Liu Guo-Lei

Variations from Zn1−xCoxO Magnetic Semiconductor to Co–ZnCoO Granular Composite

We investigate the variations from as-deposited Zn1−xCoxO magnetic semiconductors to the post-annealed Co–ZnCoO granular composite. The as-deposited Zn1−xCoxO magnetic semiconductor deposited under thermal non-equilibrium conditions is composed of Zn1−xCoxO nanograins of high Co concentration. The room-temperature ferromagnetism with high magnetization and large negative magnetoresistance are found in the as-deposited samples. By annealing, the samples become of granular composite consisting of the Co metal grains and the remanent Zn1−xCoxO matrix. Although the magnetization is enhanced after annealing, the spin-dependent negative magnetoresistance disappears at room temperature. The magnetoresistance observed in the annealed samples in the high field region has no relation with the ferromagnetism, which in turn indicates that the room-temperature ferromagnetism and large negative magnetoresistance observed in the as-deposited are the intrinsic properties of the Zn1−xCoxO magnetic semiconductor.

Room-Temperature Anisotropic Ferromagnetism in Fe-Doped In2O3 Heteroepitaxial Films

Fe-doped In2O3 films are grown epitaxially on YSZ (100) substrates by pulsed laser deposition. The in-situ reflection high-energy electron diffraction, the atomic force microscopy, and the x-ray diffraction patterns show that the films have a well defined cubic structure epitaxially oriented in the (100) direction. Room temperature ferromagnetism is observed by an alternating gradient magnetometer. Strong perpendicular magnetic anisotropy with a remnant magnetization ratio of 0.83 and a coercivity of 2.5kOe is revealed. Both the structural and the magnetic measurements suggest that this ferromagnetism is an intrinsic property deriving from the spin-orbit coupling between the diluted Fe atoms.

Structural and physical properties of BiFeO3 thin films epitaxially grown on SrTiO3 (001) and polar (111) surfaces

The influence of surface polarity on the structural properties of BiFeO3 (BFO) thin films is investigated. BFO thin films are epitaxially grown on SrTiO3 (STO) (100) and polar (111) surfaces by oxygen plasma-assisted molecular beam epitaxy. It is shown that the crystal structure, surface morphology, and defect states of BFO films grown on STO substrates with nonpolar (001) or polar (111) surfaces perform very differently. BFO/STO (001) is a fully strained tetragonal phase with orientation relationship (001)[100]BFO||(001)[100]STO, while BFO/STO (111) is a rhombohedral phase. BFO/STO (111) has rougher surface morphology and less defect states, which results in reduced leakage current and lower dielectric loss. Moreover, BFO films on both STO (001) and STO (111) are direct band oxides with similar band gaps of 2.65 eV and 2.67 eV, respectively.

Ferromagnetism, variable range hopping, and the anomalous Hall effect in epitaxial Co:ZnO thin film

A series of high quality single crystalline epitaxial Zn0.95Co0.05O thin films is prepared by molecular beam epitaxy. Superparamagnetism and ferromagnetism are observed when the donor density is manipulated in a range of 1018 cm−3−1020 cm−3 by changing the oxygen partial pressure during film growth. The conduction shows variable range hopping at low temperature and thermal activation conduction at high temperature. The ferromagnetism can be maintained up to room temperature. However, the anomalous Hall effect is observed only at low temperature and disappears above 160 K. This phenomenon can be attributed to the local ferromagnetism and the decreased optimal hopping distance at high temperatures.

Epitaxial Properties of Co-Doped ZnO Thin Films Grown by Plasma Assisted Molecular Beam Epitaxy

High quality Co-doped ZnO thin films are grown on single crystalline Al2O3(0001) and ZnO(0001) substrates by oxygen plasma assisted molecular beam epitaxy at a relatively lower substrate temperature of 450°C. The epitaxial conditions are examined with in-situ reflection high energy electron diffraction (RHEED) and ex-situ high resolution x-ray diffraction (HRXRD). The epitaxial thin films are single crystal at film thickness smaller than 500 nm and nominal concentration of Co dopant up to 20%. It is indicated that the Co cation is incorporated into the ZnO matrix as Co2+ substituting Zn2+ ions. Atomic force microscopy shows smooth surfaces with rms roughness of 1.9 nm. Room-temperature magnetization measurements reveal that the Co-doped ZnO thin films are ferromagnetic with Curie temperatures TC above room temperature.

Oscillation of coercivity between positive and negative in MnxGe1?x:H ferromagnetic semiconductor films

Amorphous MnxGe1−x:H ferromagnetic semiconductor films prepared in mixed Ar with 20% H2 by magnetron co-sputtering show global ferromagnetism with positive coercivity at low temperatures. With increasing temperature, the coercivity of MnxGe1−x:H films first changes from positive to negative, and then back to positive again, which was not found in the corresponding MnxGe1−x and other ferromagnetic semiconductors before. For Mn0.4Ge0.6:H film, the inverted Hall loop is also observed at 30 K, which is consistent with the negative coercivity. The negative coercivity is explained by the antiferromagnetic exchange coupling between the H-rich ferromagnetic regions separated by the H-poor non-ferromagnetic spacers. Hydrogenation is a useful method to tune the magnetic properties of MnxGe1−x films for the application in spintronics.

Growth and photoluminescence properties of inclined ZnO and ZnCoO thin films on SrTiO3(110) substrates

ZnO thin film growth prefers different orientations on the etched and unetched SrTiO3(STO)(110) substrates. Inclined ZnO and cobalt-doped ZnO (ZnCoO) thin films are grown on unetched STO(110) substrates using oxygen plasma assisted molecular beam epitaxy, with the c-axis 42? inclined from the normal STO(110) surface. The growth geometries are ZnCoO[100]//STO[11?0] and ZnCoO[11?1]//STO[001]. The low temperature photoluminescence spectra of the inclined ZnO and ZnCoO films are dominated by D0X emissions associated with A0X emissions, and the characteristic emissions for the 2E(2G)?4A2(4F) transition of Co2+ dopants and the relevant phonon-participated emissions are observed in the ZnCoO film, indicating the incorporation of Co2+ ions at the lattice positions of the Zn2+ ions. The c-axis inclined ZnCoO film shows ferromagnetic properties at room temperature.

Electric and Magnetic Field Tunable Rectification and Magnetoresistance in FexGe1?x/Ge Heterojunction Diodes

FexGe1?x/Ge amorphous heterojunction diodes with p-FexGe1?x ferromagnetic semiconductor layers are grown on single-crystal Ge substrates of p-type, n-type and intrinsic semiconductors, respectively. The I?V curves of p-Fe0.4Ge0.6/p-Ge diodes only show slight changes with temperature or with magnetic field. For the p-Fe0.4Ge0.6/n-Ge diode, good rectification is maintained at room temperature. More interestingly, the I?V curve of the p-Fe0.4Ge0.6/i-Ge diode can be tuned by the magnetic field, indicating a large positive magnetoresistance. The resistances of the junctions decrease with the increasing temperature, suggesting a typical semiconductor transport behavior. The origin of the positive magnetoresistance is discussed based on the effect of the electric and magnetic field on the energy band structures of the interface.

Enhanced Spin Injection into ZnO Semiconductor Measured by Magnetoresistance

We prepare 2×(NiFe/CoZnO)/ZnO/(CoZnO/Co)×2 spin valve structures used for spin injection by sputtering and photolithography. In the junctions, the free magnetic layer 2×(NiFe/CoZnO) and the fixed magnetic layer (CoZnO/Co)×2 are used to realize the spin valve functions in the external switch magnetic field. Since the wide gap semiconductor ZnO layer is located between the two magnetic semiconductor layers CoZnO, the electrical spin injection from the magnetic semiconductor CoZnO into the non-magnetic semiconductor ZnO is realized. Based on the measured magnetoresistance and the Schmidt model, the spin polarization ratio in the ZnO semiconductor is deduced to be 11.7% at 90 K and 7.0% at room temperature, respectively.