M.-H. Tuilier
Centre national de la recherche scientifique
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Publication
Featured researches published by M.-H. Tuilier.
Applied Physics Letters | 2003
Ovidiu Ersen; M.-H. Tuilier; O. Thomas; P. Gergaud; P. Lagarde
Al K-edge extended x-ray absorption fine structure (EXAFS) experiments are performed on short-period TiN (50 nm)/AlN (Λ=1, 2, 3, 5, and 15 nm) multilayers prepared by dc magnetron sputtering on MgO(100). It is shown that the local order around Al is hexagonal down to Λ=3 nm and becomes clearly cubic B1 rocksalt-type below this thickness. This phase transition is correlated with x-ray diffraction results, which reveal increased compressive stresses in TiN layers for Λ=3 nm. In addition, EXAFS provides direct evidence of substitution of Ti for Al within AlN layers, as well as an estimation of Ti content as a function of layer thickness.
Thin Solid Films | 2011
Maria Girleanu; M.-J. Pac; P. Louis; Ovidiu Ersen; Jacques Werckmann; C. Rousselot; M.-H. Tuilier
Surface & Coatings Technology | 2013
P. Henry; M.-J. Pac; C. Rousselot; M.-H. Tuilier
Surface & Coatings Technology | 2007
M.-H. Tuilier; M.-J. Pac; G. Covarel; C. Rousselot; L. Khouchaf
Physical Review B | 2003
Ovidiu Ersen; V. Pierron-Bohnes; M.-H. Tuilier; C. Pirri; L. Khouchaf; M. Gailhanou
Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2005
Ovidiu Ersen; M.-H. Tuilier; A. Thobor-Keck; C. Rousselot; R. Cortès
Surface & Coatings Technology | 2010
Maria Girleanu; M.-J. Pac; Ovidiu Ersen; Jacques Werckmann; G. Arnold; C. Rousselot; M.-H. Tuilier
Thin Solid Films | 2015
Y. Pinot; M.-J. Pac; P. Henry; C. Rousselot; Ya.I. Odarchenko; Dimitri A. Ivanov; C. Ulhaq-Bouillet; Ovidiu Ersen; M.-H. Tuilier
Thin Solid Films | 2012
M.-H. Tuilier; M.-J. Pac; D.V. Anokhin; Dimitri A. Ivanov; C. Rousselot; D. Thiaudière
Thin Solid Films | 2017
M.-J. Pac; Y. Pinot; S. Giljean; C. Rousselot; Patrick Delobelle; C. Ulhaq-Bouillet; M.-H. Tuilier