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Long Yin

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Publication

Featured researches published by Long Yin.

Archive | 2015

Detection method of scanning electron microscope

Ni Qiliang; Chen Honglin; Long Yin; Guo Mingsheng

Archive | 2014

Monitoring method of stability of crystal edge detector

Zhu Lujun; Chen Honglin; Ni Qiliang; Long Yin; Guo Mingsheng; Wang Kai

Archive | 2013

Wafer defect defection method and system

Wang Zhounan; Long Yin; Ni Qiliang; Chen Honglin; Guo Mingsheng

Archive | 2015

Synchronous defect detecting method for memorizer

Ni Qiliang; Chen Honglin; Long Yin; Gu Xiaofang

Archive | 2014

Electron beam defect detection method

Ni Qiliang; Chen Honglin; Long Yin

Archive | 2013

Method for measuring and calculating alignment deviation of contact holes and polycrystalline silicon gates

Fan Rongwei; Gu Xiaofang; Long Yin; Ni Qiliang; Chen Honglin

Archive | 2013

Quick efficient wafer back defect identification method

Ni Qiliang; Chen Honglin; Long Yin; Wang Kai

Archive | 2014

Method for conducting quantization monitoring on process window for etching through holes

Ni Qiliang; Chen Honglin; Long Yin

Archive | 2014

Method for detecting diffusivity of wellblock implantation ions in different concentrations

Fan Rongwei; Ni Qiliang; Long Yin; Wang Kai; Chen Honglin

Archive | 2013

Method for reducing defects on aluminum gasket surface

Zhao Wanjin; Hu Binbin; Liu Rui; Long Yin; Ni Qiliang; Chen Honglin

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Collaboration

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