD signal. When aiming for high resolution quantitative EMCD, an additional difficulty consists in the fact that the two angular resolved EELS spectra needed to obtain the EMCD signal are taken at two different instances and it cannot be guaranteed that the acquisition conditions for these two spectra are identical. Here, we present an experimental setup where we use a double hole aperture in the transmission electron microscope to obtain the EMCD signal in a single acquisition. This geometry allows for the parallel acquisition of the two electron energy loss spectra (EELS) under exactly the same conditions. We also compare the double aperture acquisition mode with the qE acquisition mode which has been previously used for parallel acquisition of EMCD. We show that the double aperture mode not only offers better signal to noise ratio as compared to qE mode but also allows for much higher acquisition times to significantly improve the signal quality which is crucial for quantitative analysis of the magnetic moments.


Nano Letters | 2018

Ultra-strong translucent glass ceramic with nanocrystalline, biomimetic structure

Le Fu; Ling Xie; Wenbo Fu; Shuanglin Hu; Zhi-Bin Zhang; Klaus Leifer; Håkan Engqvist; Wei Xia

Transparent/translucent glass ceramics (GCs) have broad applications in biomedicine, armor, energy, and constructions. However, GCs with improved optical properties typically suffer from impaired mechanical properties, compared to traditional sintered full-ceramics. We present a method of obtaining high-strength, translucent GCs by preparing ZrO2-SiO2 nanocrystalline glass ceramics (NCGCs) with a microstructure of monocrystalline ZrO2 nanoparticles (NPs), embedded in an amorphous SiO2 matrix. The ZrO2-SiO2 NCGC with a composition of 65%ZrO/35%SiO2 (molar ratio, 65Zr) achieved an average flexural strength of 1 GPa. This is one of the highest flexural strength values ever reported for GCs. ZrO2 NPs bond strongly with SiO2 matrix due to the formation of a thin (2-3 nm) amorphous Zr/Si interfacial layer between the ZrO2 NPs and SiO2 matrix. The diffusion of Si atoms into the ZrO2 NPs forms a Zr-O-Si superlattice. Electron tomography results show that some of the ZrO2 NPs are connected in one direction, forming in situ ZrO2 nanofibers (with length of ∼500 nm), and that the ZrO2 nanofibers are stacked in an ordered way in all three dimensions. The nanoarchitecture of the ZrO2 nanofibers mimics the architecture of mineralized collagen fibril in cortical bone. Strong interface bonding enables efficient load transfer from the SiO2 matrix to the 3D nanoarchitecture built by ZrO2 nanofibers and NPs, and the 3D nanoarchitecture carries the majority of the external load. These two factors synergistically contribute to the high strength of the 65Zr NCGC. This study deepens our fundamental understanding of the microstructure-mechanical strength relationship, which could guide the design and manufacture of other high-strength, translucent GCs.


The 16th European Microscopy Congress 28 August - 2 September 2016, Lyon France | 2016

TEM analysis of multilayered nanostructures formed in the rapid thermal annealed silicon rich silicon oxide film

Hasan Ali; Ling Xie; Martijn van Sebille; Adele Fusi; René A. C. M. M. van Swaaij; Miro Zeman; Klaus Leifer

Silicon (Si) nanoparticles (NPs) embedded in an ultrathin silicon rich silicon oxide (SRSO) film through the thermal annealing process has emerged as a highly absorbing layer for third-generation s ...


Nanoscale | 2015

Nanocrystal size distribution analysis from transmission electron microscopy images

Martijn van Sebille; Laurens van der Maaten; Ling Xie; Karol Jarolimek; Rudi Santbergen; René A. C. M. M. van Swaaij; Klaus Leifer; Miro Zeman

We propose a method, with minimal bias caused by user input, to quickly detect and measure the nanocrystal size distribution from transmission electron microscopy (TEM) images using a combination of Laplacian of Gaussian filters and non-maximum suppression. We demonstrate the proposed method on bright-field TEM images of an a-SiC:H sample containing embedded silicon nanocrystals with varying magnifications and we compare the accuracy and speed with size distributions obtained by manual measurements, a thresholding method and PEBBLES. Finally, we analytically consider the error induced by slicing nanocrystals during TEM sample preparation on the measured nanocrystal size distribution and formulate an equation to correct this effect.


Physica Status Solidi (a) | 2013

Silicon nanocrystals: Novel synthesis routes for photovoltaic applications

Simon Perraud; Etienne Quesnel; Stéphanie Parola; Jérémy Barbé; Viviane Muffato; Pascal Faucherand; Christine Morin; Karol Jarolimek; René A. C. M. M. van Swaaij; Miro Zeman; Stephen P. Richards; Andrew J. Kingsley; Hugh Doyle; Keith Linehan; Shane O'Brien; Ian M. Povey; Martyn E. Pemble; Ling Xie; Klaus Leifer; K. Makasheva; Bernard Despax


Journal of Sol-Gel Science and Technology | 2015

Indium tin oxide–silicon nanocrystal nanocomposite grown by aerosol assisted chemical vapour deposition

Shane O'Brien; Keith Linehan; Hugh Doyle; Andrew J. Kingsley; Chris Ashfield; Bettina Frank; Ling Xie; Klaus Leifer; Philippe Thony; Simon Perraud; Martyn E. Pemble; Ian M. Povey


Thin Solid Films | 2012

Silicon nanocrystals on amorphous silicon carbide alloy thin films : Control of film properties and nanocrystals growth

Jérémy Barbé; Ling Xie; Klaus Leifer; Pascal Faucherand; Christine Morin; Dario Rapisarda; Eric De Vito; K. Makasheva; Bernard Despax; Simon Perraud


world conference on photovoltaic energy conversion | 2013

Nanostructure Analysis of P-Doped Nanocrystalline Silicon Oxide

Ahm Arno Smets; Miro Zeman; Hairen Tan; M. van Sebille; B. van Veen; Ling Xie; H. Lopez; Pavel Babal

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Miro Zeman

Delft University of Technology

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Simon Perraud

Centre national de la recherche scientifique

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Karol Jarolimek

Delft University of Technology

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