Ludwig J. Gauckler

Electrochemical Characterization of Micro-Patterned La0,6Sr0,4Co0,2Fe0,8O3 Thin Film Structures on Fused Silica

The polarization resistance of solid oxide fuel cell (SOFC) cathodes strongly depends on the structure of the cathode-electrolyte interface. Therefore measurements of the polarization resistance of cathode thin films on electrolyte thin films are required in order to predict the performance of thin film SOFCs. In this study La0,6Sr0,4Co0,2Fe0,8O3 (LSCF) thin films were deposited by pulsed laser deposition on fused silica wafers carrying pre-structured Pt/Ta electrodes and a (Y2O3)0.08(ZrO2)0.92 (YSZ) thin film. Photolithography and argon sputtering were used to fabricate micro-patterns which proved to be applicable for the simultaneous characterization of LSCF thin films with respect to electrical in-plane and cross-plane conductivity as well as polarization resistance. In the future such test platforms are destined for the characterization of different cathode thin films with respect to conduction and oxygen reduction properties.