M. Camp

Susceptibility of some electronic equipment to HPEM threats

In this paper, an overview of the susceptibility of a large number of different electronic devices like computer networks, computer systems, microprocessor boards, microcontrollers, and other basic integrated circuits (ICs) to different threats like electromagnetic pulse (EMP), ultrawideband (UWB), and high-power microwave pulses (HPM) is given. The presented data will include a comparison of the HPM and UWB susceptibility of some devices and a deeper look into the destruction effects in ICs. Therefore, the ICs were opened and the destruction effects were investigated. A norm based approach to describe the threat of different pulses to electronic devices gives a theoretical explanation for the measured susceptibility data.

Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis

Reproducible prediction of damaging effects is one of the main problems in intentional electromagnetic interference (IEMI). In this paper, the susceptibility of different types of single microcontrollers to unipolar fast rise time pulses [electromagnetic pulse (EMP), ultrawide band (UWB)] is determined. Therefore, pulses with rise times as fast as 100 ps and electric field amplitudes of up to 100 kV/m are applied to the devices. The results are generalized with a novel statistical procedure. Following discussion and rationale, the Weibull distribution is selected to describe the interference behavior. The statistical analysis provides a new test procedure for a confident determination of the interference behavior parameters.

Parameter estimation of double exponential pulses (EMP, UWB) with least squares and Nelder Mead algorithm

Transient test pulses like electromagnetic pulse and ultrawide-band are commonly described by rise time t/sub r/, pulse length t/sub fwhm/ and the maximum amplitude E/spl circ/. Simulating the effects of varying pulses an analytical description of the pulses is necessary, which is given by a double exponential form with the parameters /spl alpha/, /spl beta/ and E/sub 0/. This paper describes the link between the parameters t/sub r/, t/sub fwhm/ and E/spl circ/ on the one side and the analytical parameters /spl alpha/, /spl beta/ and E/sub 0/ on the other side. It is shown that the Nelder Mead simplex algorithm in combination with the least squares method is appropriate to determine an analytical relationship between these parameters. There with extensive analysis of double exponential pulse shapes with far-ranging parameters is possible in a considerably smaller computing time.

Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses

In this paper the influence of TTL- and CMOS-technology on the destruction effects of semiconductors by impact of EMP and UWB pulses is determined. Different logic devices like NANDs and inverters were exposed to high amplitude transient pulses.

Susceptibility of Personal Computer Systems to Fast Transient Electromagnetic Pulses

In this paper, the susceptibility of personal computer systems (mainboard class vary from 8088 processor based system up to Pentium III system) to fast transient electromagnetic pulses (EMP) with double exponential pulse shapes [EMP, ultra wideband (UWB)] is determined. The influence of computer generation, random access memory (RAM)-values, program states, and pulse shapes, as well as the destruction thresholds of single personal computer (PC)-components [central processing unit (CPU), RAM, basic input/output system (BIOS), mainboard] have been investigated. The major result is that susceptibility increases significantly with each computer generation

UWB and EMP susceptibility of modern electronics

The susceptibility of different types of single microcontrollers and complex microprocessor-boards to unipolar fast rise time pulses is determined. Rise times down to 100 ps and field amplitudes up to 50 kV/m have been applied to the devices.

Coupling of transient ultra wide band electro-magnetic fields to complex electronic systems

In this paper the coupling of transient ultra wide band field pulses to complex electronic systems is determined. Different test setups of microcontroller circuits were used to investigate the coupling effects and to describe the injected interference parameters.

Hardware and software simulation of transient pulse impact on integrated circuits

In this paper the destruction effects of semiconductor devices after impact of fast transient electromagnetic pulses are investigated Different logic devices like NANDs and inverter were exposed to high amplitude transient pulses. The pulses have been applied as field threats and as conducted threats. Furthermore a simulation of the destruction effects with the finite element method (FEM) has been performed.

Classification of the Destruction Effects in CMOS-Devices after Impact of Fast Transient Electromagnetic Pulses

In this investigation the destruction effects in CMOS-devices after impact of fast transient electromagnetic pulses have been classified. In comparison with TTL-devices, identical CMOS-devices are much more complex concerning the layout. Anyway, the destruction effects are similar to the destruction effects observed at TTL-devices in previous investigations (Ref. 1). In this paper a classification concerning the location areas have been performed. It will be shown that first, at lower field amplitudes, the input protection circuits of the tested CMOS-devices are damaged. If the amplitude increases additional destructions of the output circuits appear. Further increase leads to destructions directly inside the electronic circuit (between input and output circuits).

Transient emission behavior of leaky section cables for wireless applications

A radiating cable functions both as a transmission line and as an antenna. Thus this cable type can be applied as a radiating respectively receiving antenna for modern communication systems. Although underground communication systems using radiating cables operate worldwide in road tunnels and subways, there is another interesting application for this cable. They can provide multi-band aircraft cabin communications like WLAN, GSM, UMTS, DECT X2X. The system integration process requires detailed information about the radiation and transmission behavior as well as the interference potential of the leaky cable in a large frequency range. Therefore, different, partly novel measurement techniques is presented, which can be used to determine these parameters of the radiating cable. The measurements in the different test sites were carried out in frequency domain respectively in time domain.