M. Dinescu

Deposition and Characterization of Laccase Thin Films Obtained by Matrix Assisted Pulsed Laser Evaporation

Matrix Assisted Pulsed Laser Evaporation (MAPLE) was used as an alternative technique within strategies for enzyme immobilization to produce Laccase thin films.

Thermokinetic study of CODA azoic liquid crystal and thin films deposition by matrix-assisted pulsed laser evaporation

Azoic dyes are compounds of interest from the point of view of their potential applications, such as the use of liquid crystals in optoelectronic and organic electroluminescent devices, or may be employed as template matrices for producing high-aspect ratio inorganic nanomaterials. Herein, 4-[(4-chlorobenzyl)oxy]-3,4′-dichloroazobenzene azoic dye, known as CODA, is selected as a choice compound among such materials due to its liquid crystalline properties and may be further used as nanostructured material in various applications. Thermokinetic study of CODA azoic dye thermal decomposition in air flow atmosphere was performed by employing thermogravimetric data; the kinetic parameters of the two decomposition steps were obtained under non-isothermal linear regimes, by means of multi-heating rates methods. Differential and integral “model-free” kinetic methods like Friedmann, Kissinger–Akahira–Sunose and Ortega, the invariant kinetic parameters method and the Perez-Maqueda et al. criterion (by Coats–Redfern and differential equations) were used. The kinetic study reveals very different behaviour related to the two decomposition steps of CODA, with complex processes composed of more than one kinetic mechanism for each of those, as indicated also by the Gotor et al. master plot method. Modern devices incorporating such materials tend to use them as thin films due to their specific properties; the CODA thin films were deposited on silicon substrates by matrix-assisted pulsed laser evaporation technique, using a Nd:YAG laser working at the wavelength of 266xa0nm. The preservation of the CODA compound after the transfer on the substrates was confirmed by Fourier transform infrared spectroscopy, while the morphology and topography of the deposited materials and of the thin film surfaces were investigated by atomic force microscopy and optical microscopy.