M. Cesaria

Poly-(3-hexylthiophene)/[6,6]-phenyl-C61-butyric-acid-methyl-ester bilayer deposition by matrix-assisted pulsed laser evaporation for organic photovoltaic applications

A poly-(3-hexylthiophene) (P3HT)/[6,6]-phenyl-C61-butyric-acid-methyl-ester (PCBM) bilayer structure has been realized by single step matrix-assisted pulsed laser evaporation (ss-MAPLE) technique using the same solvent for both the polymers under vacuum conditions. Our ss-MAPLE procedure allows the fabrication of polymeric multilayer device stacks, which are very difficult to realize with the conventional solvent assisted deposition methods. A proof of concept bilayer P3HT/PCBM solar cell based on ss-MAPLE deposition has been realized and characterized. This demonstration qualifies ss-MAPLE as a general and alternative technique for the implementation of polymeric materials in hetero-structure device technology.

Realistic absorption coefficient of ultrathin films

Both a theoretical algorithm and an experimental procedure are discussed of a new route to determine the absorption/scattering properties of thin films deposited on transparent substrates. Notably, the non-measurable contribution of the film–substrate interface is inherently accounted for. While the experimental procedure exploits only measurable spectra combined according to a very simple algorithm, the theoretical derivation does not require numerical handling of the acquired spectra or any assumption on the film homogeneity and substrate thickness. The film absorption response is estimated by subtracting the measured absorption spectrum of the bare substrate from that of the film on the substrate structure but in a non-straightforward way. In fact, an assumption about the absorption profile of the overall structure is introduced and a corrective factor accounting for the relative film-to-substrate thickness. The method is tested on films of a well known material (ITO) as a function of the film structural quality and influence of the film–substrate interface, both deliberately changed by thickness tuning and doping. Results are found fully consistent with information obtained by standard optical analysis and band gap values reported in the literature. Additionally, comparison with a conventional method demonstrates that our route is generally more accurate even if particularly suited for very thin films.

LSMO – growing opportunities by PLD and applications in spintronics

Ferromagnetic materials exhibiting at room temperature combination of good conductivity, magnetic and opto-electronic properties are needed for the development of functional spin-devices. Mixed-valence LSMO is an optimal source of fully spin-polarized carriers and shows a rich physics of magnetic phases and transport mechanisms. Many factors, such as growth temperature, oxygen stoichiometry, temperature-dependent oxygen desorption rate, structural matching between the growing film and substrate, film thickness, and defects, influence the LSMO properties. Stabilization of ferromagnetic and conductive behaviours is linked to structural order. Therefore a growth approach allowing congruent deposition of complex materials under controlled, reproducible and tunable conditions is strongly needed. In this respect pulsed laser deposition reveals a well-suited choice. This review aims to give an overview on LSMO thin film properties, deposition and applications, especially in the emerging organic spintronics.

Unconventional Production of Bright White Light Emission by Nd-Doped and Nominally Un-Doped

We report the production of a broad band (ranging from 400 to 900 nm) white light following the monochromatic infrared light (803.5 and 975 nm) excitation of both nominally un-doped and Nd3+-doped Y2O3 nano-powders, even up to 20% of Nd3+ content. Experimental results indicate that such emission feature is a nano-scale phenomenon, cannot be ascribed to an overlap of sharp emission bands in the un-doped case and, even if assisted by the Nd34 presence, is a host matrix-related process. The measured white light emission is strongly dependent on either environment pressure (a pressure threshold occurs) or pumping power. The rising patterns of the white light emission were found to increase faster for either increasing Nd3+ content and pumping power or decreasing particle size. Notably, high correlated color temperature (2756 K), color rendering index (99), and efficiency (864 lx/W) values were measured for the un-doped sample under 803.5 nm exciting wavelength.

\hbox{Y}_{2}\hbox{O}_{3}

The matrix assisted pulsed laser evaporation (MAPLE) technique is emerging as an alternative route to conventional deposition methods of organic materials (solution-phase and thermal evaporation approaches). However, the high surface roughness of the films deposited by MAPLE makes this technique not compatible with applications in electronics and photonics. In this paper we report the deposition of MAPLE-films of a green light emitting polymer, commercially named ADS125GE, with remarkable low roughness values, down to about 10 nm at the thickness conventionally used in photonic devices (~40 nm). This issue is discussed as a function of polymer concentration, target-substrate distance and substrate rotation based on AFM topography images, roughness estimation and optical (absorption and luminescent) measurements. In addition we have fabricated an organic light emitting diode with this technique using the best deposition parameters which guarantee the lowest roughness. These results open the way to MAPLE applications in organic photonics and opto-electronics.

Nano-Powders

In this paper we report on the growth and structural characterization of very thin (20 nm) Cr-doped ITO films, deposited at room temperature by double-target pulsed laser ablation on amorphous silica substrates. The role of Cr atoms in the ITO matrix is carefully investigated with increasing doping content by transmission electron microscopy (TEM). Selected-area electron diffraction, conventional bright field and dark field as well as high-resolution TEM analyses, and energy dispersive x-ray spectroscopy demonstrate that (i) crystallization features occur despite the low growth temperature and small thickness, (ii) no chromium or chromium oxide secondary phases are detectable, regardless of the film doping levels, (iii) the films crystallize as crystalline flakes forming large-angle grain boundaries; (iv) the observed flakes consist of crystalline planes with local bending of the crystal lattice. Thickness and compositional information about the films are obtained by Rutherford back-scattering spectrometry. Results are discussed by considering the combined effects of growth temperature, smaller ionic radius of the Cr cation compared with the trivalent In ion, doping level, film thickness, the double-target doping technique and peculiarities of the pulsed laser deposition method.

Very low roughness MAPLE-deposited films of a light emitting polymer: an alternative to spin coating

The promising results obtained with the MAPLE-deposition of nanostructured thin films, to be used in different fields, are reviewed. Nanoparticles (TiO2, SnO2, CdS) and nanorods (TiO2) with well defined dimensions were suspended in appropriate solvents (distilled water, toluene) with low concentration (1wt% or less). The solutions were flash frozen at the liquid nitrogen temperature to form the targets to be laser irradiated. The MAPLE process allowed a successful transfer from the target to rough and flat substrates, preserving the starting composition and crystalline phase of the nanostructures in a wide range of experimental conditions. In contrast, a careful choice of the laser fluence is mandatory to avoid shape modifications. Growth of metal nanoparticles with a low dispersion in size was also obtained by the MAPLE technique, starting from target solutions of a metallorganic element (AcPd) diluted in different solvents (acetone, diethyl ether). It seems that selecting the solvent with appropriate va...

Structural characterization of ultrathin Cr-doped ITO layers deposited by double-target pulsed laser ablation

A spectrophotometric strategy, termed multilayer-method (ML-method), is presented and discussed to realistically calculate the absorption coefficient of each individual layer embedded in multilayer architectures without reverse engineering, numerical refinements and assumptions about the layer homogeneity and thickness. The strategy extends in a non-straightforward way a consolidated route, already published by the authors and here termed basic-method, able to accurately characterize an absorbing film covering transparent substrates. The ML-method inherently accounts for non-measurable contribution of the interfaces (including multiple reflections), describes the specific film structure as determined by the multilayer architecture and used deposition approach and parameters, exploits simple mathematics, and has wide range of applicability (high-to-weak absorption regions, thick-to-ultrathin films). Reliability tests are performed on films and multilayers based on a well-known material (indium tin oxide) by deliberately changing the film structural quality through doping, thickness-tuning and underlying supporting-film. Results are found consistent with information obtained by standard (optical and structural) analysis, the basic-method and band gap values reported in the literature. The discussed example-applications demonstrate the ability of the ML-method to overcome the drawbacks commonly limiting an accurate description of multilayer architectures.

Nanoparticle and nanorod films deposited by matrix assisted pulsed laser evaporation

A spectrophotometric strategy is presented and discussed for calculating realistically the reflectance spectrum of an absorbing film deposited over a thick transparent or semi-transparent substrate. The developed route exploits simple mathematics, has wide range of applicability (high-to-weak absorption regions and thick-to-ultrathin films), rules out numerical and curve-fitting procedures as well as model-functions, inherently accounts for the non-measurable contribution of the film-substrate interface as well as substrate backside, and describes the film reflectance spectrum as determined by the experimental situation (deposition approach and parameters). The reliability of the method is tested on films of a well-known material (indium tin oxide) by deliberately changing film thickness and structural quality through doping. Results are found consistent with usual information yielded by reflectance, its inherent relationship with scattering processes and contributions to the measured total reflectance.

Realistic absorption coefficient of each individual film in a multilayer architecture

The term “nanosystem” refers to a system with at least one spatial dimension scaled down to the nanometer-scale (<100 nm) and includes zero-dimensional systems (such as metallic, semiconducting and ceramic nanoparticles), one-dimensional systems (such as nanowires, nanotubes and nanorods) and two-dimensional structures (thin films or plates).